scholarly journals Wide dynamic range transimpedance amplifier IC for 100-G DP-QPSK optical links using 1-^|^micro;m InP HBTs

2012 ◽  
Vol 9 (12) ◽  
pp. 1012-1017 ◽  
Author(s):  
Kimikazu Sano ◽  
Hiroyuki Fukuyama ◽  
Makoto Nakamura ◽  
Miwa Mutoh ◽  
Hideyuki Nosaka ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Transimpedance Amplifier ◽  
Wide Dynamic Range ◽  
Optical Links

A CMOS transimpedance amplifier with high gain and wide dynamic range for optical fiber sensing system

Optik ◽  
2015 ◽  
Vol 126 (15-16) ◽  
pp. 1389-1393 ◽  
Author(s):  
Lianxi Liu ◽  
Jiao Zou ◽  
Ning Ma ◽  
Zhangming Zhu ◽  
Yintang Yang
Keyword(s):  
Optical Fiber ◽  
Dynamic Range ◽  
High Gain ◽  
Transimpedance Amplifier ◽  
Wide Dynamic Range ◽  
Fiber Sensing ◽  
Sensing System ◽  
Optical Fiber Sensing

A high gain wide dynamic range transimpedance amplifier for optical receivers

2014 ◽  
Vol 35 (1) ◽  
pp. 015001 ◽  
Author(s):  
Lianxi Liu ◽  
Jiao Zou ◽  
Yunfei En ◽  
Shubin Liu ◽  
Yue Niu ◽  
...  
Keyword(s):  
Dynamic Range ◽  
High Gain ◽  
Transimpedance Amplifier ◽  
Optical Receivers ◽  
Wide Dynamic Range

A high-bandwidth low current transimpedance amplification circuit

2021 ◽  
Vol 16 (11) ◽  
pp. P11032
Author(s):  
Hao Liu ◽  
Chunhui Dong ◽  
XinYing Yang ◽  
Feng Cheng ◽  
Qingxian Zhang ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Parasitic Capacitance ◽  
Peak Amplitude ◽  
Transimpedance Amplifier ◽  
Wide Dynamic Range ◽  
Wide Range ◽  
Integral Nonlinearity ◽  
High Bandwidth ◽  
Circuit Noise ◽  
Current Drift

Abstract A measuring circuit is designed based on the transimpedance amplifier. The methods of reducing parasitic capacitance and improving amplifier performance are introduced in detail. The influence of the parasitic capacitance generated by the feedback resistors on the bandwidth in the transimpedance amplification circuit is discussed. The circuit can measure the wide-dynamic-range low current ranging from 10-13 A to 10-5 A in four ranges. The circuit's bandwidth is up to 500 Hz when the circuit can normally work to measure a wide-range low current. The peak-to-peak amplitude of circuit noise is less than 0.22 pA. The current drift is less than 1.06 fA/∘C over a temperature range of 0∘C to 85∘C, and the integral nonlinearity is less than 0.25%.

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

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