Carrier dynamics in spatially ordered InAs quantum dots

2002 ◽  
Vol 719 ◽  
Author(s):  
Jörg Siegert ◽  
Saulius Marcinkevièius ◽  
Andreas Gaarder ◽  
Rosa Leon ◽  
Sergio Chaparro ◽  
...  

AbstractSpatial ordering of InAs quantum dots was attained by using misfit dislocations generated in a metastable InGaAs layer by means of thermal annealing. Influence of quantum dot positional ordering and dot proximity to dislocation arrays on carrier dynamics was studied by timeresolved photoluminescence. Substantially narrower inhomogeneous broadening from the ordered quantum dots was observed. Excitation intensity dependence of the photoluminescence intensity and carrier lifetime indicates stronger influence of nonradiative recombination for the ordered quantum dot structures. Numerical simulations allow estimating electron and hole capture rates from the quantum dots to traps located either at the quantum dot interfaces or in the vicinity of the quantum dots.

2002 ◽  
Vol 91 (9) ◽  
pp. 5826-5830 ◽  
Author(s):  
R. Leon ◽  
S. Chaparro ◽  
S. R. Johnson ◽  
C. Navarro ◽  
X. Jin ◽  
...  

2014 ◽  
Vol 2014 ◽  
pp. 1-5
Author(s):  
Shuai Zhou ◽  
Yumin Liu ◽  
Pengfei Lu ◽  
Lihong Han ◽  
Zhongyuan Yu

Taking elastic anisotropy into consideration, we use a dislocation position dependent model to calculate the preferential formation site of noninterfacial 60° mixed dislocation segment in ellipsoid shaped InAs/GaAs quantum dots (QDs) which is observed in the experiment. From the result, it is clear that the positions near the right edge of the quantum dot are the energy favorable areas for the noninterfacial 60° mixed dislocations.


2010 ◽  
Vol 87 (5-8) ◽  
pp. 1304-1307 ◽  
Author(s):  
O. Tangmettajittakul ◽  
S. Thainoi ◽  
P. Changmoang ◽  
S. Kanjanachuchai ◽  
S. Rattanathammaphan ◽  
...  

2001 ◽  
Author(s):  
Xinhai Zhang ◽  
Jian R. Dong ◽  
Soo-Jin Chua

2006 ◽  
Vol 916 ◽  
Author(s):  
Hsing-Yeh Wang ◽  
C.H. Chen ◽  
H. Niu ◽  
S.C. Wu ◽  
C.P. Lee

AbstractThe strain status of the buried InAs self-assembled quantum dot was comprehended by measurement first time. Results show the in-plane strain is compressive and lattice in the growth direction is lager than the lattice of GaAs. The strain of the sample annealed at 650 degree relaxes in the growth direction. The growth and the lateral direction become relaxed in the sample annealed at 750 degree.


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