Improved Electron Beam Scanning System for Electron Microprobe X‐Ray Analyzers

1968 ◽  
Vol 39 (12) ◽  
pp. 1804-1806 ◽  
Author(s):  
Richard N. Kniseley ◽  
Francis C. Laabs ◽  
Dean Van Zuuk
Keyword(s):  
Electron Beam ◽  
Electron Microprobe ◽  
Scanning System ◽  
Beam Scanning ◽  
X Ray

scholarly journals Monte Carlo Simulations of a Scanning System Based on a Panoramic X-Ray Tube with a Conical Anode

2014 ◽  
Vol 2014 ◽  
pp. 1-9 ◽  
Author(s):  
Andrii Sofiienko ◽  
Chad Jarvis ◽  
Ådne Voll
Keyword(s):  
Monte Carlo ◽  
Electron Beam ◽  
Angular Distribution ◽  
Monte Carlo Simulations ◽  
Electron Beams ◽  
Numerical Calculations ◽  
Scanning System ◽  
Pencil Beam ◽  
X Ray ◽  
Photon Intensity

Monte Carlo simulations were used to study photon production in a panoramic X-ray tube with a conical tungsten target to determine the optimal characteristics of the target shape and electron beam configuration. Several simulations were performed for accelerating potentials equal to 250 kV, 300 kV, and 500 kV with electron beams of various radii and anode sizes. The angular distribution of the photon intensity was analysed by numerical calculations for an assembly composed of an X-ray tube and an external collimator with a cylindrical hole to simulate a panoramic scanning system with an X-ray pencil beam.

A Novel Micro-Multifocus X-Ray Source Based on Electron Beam Scanning for Multi-View Stationary Micro Computed Tomography

2020 ◽  
Vol 41 (1) ◽  
pp. 167-170 ◽  
Author(s):  
Kang An ◽  
Yifan Yin ◽  
Fukun Li ◽  
Limin Shi ◽  
Xiaolong Hu ◽  
...  
Keyword(s):  
Computed Tomography ◽  
Electron Beam ◽  
Micro Computed Tomography ◽  
Beam Scanning ◽  
X Ray

Equipment for Beam Scanning and Step Scanning in Electron-Probe Analysis

1961 ◽  
Vol 5 ◽  
pp. 538-553 ◽  
Author(s):  
David B. Wittry ◽  
Ray Fitzgerald
Keyword(s):  
Fixed Time ◽  
Scanning System ◽  
Phase Identification ◽  
Beam Scanning ◽  
Electron Probe Analysis ◽  
X Ray ◽  
Point Analysis ◽  
Scanning Area ◽  
Integrated Intensity ◽  
Electrostatic Deflection

AbstractA versatile beam-scanning system has been developed for use with the Electron Microprobe X-ray Analyzer manufactured by Applied Research Laboratories, Inc. It provides for the display of X-ray intensities from any of three spectrometers, three nondispersive detectors (either counters or scintiallation counters), as well as the current collected by the target or the current backscattered by the target. The electrostatic deflection system does not interfere with the use of the optical-viewing system and provides a maximum scanning area of only slightly less than field of view of the optical-viewing system.A stepping motor, controlled from the readout console, has also been developed which permits automatic point-by-point analysis of a specimen with minimum operator attention. In the use of this attachement, measurements may be made for fixed time, fixed charge, or fixed counts (integrated intensity) at each point. As a result, the step-scanning motor facilitates accurate measurement of one-dimensional concentration fluctuations and is particularly useful for phase identification and studies of diffusion and segregation.

Holistic Mapping in an Electron Microprobe

2001 ◽  
Vol 7 (S2) ◽  
pp. 146-147
Author(s):  
Colin M. MacRae ◽  
N.C. Wilson ◽  
M. Otsuki
Keyword(s):  
Electron Beam ◽  
Electron Microprobe ◽  
Visible Spectrum ◽  
The Other ◽  
Single Frequency ◽  
Small Range ◽  
Solid Target ◽  
X Rays ◽  
X Ray

When an electron beam interacts with a solid target a number of interactions occur which produce electrons, x-rays and light. Typically in an electron microprobe analyser (EPMA) both the electron and x-ray signals are collected for analysis and imaging. However, if the EPMA is equipped with an optical spectrometer then all three signals can be collected. Commonly, the optical or CathodoLuminescence (CL) spectrometer is a monochromator type and can only collect a single frequency or small range of frequencies at a time. Simultaneous collection of the complete visible spectrum is not possible. The collection optics associated with the spectrometer often must be moved into place to start collection, this then obscures the other detectors and prevents simultaneous collection. At CSIRO Minerals an optical spectrometer has been integrated into a JEOL 8900R EPMA and allows simultaneous collect of all light, x-rays and electron signals. This form of mapping, termed Holistic Mapping, has significant advantages over traditional mapping in that it removes the need to have a priori knowledge about what the important frequencies are that will provide the solution to the problem at hand.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

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