The Microstructures and Grain Boundary Segregations of Ceramic Barium Titanate Processed in Microwave Field

2003 ◽  
Vol 783 ◽  
Author(s):  
Hanxing Liu ◽  
Zhongqin Tian ◽  
Jian Zhou ◽  
Hongtao Yu ◽  
Long Zou ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Grain Boundary ◽  
Conventional Method ◽  
Microwave Field ◽  
Boundary Segregation ◽  
Element Distribution ◽  
Processing Method ◽  
Ceramic Processing ◽  
Transmission Electron ◽  
Grain Boundary Segregations

ABSTRACTCeramic sintering in microwave field is a new ceramic processing method. In present paper, we detected the microstructures and boundary segregation of BaTiO3 ceramics which were sintered in microwave field. Scanning electron microscopy(SEM), and transmission electron microscopy(TEM), and chemical analysis methods were employed to detect the microstructure of BaTiO3, element distribution near the boundary of BaTiO3 ceramic. The results shown growth of grain of the ceramic was influenced by impurities such as acceptor, benefactor et al, and the element distribution near the grain boundary of BaTiO3 sintered in microwave field were different with that sintered in conventional method. The boundary segregations of BaTiO3 sintered in microwave field were not obvious as compared to the conventional method because the diffusion was enhanced due to the microwave field.

Grain-Boundary Segregation and Phase-Separation Mechanism in Yttria-Stabilized Tetragonal Zirconia Polycrystal

2011 ◽  
Vol 484 ◽  
pp. 82-88
Author(s):  
Koji Matsui ◽  
Hidehiro Yoshida ◽  
Yuichi Ikuhara
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Boundary Segregation ◽  
Grain Boundary Segregation ◽  
Cubic Phase ◽  
Phase Boundaries ◽  
Transmission Electron ◽  
Sintering Condition

Microstructure development during sintering in 3 mol% Y2O3-stabilized tetragonal ZrO2 polycrystal (Y-TZP) was systematically investigated in two sintering conditions: (a) 1100-1650°C for 2 h and (b) 1300°C for 0-50 h. In the sintering condition (a), the density and grain size in Y-TZP increased with the increasing sintering temperature. Scanning transmission electron microscopy (STEM) and nanoprobe X-ray energy dispersive spectroscopy (EDS) measurements revealed that the Y3+ ion distribution was nearly homogeneous up to 1300°C, i.e., most of grains were the tetragonal phase, but cubic-phase regions with high Y3+ ion concentration were clearly formed in grain interiors adjacent to the grain boundaries at 1500°C. High-resolution transmission electron microscopy (HRTEM) and nanoprobe EDS measurements revealed that no amorphous or second phase is present along the grain-boundary faces, and Y3+ ions segregated not only along the tetragonal-tetragonal phase boundaries but also along tetragonal-cubic phase boundaries over a width below about 10 nm, respectively. These results indicate that the cubic-phase regions are formed from the grain boundaries and/or the multiple junctions in which Y3+ ions segregated. We termed this process a “grain boundary segregation-induced phase transformation (GBSIPT)” mechanism. In the sintering condition (b), the density was low and the grain-growth rate was much slow. In the specimen sintered at 1300°C for 50 h, the cubic-phase regions were clearly formed in the grain interiors adjacent to the grain boundaries. This behavior shows that the cubic-phase regions were formed without grain growth, which can be explained by the GBSIPT model.

Grain Boundary Segregation-Induced Phase Transformation and Grain Growth in Y2O3-Stabilized ZrO2 Polycrystals

2014 ◽  
Vol 616 ◽  
pp. 8-13
Author(s):  
Koji Matsui ◽  
Hidehiro Yoshida ◽  
Yuichi Ikuhara
Keyword(s):  
Electron Microscopy ◽  
Phase Transformation ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Grain Growth ◽  
Boundary Segregation ◽  
Growth Behavior ◽  
Grain Boundary Segregation ◽  
Transmission Electron ◽  
Grain Growth Behavior

We systematically investigated the phase transformation and grain-growth behaviors during sintering in 2 and 3 mol% Y2O3-stabilized tetragonal ZrO2 (2Y and 3Y) and 8 mol% Y2O3-stabilized cubic ZrO2 polycrystals (8Y). In particular, grain-boundary segregation and grain-interior distribution of Y3+ ions were examined by high-resolution transmission electron microscopy (HRTEM)- and scanning transmission electron microscopy (STEM)-nanoprobe X-ray energy dispersive spectroscopy (EDS) techniques. Above 1200°C, grain growth during sintering in 8Y was much faster than that in 2Y and 3Y. In the grain boundaries in these specimens, amorphous layers did not present; however, Y3+ ions segregated at the grain boundaries over a width of about 10 nm. The amount of segregated Y3+ ions in 8Y was significantly less than in 2Y and 3Y. This indicates that the amount of segregated Y3+ ions is related to grain growth behavior; i.e., an increase in segregated Y3+ ions retards grain growth. Therefore, grain-growth behavior during sintering can be reasonably explained by the solute-drag mechanism of Y3+ ions segregating along the grain boundary. In 2Y and 3Y, the cubic-phase regions were formed in grain interiors adjacent to the grain boundaries and/or the multiple junctions in which Y3+ ions segregated, which can be explained by a grain boundary segregation-induced phase transformation (GBSIPT) mechanism.

Grain Boundary Segregation of Bismuth in Copper

1981 ◽  
Vol 39 ◽  
pp. 286-287
Author(s):  
J. R. Michael ◽  
D. B. Williams
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Boundary ◽  
Electron Spectroscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Auger Electron ◽  
Boundary Segregation ◽  
Grain Boundary Segregation ◽  
Transmission Electron ◽  
Scanning Transmission

Bismuth is known to segregate to grain boundaries in copper resulting in embrittlement and intergranular failure at low stress levels. This segregation has been studied primarily by Auger Electron Spectroscopy (AES). The applicability of scanning transmission electron microscopy (STEM)and Energy Dispersive Spectroscopy (EDS) to the study of equilibrium grain boundary segregation has already been demonstrated and the aim of this study is to determine the degree of segregation as a function of time and temperature. The major advantage of STEM over AES is that STEM does not require fracturing of the specimen, so the boundaries to be studied are left undisturbed. Thus, this technique is also applicable to systems which do not exhibit intergranular fracture.Cu-Bi specimens were prepared by evaporating Bi onto both sides of 3mm Cu discs, which were then heated for 1 week at 400°C to allow the Bi to diffuse into the Cu. The samples were then aged at 450, 550, 600, 650, and 700°C for 3 days and 12 days, ion-thinned and then examined in a Philips EM 400T TEM/STEM with an EDAX detector and EDAX 9100 analyzer. If necessary, the specimens were tilted such that the boundaries were parallel to the electron beam.

Grain boundary character information via individual imaging or statistical analyses: complexion transitions and grain boundary segregation

2021 ◽  
Author(s):  
Katharina Marquardt ◽  
David Dobson ◽  
Simon Hunt ◽  
Ulrich Faul
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Bulk Viscosity ◽  
Boundary Segregation ◽  
Grain Boundary Segregation ◽  
Boundary Character ◽  
Grain Boundary Character ◽  
Transmission Electron

<p>Grain boundaries affect bulk properties of polycrystalline materials, such as electrical conductivity, melting or bulk viscosity. In the past two decades, observations of marked bulk material property changes have been associated with changes in the structure and composition of grain boundaries. This led to the term “grain boundary complexions” to mark the phase-like behaviour of grain boundaries while differing from phases in the sense of Gibbs (Cantwell 2014).</p><p>Here we introduce the principles of grain boundary structure to property relations and potent methods to study these. The focus is on the combination of structural, chemical and statistical analysis as obtainable using transmission electron microscopy and electron backscatter diffraction. Data from these complementary methods will be discussed on two systems; garnet and olivine polycrystals.</p><p>Past elasticity measurements showed that the Youngs modulus of garnet polycrystals changes as a function of sintering pressure (Hunt et al. 2016). Here we used high resolution transmission electron microscopy to study the structure of grain boundaries from polycrystals synthesized at low (4-8 GPa) and high (8-15) GPa sintering pressure. The HRTEM data were acquired using an image-corrected JEOL ARM 300 to achieve the highest resolution at low electron doses using a OneView camera. Our data indicate a grain boundary structural change occurs from “low-pressure” to “high pressure” grain boundaries, where the grain boundary facets change from >100 nm – 20 nm to 3-7 nm length scale, respectively. We conclude that sintering pressure affects grain-boundary strength and we will evaluate how this may influence anelastic energy loss of seismic waves through elastic or diffusional accommodation of grain-boundary sliding.</p><p>Polycrystalline olivine samples show different viscosity related to grain boundary segregation of impurities. To investigate if the distribution of grain boundaries is affected by grain boundary chemistry, we analysed grain orientation data from over 4x10<sup>4</sup> grains, corresponding to more than 6000 mm grain boundary length per sample. Using stereology, we extract the geometry of the interfacial network. The thus obtained grain boundary character distribution (GBCD) is discussed in relation to bulk viscosity.</p>

High-Resolution Transmission Electron Microscopy Studies of a Near Sigma11 Grain Boundary in alpha-Alumina

1994 ◽  
Vol 77 (2) ◽  
pp. 339-348 ◽  
Author(s):  
Thomas Hoche ◽  
Philip R. Kenway ◽  
Hans-Joachim Kleebe ◽  
Manfred Ruhle ◽  
Patricia A. Morris
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Grain Boundary ◽  
Transmission Electron ◽  
Alpha Alumina

Microstructures of a-axis oriented YBCO films made by hybrid plasma sputtering

1995 ◽  
Vol 10 (4) ◽  
pp. 803-809 ◽  
Author(s):  
W. Ito ◽  
A. Oishi ◽  
S. Mahajan ◽  
Y. Yoshida ◽  
T. Morishita
Keyword(s):  
Electron Microscopy ◽  
Grain Boundary ◽  
Anisotropic Growth ◽  
Plan View ◽  
Plasma Sputtering ◽  
Transmission Electron ◽  
Hybrid Plasma ◽  
Tilt Boundaries ◽  
Symmetrical Tilt ◽  
Twist Boundaries

Microstructures of a-axis oriented YBa2Cu3O7−x films made by newly developed de 100 MHz hybrid plasma sputtering were investigated using transmission electron microscopy (TEM). The films deposited on (110) NdGaO3 and (100) SrTiO3 substrates were found to grow in a perfect epitaxial fashion and with clear interface. The plan view of the TEM image showed that both films were comprised of two kinds of grains having the c axis aligning along two perpendicular directions in the plane with equal probability. The structures of the grain boundary, however, were found to be very different for the two films from the plan views. The film on NdGaO3 showed a lot of twist boundaries, while the film on SrTiO3 consisted of many symmetrical tilt boundaries and basal-plane-faced tilt boundaries. The type of grain boundary is determined by the anisotropic growth rates of the film between c direction and a-b direction.

Motion of Crystal/Crystal and Crystal/Amorphous Interfaces

1990 ◽  
Vol 183 ◽  
Author(s):  
J. L. Batstone
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Grain Boundary ◽  
Boundary Motion ◽  
High Temperature Annealing ◽  
Thermally Activated ◽  
Transmission Electron ◽  
Grain Boundary Motion

AbstractMotion of ordered twin/matrix interfaces in films of silicon on sapphire occurs during high temperature annealing. This process is shown to be thermally activated and is analogous to grain boundary motion. Motion of amorphous/crystalline interfaces occurs during recrystallization of CoSi2 and NiSi2 from the amorphous phase. In-situ transmission electron microscopy has revealed details of the growth kinetics and interfacial roughness.

Microstructural Studies of High Coercivity Nd15Fe77B8 Sintered Magnets

1987 ◽  
Vol 96 ◽  
Author(s):  
M. H. Ghandehari ◽  
J. Fidler
Keyword(s):  
Electron Microscopy ◽  
Heat Treatment ◽  
Transmission Electron Microscopy ◽  
Grain Boundary ◽  
Electron Microprobe ◽  
Boundary Phase ◽  
High Coercivity ◽  
Transmission Electron ◽  
Microstructural Studies ◽  
Domain Reversal

ABSTRACTMicrostructures of Nd15−xDyxFe77B8 prepared by alloying with Dy, and by using Dy2O3 as a sinl'ken adidive, have been determined using electron microprobe and transmission electron microscopy. The results have shown a higher Dy concentration near the grain boundaries of the 2–14–1 phase for magnets doped with Dy2O 3, as compared to the Dy-alloyed magnets. A two-step post sintering heat treatment was also studied for the two systems. The resultant concentration gradient of Dy in the 2–14–1 phase of the oxide-doped magnets is explained by the reaction of Dy2O3 with the Nd-rich grain boundary phase and its slow diffusion into thg 4–14–1 phase. Increased Dy concentration near the grain boundary is more effective in improving the coercivity, as domain reversal nucleation originates at or near this region.

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