scholarly journals Effect of thickness of nickel film on W(110) surface upon the character of adsorption of nitric oxide molecules

2020 ◽  
pp. 115-120
Author(s):  
T.T. Magkoev ◽  
Keyword(s):  
Nitric Oxide ◽  
Infrared Spectroscopy ◽  
Film Thickness ◽  
Ir Spectra ◽  
Electron State ◽  
Monolayer Film ◽  
Potential Relief ◽  
Nickel Films ◽  
Reflection Absorption Infrared Spectroscopy ◽  
Adsorption Geometry

Adsorption of nitic oxide molecules NO on the surface of structurally ordered 1, 2 and 3 monolayer thick nickel films deposited onto W(110) surface has been studied by means of reflection-absorption infrared spectroscopy. The structure of nickel films at all thicknesses studied corresponds to Ni(111) crystal. The IR spectra of NO molecules adsorbed on a 3 monolayer Ni film correspond to those of NO on bulk Ni(111) crystal. At lower film thickness there are differences more pronounced for a monolayer film. This is due to additional effect of underlying W(110) support upon the intramolecular NO bond, and/or to some distortion of (111) structure of monolayer film, compared to bulk Ni(111), because of potential relief of the substrate and, consequently, change of adsorption geometry and electron state of NO molecules.

Preparation and Characterization of Magnetic Force Microscopy Tips Coated with Nickel Films by e-Beam Evaporation

2018 ◽  
Vol 765 ◽  
pp. 3-7
Author(s):  
Badin Damrongsak ◽  
Samutchar Coomkaew ◽  
Karnt Saengkaew ◽  
Ittipon Cheowanish ◽  
Pongsakorn Jantaratana
Keyword(s):  
Film Thickness ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Film Surface ◽  
Electron Beam Evaporation ◽  
Film Stress ◽  
Nickel Films ◽  
Force Microscopy ◽  
Best Response ◽  
Cantilever Bending

In this work, magnetic force microscopy (MFM) tips coated with a nickel thin-film were prepared and characterized for applications in the measurement of the magnetic write field. Nickel films with various thicknesses in a range of 20 – 80 nm were deposited on silicon substrates and silicon atomic force microscopy (AFM) tips by electron beam evaporation. Film surface morphologies and magnetic properties of the coated nickel films were investigated by using AFM and vibrating sample magnetometry (VSM). The rms roughness increased with the film thickness and was in a range between 0.1 and 0.3 nm. VSM results revealed that the mean coercive field of the nickel films was 20 Oe and there was an increase in the coercivity as the film thickness increased. In addition, the prepared MFM tips were evaluated for the tip response to the dc and ac magnetic field generated from perpendicular write heads. It was found that the MFM tip had the best response to the write field when coated with 60 nm thick nickel film. The coating thickness over 60 nm was inapplicable due to the cantilever bending caused by the film stress.

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