Analyses of Ballistic Electron Transport in Nanocrystalline Porous Silicon

2000 ◽  
Vol 638 ◽  
Author(s):  
Akira Kojima ◽  
Xia Sheng ◽  
Nobuyoshi Koshida

AbstractThe characteristics of ballistic electron transport in porous silicon (PS) are investigated in terms of the electron emission from PS diodes and the energy distribution of emitted electrons. The energy distributions show a behavior of ballistic electron emission that is quite different with the Maxwellian distribution. This is clearly observed at low temperatures below 150 K where the electrical conduction in PS is dominated by the tunneling mode. At 100 K, the peak position of distribution curve becomes more close to the energy corresponding to the energy gain expected from ballistic transport without any scattering losses. The simulated energy distribution suggests that the electrons having higher energies in a non-equilibrium state travel ballistically in PS via field-induced tunneling process. These results support that electrons can travel ballistically in nanocrystalline layer under a high electric field. The observed ballistic transport indicates the further technological potential of silicon nanocrystallites.

2004 ◽  
Vol 832 ◽  
Author(s):  
Yoshishige Tsuchiya ◽  
Takuya Nakatsukasa ◽  
Hiroshi Mizuta ◽  
Shunri Oda ◽  
Akira Kojima ◽  
...  

ABSTRACTMechanism of electron transport through planerized nanocrystalline-Si (nc-Si) cold cathode surface emitting devices was investigated. The energy distribution of electrons emitted from nc-Si emitter was obviously not Maxwellian, which was usually obtained at conventional cold cathode devices, but was similar to that from the nanocrystalline porous silicon diode emitter. These results strongly suggest that electrons are emitted quasiballistically from our devices and indicate that the planarized nc-Si layer play an important role in this high efficiency cold cathode emitter.


2014 ◽  
Vol 104 (20) ◽  
pp. 203102 ◽  
Author(s):  
A. A. Shevyrin ◽  
A. G. Pogosov ◽  
M. V. Budantsev ◽  
A. K. Bakarov ◽  
A. I. Toropov ◽  
...  

2016 ◽  
Vol 42 (9) ◽  
pp. 970-972 ◽  
Author(s):  
A. A. Borisov ◽  
S. S. Zyrin ◽  
A. A. Makovetskaya ◽  
V. I. Novoselets ◽  
A. B. Pashkovskii ◽  
...  

1999 ◽  
Author(s):  
Kong-Thon F. Tsen ◽  
David K. Ferry ◽  
Jyh-Shyang Wang ◽  
Chao-Hsiung Huang ◽  
Hao-Hsiung Lin

2004 ◽  
Vol 93 (24) ◽  
Author(s):  
O. Gunawan ◽  
Y. P. Shkolnikov ◽  
E. P. De Poortere ◽  
E. Tutuc ◽  
M. Shayegan

2013 ◽  
Author(s):  
A. G. Pogosov ◽  
M. V. Budantsev ◽  
E. Yu. Zhdanov ◽  
D. A. Pokhabov

2008 ◽  
Vol 22 (30) ◽  
pp. 5289-5297 ◽  
Author(s):  
H. ARABSHAHI

An ensemble Monte Carlo simulation is used to compare bulk electron ballistic transport in 6H - SiC and GaN materials. Electronic states within the conduction band valleys at Γ1, U, M, Γ3, and K are represented by nonparabolic ellipsoidal valleys centered on important symmetry points of the Brillouin zone. The large optical phonon energy (~120 meV) and the large intervalley energy separation between the Γ and satellite conduction band valleys suggest an increasing role for ballistic electron effects in 6H - SiC , especially when compared with most III-V semiconductors such as GaAs . Transient velocity overshoot has been simulated, with the sudden application of fields up to ~5×107 Vm -1, appropriate to the gate-drain fields expected within an operational field effect transistor. A peak-saturation drift velocity ratio of 2:1 is predicted for 6H - SiC material while that for GaN is 4:1. The electron drift velocity relaxes to the saturation value of ~2×105 ms -1 within 3 ps, for both crystal structures. The transient velocity overshoot characteristics are in fair agreement with other recent calculations.


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