scholarly journals Measurement of Steel Structure Elements in the Specialized Module of the IMAGE-SP Image Processing Software

2020 ◽  
Vol 11 (4) ◽  
pp. 279-288
Author(s):  
A. G. Anisovich

Grain size is one of the most important characteristics of the microstructure of metals and alloys. Determination of the grain size of steel is regulated by Standart 5639-82 "Steels and alloys. Methods for detection and determination of the grain size". Standart includes determining the grain score by comparison with reference scales, as well as manual measurement methods. The use of image processing software opens up new opportunities for the materials analysis, including for the quantitative metallographic analysis of steels and alloys. The purpose of this work was to test the specialized "Metallography" module to determine the grain score of the image processing software "IMAGE – SP", as well as to check the reliability of the obtained results using the example of ferritic and austenitic steels.In the "Metallography" module, the analysis of standard images of annex No. 3 of Standart 5639-82, as well as real images of the structures of ferritic and austenitic steel, is carried out. It is shown that the results correspond to the definition of the Standart grain score. The divergence in the results is 1 point, which is acceptable.The active development of software products for the quantitative analysis of images in metallography will make it possible to legitimize the methods of computer measurement of parameters of the structures of metals and alloys by creating appropriate standards. Successful testing of the specialized "Metallography" module demonstrates opportunities and prospects for further development of specialized software products for measuring quantitative values of metal and alloy structures. The active development of software for quantitative analysis of the images in metallography will make it possible to legalize methods for measuring parameters of metal and alloy structures by computer techniques.

2016 ◽  
Vol 1141 ◽  
pp. 51-53
Author(s):  
Chetan Zankat ◽  
V.M. Pathak ◽  
Pratik Pataniya ◽  
G.K. Solanki ◽  
K.D. Patel ◽  
...  

Amorphous SnSe thin films were deposited by thermal evaporation technique on glass substrates kept at room temperature in a vacuum better than 10-5Torr. A detailed study of structural and optical properties of 150 nm thin film was carried out. The selected area diffraction patterns obtained by TEM for this thin film were analyzed by a new method that involves accurate determination of lattice parameters by image processing software. The obtained results are in good agreement with the JCPDS data. Optical transmission spectra obtained at room temperature were analyzed to study optical properties of deposited thin films. It has been found that indirect carrier transition is responsible for optical absorption process in the deposited thin films.


2017 ◽  
Vol 30 (4) ◽  
pp. 351-358 ◽  
Author(s):  
Yasushi Horai ◽  
Tetsuhiro Kakimoto ◽  
Kana Takemoto ◽  
Masaharu Tanaka

2000 ◽  
Vol 179 ◽  
pp. 229-232
Author(s):  
Anita Joshi ◽  
Wahab Uddin

AbstractIn this paper we present complete two-dimensional measurements of the observed brightness of the 9th November 1990Hαflare, using a PDS microdensitometer scanner and image processing software MIDAS. The resulting isophotal contour maps, were used to describe morphological-cum-temporal behaviour of the flare and also the kernels of the flare. Correlation of theHαflare with SXR and MW radiations were also studied.


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