scholarly journals AN ELECTRON BEAM SCANNING SYSTEM FOR MEASURING DIELECTRIC PROPERTIES. Final Report.

1967 ◽  
Author(s):  
Not Given Author
1968 ◽  
Vol 39 (12) ◽  
pp. 1804-1806 ◽  
Author(s):  
Richard N. Kniseley ◽  
Francis C. Laabs ◽  
Dean Van Zuuk

2018 ◽  
Vol 45 (11) ◽  
pp. 5305-5316 ◽  
Author(s):  
Ludovic De Marzi ◽  
Annalisa Patriarca ◽  
Catherine Nauraye ◽  
Eric Hierso ◽  
Rémi Dendale ◽  
...  

2018 ◽  
Vol 143 ◽  
pp. 43-49 ◽  
Author(s):  
P. Yu ◽  
M. Yan ◽  
D. Tomus ◽  
C.A. Brice ◽  
C.J. Bettles ◽  
...  

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