Crystal defect dynamics in Si observed in-situ by cryo-high-voltage electron microscopy

Mapping Intimacies ◽

10.22443/rms.emc2020.1318 ◽

2021 ◽

Author(s):

Kazuhisa Sato ◽

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

Crystal Defect ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron

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In SITU Experiments of Sintering Process by High Voltage Electron Microscopy

Sintering ’87 ◽

10.1007/978-94-009-1373-8_71 ◽

1988 ◽

pp. 423-428

Author(s):

H. Fujita ◽

M. Komatsu

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

Sintering Process ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron ◽

In Situ Experiments

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In-situ observation of void swelling in molybdenum alloys by means of high voltage electron microscopy

Journal of Nuclear Materials ◽

10.1016/0022-3115(82)90757-7 ◽

1981 ◽

Vol 104 ◽

pp. 1157-1161 ◽

Author(s):

Naohiro Igata ◽

Akira Kohyama ◽

Shunji Nomura

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

In Situ Observation ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

Molybdenum Alloys ◽

Void Swelling ◽

High Voltage Electron

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In situ Observation of cellular precipitation in an Al-28 at% Zn alloy by high voltage electron microscopy

Acta Metallurgica ◽

10.1016/0001-6160(73)90210-1 ◽

1973 ◽

Vol 21 (4) ◽

pp. 517-524 ◽

Author(s):

E.P Butler ◽

V Ramaswamy ◽

P.R Swann

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

In Situ Observation ◽

High Voltage Electron Microscopy ◽

Cellular Precipitation ◽

Voltage Electron ◽

High Voltage Electron ◽

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In situ deformation of the [111] aluminum single crystals observed by high voltage electron microscopy

Acta Metallurgica ◽

10.1016/0001-6160(78)90167-0 ◽

1978 ◽

Vol 26 (3) ◽

pp. 405-411 ◽

Author(s):

Teizo Tabata ◽

Shosaku Yamanaka ◽

Hiroshi Fujita

Keyword(s):

Electron Microscopy ◽

Single Crystals ◽

High Voltage ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron ◽

In Situ Deformation

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In-Situ Observation of Dislocation Behaviors in Melting Process of Aluminum by High Voltage Electron Microscopy

Journal of the Physical Society of Japan ◽

10.1143/jpsj.42.1429 ◽

1977 ◽

Vol 42 (4) ◽

pp. 1429-1430 ◽

Author(s):

Hiroshi Fujita ◽

Teizo Tabata ◽

Toshiharu Aoki

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

Melting Process ◽

In Situ Observation ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron

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High voltage electron microscopy In situ study of dislocation process in copper hardened by cobalt-rich precipitates which have a lattice mismatch

Materials Science and Engineering A ◽

10.1016/0921-5093(88)90056-1 ◽

1988 ◽

Vol 101 ◽

pp. 109-116 ◽

Author(s):

E. Nembach ◽

K. Suzuki ◽

M. Ichihara ◽

S. Takeuchi

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

Lattice Mismatch ◽

High Voltage Electron Microscopy ◽

In Situ Study ◽

Voltage Electron ◽

High Voltage Electron ◽

Dislocation Process

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B12-O-17Microsecond Time-Scale In Situ Observations of Electron-Irradiation-Induced Crystallization in an Amorphous Antimony Nanoparticle by Ultra-High Voltage Electron Microscopy

10.1093/jmicro/dfv104 ◽

2015 ◽

Vol 64 (suppl 1) ◽

pp. i27.1-i27

Author(s):

H. Yasuda

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

Electron Irradiation ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron ◽

In Situ Observations ◽

Induced Crystallization

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In-situ ion implantation of Xe into Al with high-resolution high-voltage electron microscopy

1998 International Conference on Ion Implantation Technology. Proceedings (Cat. No.98EX144) ◽

10.1109/iit.1998.813791 ◽

2002 ◽

Author(s):

K. Furuya ◽

K. Mitsuishi ◽

M. Song ◽

T. Saito

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Ion Implantation ◽

High Voltage ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron

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Abstracts of papers presented at the International Symposium In-situ High Voltage Electron Microscopy—Application to Plasticity and Further Topics in Materials Research

Ultramicroscopy ◽

10.1016/s0304-3991(79)80035-2 ◽

1979 ◽

Vol 4 (3) ◽

pp. 255-271

Keyword(s):

Electron Microscopy ◽

International Symposium ◽

High Voltage ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron ◽

Materials Research

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The interaction between dislocations and point obstacles: A comparison of the interaction parameter distributions obtained from computer simulation and from In situ high voltage electron microscopy straining experiments

Materials Science and Engineering ◽

10.1016/0025-5416(82)90070-2 ◽

1982 ◽

Vol 52 (1) ◽

pp. 69-74 ◽

Author(s):

F. Appel ◽

U. Messerschmidt ◽

E.M. Nadgornyi ◽

S.I. Zaitsev

Keyword(s):

Electron Microscopy ◽

Computer Simulation ◽

Interaction Parameter ◽

High Voltage ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron ◽

Parameter Distributions

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