scholarly journals Deformation-Induced Amorphization of Crystalline Particles in a Cu-Ti Metallic Glass

1986 ◽  
Vol 80 ◽  
Author(s):  
Eduardo A. Kamenetzky ◽  
Philip D. Asikenazy ◽  
Lee E. Tanner ◽  
William L. Johnson
Keyword(s):  
Amorphous Matrix ◽  
Structural Evolution ◽  
Convergent Beam Electron Diffraction ◽  
Transformation Process ◽  
Morphological Description ◽  
X Ray Diffraction ◽  
Initial Particle ◽  
X Ray ◽  
Amorphous Phases ◽  
Convergent Beam

AbstractCrystalline particles and grains embedded in Cu35Ti65 glass ribbons have been amorphized by isothermal cold rolling. The structural evolution has been studied by X-ray diffraction and TEM techniques. Initial particle morphologies are spherulitic and spherical, the latter with sizes ranging between 10 and 100 nm. The new amorphous phase seems to nucleate at crystalline-amorphous matrix interfaces. Initially there is a well defined interface between the new and the existing amorphous phases but it disappears as rolling progresses. Crystallites on a nanoscale still present in the final stages of particle amorphization have been observed by convergent beam electron diffraction. After sufficient deformation the consolidated ribbon becomes completely glassy. A morphological description of the transformation process in terms of crystal destabilization and solid-state particle melting is presented.

Comparison of Simulated and Experimental Order Parameters in FePt—II

2011 ◽  
Vol 17 (3) ◽  
pp. 403-409 ◽  
Author(s):  
Karen L. Torres ◽  
Richard R. Vanfleet ◽  
Gregory B. Thompson
Keyword(s):  
Electron Diffraction ◽  
Order Parameter ◽  
Convergent Beam Electron Diffraction ◽  
Order Parameters ◽  
X Ray Diffraction ◽  
Chemical Order ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Convergent Beam ◽  
Good Agreement

AbstractEight FePt thin film specimens of various thicknesses, compositions, and order parameters have been analyzed to determine the robustness and fidelity of multislice simulations in determining the chemical order parameter via electron diffraction (ED). The shape of the simulated curves depends significantly on the orientation and thickness of the specimen. The ED results are compared to kinematical scattering order parameters, from the same films, acquired from synchrotron X-ray diffraction (XRD). For the specimens analyzed with convergent beam electron diffraction conditions, the order parameter closely matched the order parameter as determined by the XRD methodology. However, the specimens analyzed by selected area electron diffraction conditions did not show good agreement. This has been attributed to substrate effects that hindered the ability to accurately quantify the intensity values of the superlattice and fundamental reflections.

Measurement of Debye-Waller factors of silicon as a function of temperature using energy-filtered CBED rocking-curve technique

1994 ◽  
Vol 52 ◽  
pp. 996-997
Author(s):  
S. Swaminathan ◽  
S. Altynov ◽  
I. P. Jones ◽  
N. J. Zaluzec ◽  
D. M. Maher ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Liquid Nitrogen Temperature ◽  
Convergent Beam Electron Diffraction ◽  
Higher Order ◽  
X Ray Diffraction ◽  
Beam Electron ◽  
X Ray ◽  
Crystal Potential ◽  
Transmission Electron ◽  
Convergent Beam

The advantages of quantitative Convergent Beam Electron Diffraction (CBED) method for x-ray structure factor determination have been reviewed by Spence. The CBED method requires accurate values of Debye-Waller (D-W) factors for the estimation of the coefficients of crystal potential of the higher order beams, Vg, the calculation of the absorption potential, V′g using the Einstein model for phonons, and finally the conversion of the fitted values of the coefficients of crystal potential, V″, to x-ray structure factors. Debye-Waller factors are conventionally determined by neutron or x-ray diffraction methods. Because of the difficulties in conducting high temperature neutron and x-ray diffraction experiments, D-W factors are rarely measured at temperatures above room temperature. Debye-Waller factors at high temperatures can be determined by Convergent Beam Electron diffraction (CBED) method using Transmission Electron Microscopy (TEM) employed with a hot stage attachment. Recently Holmestad et al. have attempted to measure the D-W factors by matching the energy-filtered Higher Order Laue Zone (HOLZ) line intensities near liquid nitrogen temperature.

Relative Lattice Parameter Measurement in Quaternary (InGaAsP) Layers on InP Substrates Using Convergent Beam Electron Diffraction

1986 ◽  
Vol 69 ◽  
Author(s):  
M. E. Twigg ◽  
S. N. G. Chu ◽  
D. C. Joy ◽  
D. M. Maher ◽  
A. T. Macrander ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Lattice Parameter ◽  
Convergent Beam Electron Diffraction ◽  
X Ray Diffraction ◽  
Device Structure ◽  
Beam Electron ◽  
X Ray ◽  
Convergent Beam ◽  
Relative Change ◽  
Inp Substrates

AbstractWith X-ray diffraction techniques, it is possible to routinely measure lattice parameters to several parts in 104 for macroscopic specimens. However, measurements of lattice parameter changes for quaternary (InGaAsP) device structures several microns in width are not usually feasible with X-ray diffraction techniques. Convergent Beam Electron Diffraction (CBED), which is one of the techniques available on a modern transmission electron microscope (TEM), may be sensitive to these small, localized lattice parameter changes. Unfortunately, dynamical diffraction effects prevent direct extraction of changes in the lattice parameter from CBED patterns which are obtained from high atomic number materials. For this reason, we have chosen to calibrate the relative position of CBED features with X-ray lattice parameter measurements which were obtained from planar quaternary layers grown on InP substrates. For the active quaternary region of an electro-optical device structure, it is shown that this approach may be sensitive to a relative change in the lattice parameter as small as ±2 parts in 104, which is the uncertainty in the X-ray calibration measurements.

Microstructure and crystal symmetry of Pb2Sr2(Y/Ca)Cu3O9−δ

1990 ◽  
Vol 48 (4) ◽  
pp. 64-65
Author(s):  
Y. P. Lin ◽  
J. S. Xue ◽  
J. E. Greedan
Keyword(s):  
Electron Diffraction ◽  
High Temperature Superconductors ◽  
Carbon Film ◽  
Basic Structure ◽  
Crystal Symmetry ◽  
X Ray Diffraction ◽  
X Ray ◽  
Space Groups ◽  
New Family ◽  
Convergent Beam

A new family of high temperature superconductors based on Pb2Sr2YCu3O9−δ has recently been reported. One method of improving Tc has been to replace Y partially with Ca. Although the basic structure of this type of superconductors is known, the detailed structure is still unclear, and various space groups has been proposed. In our work, crystals of Pb2Sr2YCu3O9−δ with dimensions up to 1 × 1 × 0.25.mm and with Tc of 84 K have been grown and their superconducting properties described. The defects and crystal symmetry have been investigated using electron microscopy performed on crushed crystals supported on a holey carbon film.Electron diffraction confirmed x-ray diffraction results which showed that the crystals are primitive orthorhombic with a=0.5383, b=0.5423 and c=1.5765 nm. Convergent Beam Electron Diffraction (CBED) patterns for the and axes are shown in Figs. 1 and 2 respectively.

STRUCTURAL EVOLUTION OF EXCEPTIONALLY IRON-DEFICIENT HEMATITE NANOCRYSTALS AS OBSERVED BY IN SITU SYNCHROTRON X-RAY DIFFRACTION

2019 ◽  
Author(s):  
Si Athena Chen ◽  
◽  
Peter Heaney ◽  
Jeffrey E. Post ◽  
Peter J. Eng ◽  
...  
Keyword(s):  
Structural Evolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Iron Deficient

Structural evolution of NASICON-type Li1+xAlxGe2−x(PO4)3 using in situ synchrotron X-ray powder diffraction

2016 ◽  
Vol 4 (20) ◽  
pp. 7718-7726 ◽  
Author(s):  
Dorsasadat Safanama ◽  
Neeraj Sharma ◽  
Rayavarapu Prasada Rao ◽  
Helen E. A. Brand ◽  
Stefan Adams
Keyword(s):  
Solid Electrolyte ◽  
Diffraction Study ◽  
Powder Diffraction ◽  
Structural Evolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nasicon Type ◽  
Precursor Glass

In situ synchrotron X-ray diffraction study of the synthesis of solid-electrolyte Li1+xAlxGe2−x(PO4)3 (LAGP) from the precursor glass reveals that an initially crystallized dopant poor phase transforms into the Al-doped LAGP at 800 °C.

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