Structural Analysis for Surface and Interface of Polymer Thin Films by Synchrotron Radiation X-Ray Scattering Method

2016 ◽  
Vol 72 (9) ◽  
pp. P-422-P-427
Author(s):  
RYOHEI ISHIGE
2022 ◽  
Vol 40 (1) ◽  
pp. 013411
Author(s):  
Claudia Lau ◽  
Nicholas G. Combs ◽  
Evguenia Karapetrova ◽  
Juan Jiang ◽  
Susanne Stemmer ◽  
...  

2020 ◽  
Vol 92 (14) ◽  
pp. 9956-9962
Author(s):  
Koji Kimura ◽  
Hisao Kiuchi ◽  
Kouichi Hayashi ◽  
Akiyoshi Nakata ◽  
Fumika Fujisaki ◽  
...  

2005 ◽  
Vol 38 (10) ◽  
pp. 4311-4323 ◽  
Author(s):  
Byeongdu Lee ◽  
Insun Park ◽  
Jinhwan Yoon ◽  
Soojin Park ◽  
Jehan Kim ◽  
...  

1989 ◽  
Vol 151 ◽  
Author(s):  
G. S. Cargill

ABSTRACTX-ray scattering experiments provide important information about the atomic scale structure and the microstructure of thin films and multilayers. The high intensity, brightness, and broad energy spectrum of synchrotron radiation greatly extend capabilities of scattering experiments, particularly for scattering from ultrathin films and for anomalous dispersion scattering from alloys. Examples of scattering studies of both crystalline and amorphous materials are given in this overview.


2010 ◽  
Vol 108 (9) ◽  
pp. 093505 ◽  
Author(s):  
F. S. Teixeira ◽  
M. C. Salvadori ◽  
M. Cattani ◽  
I. G. Brown

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