scholarly journals A New Real Time Control Approach for Time Efficiency in Group Elevator Control System

Author(s):  
Mehmet BAYĞIN ◽  
Dilbirin ORHAN ◽  
Orhan YAMAN ◽  
Mehmet KARAKÖSE
2009 ◽  
Vol 4 (3) ◽  
Author(s):  
I. Irizar ◽  
J. Alferes ◽  
L. Larrea ◽  
E. Ayesa

This paper presents a real-time control architecture for SBR systems with no holding tank. The control approach has been divided into three separated layers in order to accommodate different full-scale scenarios. The lower control layer processes the ORP and DO trajectories to detect the depletion of the denitrification and nitrification reactions in order to automatically interrupt the reaction phases. The intermediate layer has been designed to maintain the total solid mass constant in reactors. Finally, an ammonia controller has been implemented in the supervisory layer that optimises the aeration costs to fulfil the effluent ammonia requirements. The overall control system has been verified experimentally in a 150L pilot plant. In this study, the lower control layer reduced the length of mixing and aeration by approximately 20%. In addition, the experimental validation of the ammonia controller led to reductions of about 30% in the overall aerated fraction.


1995 ◽  
Vol 389 ◽  
Author(s):  
K. C. Saraswat ◽  
Y. Chen ◽  
L. Degertekin ◽  
B. T. Khuri-Yakub

ABSTRACTA highly flexible Rapid Thermal Multiprocessing (RTM) reactor is described. This flexibility is the result of several new innovations: a lamp system, an acoustic thermometer and a real-time control system. The new lamp has been optimally designed through the use of a “virtual reactor” methodology to obtain the best possible wafer temperature uniformity. It consists of multiple concentric rings composed of light bulbs with horizontal filaments. Each ring is independently and dynamically controlled providing better control over the spatial and temporal optical flux profile resulting in excellent temperature uniformity over a wide range of process conditions. An acoustic thermometer non-invasively allows complete wafer temperature tomography under all process conditions - a critically important measurement never obtained before. For real-time equipment and process control a model based multivariable control system has been developed. Extensive integration of computers and related technology for specification, communication, execution, monitoring, control, and diagnosis demonstrates the programmability of the RTM.


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