scholarly journals Computer simulation of temperature field of blast furnaces air tuyere

2017 ◽  
Vol 9 (1) ◽  
pp. 117-125 ◽  
Author(s):  
Alexander G. Radjuk ◽  
Alexander E. Titlianov ◽  
Mikhail M. Skripalenko
Keyword(s):  
Computer Simulation ◽  
Temperature Field ◽  
Blast Furnaces ◽  
Air Tuyere

scholarly journals Simplified simulation technique of rotating, induction heated, calender rolls for study of temperature field control

Open Physics ◽  
2018 ◽  
Vol 16 (1) ◽  
pp. 326-331
Author(s):  
Jerzy Zgraja
Keyword(s):  
Computer Simulation ◽  
Temperature Field ◽  
Control Systems ◽  
Heating System ◽  
The Other ◽  
Fast Simulation ◽  
Field Control ◽  
The One ◽  
Heated Object ◽  
Induction Heating System

Abstract Predictive computer simulation of the temperature field control system of an induction heated object encounters difficulties associated with the nonlinearityof systemon the one hand, and the time of calculation on the other hand, during numerical analysis of the magnetothermal field of the object, especially in 3D. The paper presents a methodology for the fast simulation of temperature field for a completed induction heating system of calender rolls. The method of 3D calculations of rotating calender rolls with a moving web of wet paper can be connected easily with a simulation of the temperature field controller, for simulation of complex control systems.

Computer simulation of temperature field of multilayer pyroelectric thin film IR detector

2004 ◽  
Vol 30 (7) ◽  
pp. 1847-1850 ◽  
Author(s):  
Liang Li ◽  
Liangying Zhang ◽  
Xi Yao ◽  
Bo Li
Keyword(s):  
Thin Film ◽  
Computer Simulation ◽  
Temperature Field ◽  
Ir Detector

Improving air-tuyere operation in blast furnaces by means of coatings and sealant

2013 ◽  
Vol 43 (5) ◽  
pp. 231-235 ◽  
Author(s):  
N. L. Kirillova ◽  
A. G. Radyuk ◽  
A. E. Titlyanov ◽  
S. M. Gorbatyuk
Keyword(s):  
Blast Furnaces ◽  
Air Tuyere

Modeling of the Temperature Field of Air Tuyeres in the Blast Furnaces with Thermal Insulation of the Nose Portion

Metallurgist ◽  
2018 ◽  
Vol 62 (3-4) ◽  
pp. 310-313 ◽  
Author(s):  
A. G. Radyuk ◽  
A. E. Titlyanov ◽  
M. M. Skripalenko ◽  
S. S. Stoishich
Keyword(s):  
Temperature Field ◽  
Thermal Insulation ◽  
Blast Furnaces

Characteristics and Application of Temperature-Field Emitters

1975 ◽  
Vol 33 ◽  
pp. 144-145
Author(s):  
N. Tamura ◽  
T. Goto ◽  
Y. Harada
Keyword(s):  
Temperature Field ◽  
Electron Microscope ◽  
Field Emission ◽  
Resolving Power ◽  
High Brightness ◽  
Field Emitters ◽  
Emission Electron ◽  
Sufficient Stability ◽  
Scanning Electron ◽  
Illuminating System

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

Multiple-fracturing and viewing of the same frozen sample at different depths using a low temperature FESEM

1996 ◽  
Vol 54 ◽  
pp. 820-821
Author(s):  
M.V. Parthasarathy ◽  
C. Daugherty
Keyword(s):  
Temperature Field ◽  
Low Temperature ◽  
Field Emission ◽  
Multiple Fracture ◽  
Precise Control ◽  
Cold Stage ◽  
Different Depths ◽  
Transfer Device

The versatility of Low Temperature Field Emission SEM (LTFESEM) for viewing frozen-hydrated biological specimens, and the high resolutions that can be obtained with such instruments have been well documented. Studies done with LTFESEM have been usually limited to the viewing of small organisms, organs, cells, and organelles, or viewing such specimens after fracturing them.We use a Hitachi 4500 FESEM equipped with a recently developed BAL-TEC SCE 020 cryopreparation/transfer device for our LTFESEM studies. The SCE 020 is similar in design to the older SCU 020 except that instead of having a dedicated stage, the SCE 020 has a detachable cold stage that mounts on to the FESEM stage when needed. Since the SCE 020 has a precisely controlled lock manipulator for transferring the specimen table from the cryopreparation chamber to the cold stage in the FESEM, and also has a motor driven microtome for precise control of specimen fracture, we have explored the feasibility of using the LTFESEM for multiple-fracture studies of the same sample.

Characterization of Modulated Structure Through Structure Images and their Computer Simulation

1990 ◽  
Vol 48 (1) ◽  
pp. 70-71
Author(s):  
Kiyomichi Nakai ◽  
Yusuke Isobe ◽  
Chiken Kinoshita ◽  
Kazutoshi Shinohara
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Basic Mechanism ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Transmitted Beam ◽  
Modulated Structure ◽  
Resolution Electron

Induced spinodal decomposition under electron irradiation in a Ni-Au alloy has been investigated with respect to its basic mechanism and confirmed to be caused by the relaxation of coherent strain associated with modulated structure. Modulation of white-dots on structure images of modulated structure due to high-resolution electron microscopy is reduced with irradiation. In this paper the atom arrangement of the modulated structure is confirmed with computer simulation on the structure images, and the relaxation of the coherent strain is concluded to be due to the reduction of phase-modulation.Structure images of three-dimensional modulated structure along <100> were taken with the JEM-4000EX high-resolution electron microscope at the HVEM Laboratory, Kyushu University. The transmitted beam and four 200 reflections with their satellites from the modulated structure in an fee Ni-30.0at%Au alloy under illumination of 400keV electrons were used for the structure images under a condition of the spherical aberration constant of the objective lens, Cs = 1mm, the divergence of the beam, α = 3 × 10-4 rad, underfocus, Δf ≃ -50nm and specimen thickness, t ≃ 15nm. The CIHRTEM code was used for the simulation of the structure image.

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