DEVELOPMENT OF ROOT LOCALIZATION METHOD OF ALGEBRAIC EQUATIONS BASED ON THE PRINCIPLE OF COMPUTATIONAL SOLVABILITY

Author(s):  
N.N. Kerimbay ◽  
◽  
D.S. Ergaliev ◽  
A.B. Nysanbaeva ◽  
G.N. Kerimbay ◽  
...  
2014 ◽  
Author(s):  
Susan Carrigan ◽  
Evan Palmer ◽  
Philip J. Kellman
Keyword(s):  

2020 ◽  
pp. 60-73
Author(s):  
Yu V Nemirovskii ◽  
S V Tikhonov

The work considers rods with a constant cross-section. The deformation law of each layer of the rod is adopted as an approximation by a polynomial of the second order. The method of determining the coefficients of the indicated polynomial and the limit deformations under compression and tension of the material of each layer is described with the presence of three traditional characteristics: modulus of elasticity, limit stresses at compression and tension. On the basis of deformation diagrams of the concrete grades B10, B30, B50 under tension and compression, these coefficients are determined by the method of least squares. The deformation diagrams of these concrete grades are compared on the basis of the approximations obtained by the limit values and the method of least squares, and it is found that these diagrams approximate quite well the real deformation diagrams at deformations close to the limit. The main problem in this work is to determine if the rod is able withstand the applied loads, before intensive cracking processes in concrete. So as a criterion of the conditional limit state this work adopts the maximum permissible deformation value under tension or compression corresponding to the points of transition to a falling branch on the deformation diagram level in one or more layers of the rod. The Kirchhoff-Lyav classical kinematic hypotheses are assumed to be valid for the rod deformation. The cases of statically determinable and statically indeterminable problems of bend of the rod are considered. It is shown that in the case of statically determinable loadings, the general solution of the problem comes to solving a system of three nonlinear algebraic equations which roots can be obtained with the necessary accuracy using the well-developed methods of computational mathematics. The general solution of the problem for statically indeterminable problems is reduced to obtaining a solution to a system of three nonlinear differential equations for three functions - deformation and curvatures. The Bubnov-Galerkin method is used to approximate the solution of this equation on the segment along the length of the rod, and specific examples of its application to the Maple system of symbolic calculations are considered.


2006 ◽  
Vol 6 (3) ◽  
pp. 264-268
Author(s):  
G. Berikelashvili ◽  
G. Karkarashvili

AbstractA method of approximate solution of the linear one-dimensional Fredholm integral equation of the second kind is constructed. With the help of the Steklov averaging operator the integral equation is approximated by a system of linear algebraic equations. On the basis of the approximation used an increased order convergence solution has been obtained.


Author(s):  
J.G. van Hassel ◽  
Xiao-Mei Zhang

Abstract Failures induced in the silicon substrate by process marginalities or process mistakes need continuous attention in new as well as established technologies. Several case studies showing implant related defects and dislocations in silicon will be discussed. Depending on the electrical characteristics of the failure the localization method has to be chosen. The emphasis of the discussion will be on the importance of the right choice for further physical de-processing to reveal the defect. This paper focuses on the localization method, the de- processing technique and the use of Wright etch for subsequent TEM preparation.


Author(s):  
R. Rosenkranz ◽  
W. Werner

Abstract In many cases of failure localization, passive voltage contrast (PVC) localization method does not work, because it is not possible to charge up conducting structures which supposed to be dark in the SEM and FIB images. The reason for this is leakage currents. In this article, the authors show how they succeeded in overcoming these difficulties by the application of the active voltage contrast (AVC) method as it was described as biased voltage contrast by Campbell and Soden. They identified three main cases where the PVC didn't work but where they succeeded in failure localization with the AVC method. This is illustrated with the use of two case studies. Compared to the optical beam based methods the resolution is much better so a single failing contact of e.g. 70 nm technology can clearly be identified which cannot be done by TIVA or OBIRCH.


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