scholarly journals Creating a virtual device for processing the results of sorption measurements in the study of zinc oxide nanorods

2020 ◽  
Vol 7 (4) ◽  
pp. 154-158
Author(s):  
E. V. Maraeva ◽  
N. V. Permiakov ◽  
Y. Y. Kedruk ◽  
L. V. Gritsenko ◽  
Kh. A. Abdullin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Zinc Oxide ◽  
Zinc Oxide Nanorods ◽  
Scanning Electron Microscopy Data ◽  
Virtual Device ◽  
Electron Microscopy Data ◽  
Oxide Nanorods ◽  
Microscopy Data ◽  
Scanning Electron

The work is devoted to the creation of a virtual device (computer program) for processing the results of sorption analysis of nanomaterials, including for estimating the size of nanoparticles based on the specific surface area. The obtained evaluation results were compared with the scanning electron microscopy data. Photocatalytically active zinc oxide samples were chosen as the object of the study.

Fractographic Regularities in Fatigue Failure of 17Mn1Si Steel

2014 ◽  
Vol 1040 ◽  
pp. 230-235
Author(s):  
Pavlo Maruschak ◽  
Sergey Panin ◽  
Ilya Vlasov ◽  
Iryna Danyliuk ◽  
Roman Bishchak
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Scanning Electron Microscopy Data ◽  
Structural Level ◽  
Deformation And Failure ◽  
Leading Role ◽  
Electron Microscopy Data ◽  
Microscopy Data ◽  
Scanning Electron

Using the scanning electron microscopy data the main regularities of the fatigue crack propagation in the 17Mn1Si steel were studied. Based on fracture surface observation and analysis one can testify that the transition of the leading role of deformation and failure from the lower structural level to the higher one has the ordered pattern.

scholarly journals A study of hydrothermally grown ZnO nanorod-based metal-semiconductor-metal UV detectors on glass substrates

2017 ◽  
Vol 7 ◽  
pp. 184798041770214 ◽  
Author(s):  
Shaivalini Singh ◽  
Yogesh Kumar ◽  
Hemant Kumar ◽  
Sumit Vyas ◽  
Chinnamuthan Periasamy ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Zinc Oxide ◽  
Contrast Ratio ◽  
Zinc Oxide Nanorods ◽  
Glass Substrates ◽  
Metal Semiconductor Metal ◽  
Oxide Nanorods ◽  
Vis Spectroscopy ◽  
Scanning Electron

This study reports hydrothermally grown zinc oxide nanorod-based metal-semiconductor-metal ultraviolet detectors with palladium metal as the electrodes. The zinc oxide nanorods were deposited on glass substrates in two steps, seed layer deposition and growth of nanorods. The structural and optical properties of nanorods were examined using scanning electron microscopy and ultraviolet–vis spectroscopy, respectively. The scanning electron microscopy image showed that the growth of nanorods was uniform, and the ultraviolet–vis results indicate that the bandgap of zinc oxide nanorods was 3.23 eV. For metal-semiconductor-metal devices, interdigited metal electrodes with equal interelectrode spacing and a width of 0.3 mm were deposited above the zinc oxide nanorod thin films with a shadow mask using a thermal evaporation system. The current–voltage characteristics of the metal-semiconductor-metal detector were investigated and it showed a contrast ratio of approximately 2.10 and responsivity of approximately 0.199 A/W at 1.8 V. These results are expected to be beneficial to fabricating cheap and practical ultraviolet detection applications.

Zinc Oxide Nanorods Characteristics Prepared by Sol-Gel Immersion Method Immersed at Different Times

2013 ◽  
Vol 667 ◽  
pp. 375-379 ◽  
Author(s):  
M. Awalludin ◽  
Mohamad Hafiz Mamat ◽  
Mohd Zainizan Sahdan ◽  
Z. Mohamad ◽  
Mohamad Rusop
Keyword(s):  
Electron Microscopy ◽  
Zinc Oxide ◽  
Immersion Time ◽  
Sol Gel ◽  
Zno Nanorods ◽  
Zinc Oxide Nanorods ◽  
Immersion Method ◽  
X Ray ◽  
Oxide Nanorods ◽  
Scanning Electron

This paper focus on zinc oxide (ZnO) nanorods prepared using sol-gel immersion method immersed at different time. Immersion times have been varied 1~24 hr and the characteristics of each sample have been observed. The effects of immersion time on ZnO nanorods thin films have been studied in surface morphology and structural properties using Scanning Electron Microscopy (SEM) and X-ray diffractometer (XRD), respectively.

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