scholarly journals High-speed switching operation for a SiC CMOS and power module

Author(s):  
Atsushi Yao ◽  
Mitsuo Okamoto ◽  
Fumiki Kato ◽  
Hiroshi Hozoji ◽  
Shinji Sato ◽  
...  
Author(s):  
Hiroshi Sato ◽  
Fumiki Kato ◽  
Hiroshi Nakagawa ◽  
Hiroshi Yamaguchi ◽  
Simanjorang Rejeki ◽  
...  

2019 ◽  
Vol 963 ◽  
pp. 864-868
Author(s):  
Shinji Sato ◽  
Fumiki Kato ◽  
Hidekazu Tanisawa ◽  
Kenichi Koui ◽  
Kinuyo Watanabe ◽  
...  

We developed a silicon carbide (SiC) power module that can switch large currents at high speed. The withstand voltage of this power module is 1200 V, and two SiC MOSFETs are built-in and constitute a circuit for one inverter phase. This power module incorporates a snubber circuit for reducing the surge voltage generated by the SiC MOSFET for high-speed switching. In this study, switching at 270 A (a current density of 1000 A/cm 2 or more for the SiC MOSFET) was performed to evaluate this module. The turn-off switching time tf was ~10 ns, and the maximum dv/dt was 80 kV/us. Furthermore, this research examines the design and performance of the proposed power module.


2016 ◽  
Vol 858 ◽  
pp. 1057-1060 ◽  
Author(s):  
Konstantin Kostov ◽  
Jang Kwon Lim ◽  
Ya Fan Zhang ◽  
Mietek Bakowski

The package parasitics are a serious obstacle to the high-speed switching, which is necessary in order to reduce the switching power losses or reduce the size of power converters. In order to design new packages suitable for Silicon Carbide (SiC) power transistors, it is necessary to extract the parasitics of different packages and be able to predict the switching performance of the power devices placed in these packages. This paper presents two ways of simulating the switching performance in a half-bridge power module with SiC MOSFETs. The results show that the parasitic inductances in the power module slow down the switching, lead to poor current sharing, and together with the parasitic capacitances lead to oscillations. These negative effects can cause failures, increased losses, and electromagnetic compatibility issues.


2013 ◽  
Vol 133 (12) ◽  
pp. 1186-1192
Author(s):  
Toshihiko Noguchi ◽  
Tomohiro Mizuno ◽  
Munehiro Murata

1970 ◽  
Vol 41 (6) ◽  
pp. 2745-2747 ◽  
Author(s):  
R. I. Gayley ◽  
J. D. Langan ◽  
K. Kim

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