AN ELECTRON BEAM SCANNING SYSTEM FOR MEASURING DIELECTRIC PROPERTIES. Final Report.
1968 ◽
Vol 39
(12)
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pp. 1804-1806
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Richard N. Kniseley
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Francis C. Laabs
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Dean Van Zuuk
1976 ◽
Vol 26
(4-5)
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pp. 216
1975 ◽
Vol 12
(6)
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pp. 1156-1159
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1989 ◽
Vol 60
(7)
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pp. 1771-1774
2018 ◽
Vol 45
(11)
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pp. 5305-5316
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Ludovic De Marzi
◽
Annalisa Patriarca
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Catherine Nauraye
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Eric Hierso
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Rémi Dendale
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...
2019 ◽
Vol 112
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pp. 754-765
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N.K. Hota
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N. Karna
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K.A. Dubey
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D.K. Tripathy
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B.P. Sahoo
2009 ◽
Vol 42
(8)
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pp. 085503
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Rohit Verma
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R Dhar
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R Dabrowski
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M Tykarska
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V K Wadhawan
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...
2018 ◽
Vol 143
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pp. 43-49
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P. Yu
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M. Yan
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D. Tomus
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C.A. Brice
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C.J. Bettles
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...
K. Shinyama
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M. Baba
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S. Fujita