Constraining ESSnuSB neutrino flux by observing elastic scattering of neutrinos on electrons

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

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The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071569 ◽

1973 ◽

Vol 31 ◽

pp. 224-225

Author(s):

D. L. Misell

Keyword(s):

Electron Microscopy ◽

Adverse Effect ◽

Elastic Scattering ◽

Inelastic Scattering ◽

Amorphous Carbon ◽

Polymeric Materials ◽

Chromatic Aberration ◽

Image Resolution ◽

Quantitative Estimates ◽

Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

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A New Image Processing Technique for STEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100052171 ◽

1974 ◽

Vol 32 ◽

pp. 432-433

Author(s):

Yasushi Kokubo ◽

Hirotami Koike ◽

Teruo Someya

Keyword(s):

Electron Microscopy ◽

Image Processing ◽

Scanning Electron Microscopy ◽

Elastic Scattering ◽

Field Emission ◽

Processing Technique ◽

Image Processing Technique ◽

Energy Analyzer ◽

Scanning Microscope ◽

Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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A Base Specific Single Heavy Atom Stain for Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100094176 ◽

1972 ◽

Vol 30 ◽

pp. 184-185

Author(s):

J. P. Langmore ◽

N. R. Cozzarelli ◽

A. V. Crewe

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

High Resolution ◽

Elastic Scattering ◽

Heavy Atom ◽

High Vacuum ◽

Heavy Atoms ◽

Large Movement ◽

Base Sequencing ◽

Scanning Electron

A system has been developed to allow highly specific derivatization of the thymine bases of DNA with mercurial compounds wich should be visible in the high resolution scanning electron microscope. Three problems must be completely solved before this staining system will be useful for base sequencing by electron microscopy: 1) the staining must be shown to be highly specific for one base, 2) the stained DNA must remain intact in a high vacuum on a thin support film suitable for microscopy, 3) the arrangement of heavy atoms on the DNA must be determined by the elastic scattering of electrons in the microscope without loss or large movement of heavy atoms.

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