Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy

2021 ◽  
Author(s):  
Daniel Nicholls ◽  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Scanning Transmission Electron Microscopy ◽  
Electron Dose ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Beam Damage

scholarly journals Identification of interstratified mica and pyrophyllite monolayers within chlorite using advanced scanning/transmission electron microscopy

2019 ◽  
Vol 104 (10) ◽  
pp. 1436-1443
Author(s):  
Guanyu Wang ◽  
Hejing Wang ◽  
Jianguo Wen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Clay Minerals ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Chemical Compositions ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Abstract Interstratified clay minerals reflect the weathering degree and record climatic conditions and the pedogenic processes in the soil. It is hard to distinguish a few layers of interstratified clay minerals from the chlorite matrix, due to their similar two-dimensional tetrahedral-octahedral-tetrahedral (TOT) structure and electron-beam sensitive nature during transmission electron microscopy (TEM) imaging. Here, we used multiple advanced TEM techniques including low-dose high-resolution TEM (HRTEM), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging combined with energy-dispersive spectroscopic (EDS) mapping to study interstratified layers in a chlo-rite sample from Changping, Beijing, China. We demonstrated an interstratified mica or pyrophyllite monolayer could be well distinguished from the chlorite matrix by projected atomic structures, lattice spacings, and chemical compositions with advanced TEM techniques. Further investigation showed two different transformation mechanisms from mica or pyrophyllite to chlorite: either a 4 Å increase or decrease in the lattice spacing. This characterization approach can be extended to the studies of other electron-beam sensitive minerals.

Scanning Transmission Electron Microscopy Of Polymer Single Crystals

1977 ◽  
Vol 35 ◽  
pp. 172-173
Author(s):  
S. J. Krause ◽  
L. F. Allard ◽  
W. C. Bigelow
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Single Crystals ◽  
Scanning Transmission Electron Microscopy ◽  
Incident Beam ◽  
Photographic Recording ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Beam Damage

Scanning transmission electron microscopy (STEM) has several advantages over conventional transmission electron microscopy (CTEM) for studying the structure of polymer single crystals. A major limitation in the electron microscopy of polymer single crystals is the rapid loss of diffraction contrast due to destruction of crystallinity by beam-induced cross-linking and/or chain scission. Electronic signal amplification, which is inherent in the STEM image forming system, allows images to be formed at lower incident beam dosages than required for photographic recording in the CTEM. This lowers the beam damage rate and routinely permits recording of bright field, dark field, and electron diffraction sequences, or alternatively, single images at high magnification for high resolution.An SEM operated in the STEM mode at voltages in the range from 20 to 50 KV will give good images of single crystals at magnifications up to 10,000X. An STEM operated at 100 KV with cold stage techniques further improves the imaging capabilities, since beam damage is reduced by 5 to 10 times with an increase in accelerating voltage and lower sample temperatures.1

Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM)

2017 ◽  
Vol 23 (4) ◽  
pp. 794-808 ◽  
Author(s):  
Ryan J. Wu ◽  
Anudha Mittal ◽  
Michael L. Odlyzko ◽  
K. Andre Mkhoyan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Angular Distribution ◽  
Electron Probe ◽  
Scanning Transmission Electron Microscopy ◽  
Probe Intensity ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

AbstractSub-angstrom scanning transmission electron microscopy (STEM) allows quantitative column-by-column analysis of crystalline specimens via annular dark-field images. The intensity of electrons scattered from a particular location in an atomic column depends on the intensity of the electron probe at that location. Electron beam channeling causes oscillations in the STEM probe intensity during specimen propagation, which leads to differences in the beam intensity incident at different depths. Understanding the parameters that control this complex behavior is critical for interpreting experimental STEM results. In this work, theoretical analysis of the STEM probe intensity reveals that intensity oscillations during specimen propagation are regulated by changes in the beam’s angular distribution. Three distinct regimes of channeling behavior are observed: the high-atomic-number (Z) regime, in which atomic scattering leads to significant angular redistribution of the beam; the low-Zregime, in which the probe’s initial angular distribution controls intensity oscillations; and the intermediate-Zregime, in which the behavior is mixed. These contrasting regimes are shown to exist for a wide range of probe parameters. These results provide a new understanding of the occurrence and consequences of channeling phenomena and conditions under which their influence is strengthened or weakened by characteristics of the electron probe and sample.

The Effect of Electron Beam Irradiation in Environmental Scanning Transmission Electron Microscopy of Whole Cells in Liquid

2016 ◽  
Vol 22 (3) ◽  
pp. 656-665 ◽  
Author(s):  
Justus Hermannsdörfer ◽  
Verena Tinnemann ◽  
Diana B. Peckys ◽  
Niels de Jonge
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Scanning Transmission Electron Microscopy ◽  
Environmental Scanning ◽  
Beam Radiation ◽  
Whole Cells ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

AbstractWhole cells can be studied in their native liquid environment using electron microscopy, and unique information about the locations and stoichiometry of individual membrane proteins can be obtained from many cells thus taking cell heterogeneity into account. Of key importance for the further development of this microscopy technology is knowledge about the effect of electron beam radiation on the samples under investigation. We used environmental scanning electron microscopy (ESEM) with scanning transmission electron microscopy (STEM) detection to examine the effect of radiation for whole fixed COS7 fibroblasts in liquid. The main observation was the localization of nanoparticle labels attached to epidermal growth factor receptors (EGFRs). It was found that the relative distances between the labels remained mostly unchanged (<1.5%) for electron doses ranging from the undamaged native state at 10 e−/Å2 toward 103 e−/Å2. This dose range was sufficient to determine the EGFR locations with nanometer resolution and to distinguish between monomers and dimers. Various different forms of radiation damage became visible at higher doses, including severe dislocation, and the dissolution of labels.

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