scholarly journals Surface characterization of catalytically active metal, alloy, and compound films. Progress report, September 1, 1978--August 31, 1979. [Ag--Cu, Pd--Cu, Pt--Au]

1979 ◽  
Author(s):  
R.W. Vook
Keyword(s):  
Surface Characterization ◽  
Progress Report ◽  
Metal Alloy ◽  
Active Metal ◽  
Catalytically Active

Structural characterization of catalytically active metal clusters in polymer membranes

1997 ◽  
pp. 81-83
Author(s):  
L. Tröger ◽  
H. Hünnefeld ◽  
S. Nunes ◽  
M. Oehring ◽  
D. Fritsch
Keyword(s):  
Structural Characterization ◽  
Metal Clusters ◽  
Polymer Membranes ◽  
Active Metal ◽  
Catalytically Active

Structural characterization of catalytically active metal clusters in polymer membranes

1997 ◽  
Vol 40 (1-4) ◽  
pp. 81-83 ◽  
Author(s):  
L. Tröger ◽  
H. Hünnefeld ◽  
S. Nunes ◽  
M. Oehring ◽  
D. Fritsch
Keyword(s):  
Structural Characterization ◽  
Metal Clusters ◽  
Polymer Membranes ◽  
Active Metal ◽  
Catalytically Active

Synthesis and Characterization of Functionalized Polysiloxane for the Stabilization of Catalytically Active Metal Nanoparticles

2009 ◽  
Vol 42 (14) ◽  
pp. 4937-4940 ◽  
Author(s):  
Matthieu F. Dumont ◽  
Sandy Moisan ◽  
Cyril Aymonier ◽  
Jean-Daniel Marty ◽  
C. Mingotaud
Keyword(s):  
Metal Nanoparticles ◽  
Synthesis And Characterization ◽  
Active Metal ◽  
Catalytically Active

Surface characterization of catalytically active tungsten carbide (WC)

1975 ◽  
Vol 39 (2) ◽  
pp. 298-301 ◽  
Author(s):  
P ROSS
Keyword(s):  
Tungsten Carbide ◽  
Surface Characterization ◽  
Catalytically Active

ChemInform Abstract: Structural Characterization of Catalytically Active Metal Nanoclusters in Poly(amide imide) Films with High Metal Loading.

ChemInform ◽  
2010 ◽  
Vol 28 (22) ◽  
pp. no-no
Author(s):  
L. TROEGER ◽  
H. HUENNEFELD ◽  
S. NUNES ◽  
M. OEHRING ◽  
D. FRITSCH
Keyword(s):  
Structural Characterization ◽  
Metal Nanoclusters ◽  
Metal Loading ◽  
Active Metal ◽  
High Metal ◽  
Catalytically Active

scholarly journals Strong Solvent Effects on Catalytic Transfer Hydrogenation of Ketones with [Ir(cod)(NHC)(PR3)] Catalysts in 2-Propanol-Water Mixtures

Catalysts ◽  
2019 ◽  
Vol 10 (1) ◽  
pp. 17 ◽  
Author(s):  
Krisztina Orosz ◽  
Gábor Papp ◽  
Ágnes Kathó ◽  
Ferenc Joó ◽  
Henrietta Horváth
Keyword(s):  
Strong Dependence ◽  
Preferential Solvation ◽  
Water Concentration ◽  
Reaction Rates ◽  
Transfer Hydrogenation ◽  
X Ray Diffraction ◽  
Active Metal ◽  
Catalytically Active ◽  
Catalytic Transfer

The synthesis and characterization of the new Ir(I)-complexes [IrCl(cod)(Bnmim)], [Ir(cod)(emim)(PPh3)]Cl and [Ir(cod)(Bnmim)(mtppms)] are reported. The zwitterionic complexes [Ir(cod)(NHC)(mtppms)] and Na2[Ir(cod)(NHC)(mtppts)] (NHC = emim, bmim or Bnmim; mtppms-Na and mtppts-Na3 = sodium salts of mono- and trisulfonated triphenylphosphine, respectively) were found to be effective precatalysts for transfer hydrogenation of aromatic and aliphatic ketones in basic 2-propanol-water mixtures with initial turnover frequencies up to 510 h−1 at 80 °C, and their catalytic performances were compared to those of [IrCl(cod)(NHC)] complexes (NHC = emim, bmim, Bnmim, IMes) and [Ir(cod)(emim)(PPh3)]Cl. Three of the catalysts were characterized by single-crystal X-ray diffraction. The reaction rates of the transfer hydrogenation of acetophenone and benzophenone showed strong dependence on the water concentration of the solvent, indicating preferential solvation of the catalytically active metal complexes.

Structural Characterization of Catalytically Active Metal Nanoclusters in Poly(amide imide) Films with High Metal Loading

1997 ◽  
Vol 101 (8) ◽  
pp. 1279-1291 ◽  
Author(s):  
L. Tröger ◽  
H. Hünnefeld ◽  
S. Nunes ◽  
M. Oehring ◽  
D. Fritsch
Keyword(s):  
Structural Characterization ◽  
Metal Nanoclusters ◽  
Metal Loading ◽  
Active Metal ◽  
High Metal ◽  
Catalytically Active

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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