scholarly journals Effect of Niobium and Titanium Addition on Formation of Second Phase Particles in CHQ Steel Using Transmission Electron Microscope

2021 ◽  
Vol 40 (1) ◽  
pp. 31-37
Author(s):  
Shahid Hussain Abro
Keyword(s):  
Heat Treatment ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Percent ◽  
Holding Time ◽  
Second Phase ◽  
Steel Matrix ◽  
Ehlers Danlos Syndrome ◽  
Transmission Electron ◽  
Second Phase Particles

It is common practice that formation of second phase particles such as nitrides or carbides in the steel matrix has significant role to control the grain size of steel. An attempt is made in the present research work to find out the role of nitrogen to form the nitride particles either with Al, Ti, B, Cr or Si. Two steel samples Steel-A and Steel-B with same titanium and aluminum weight percent in the chemical composition were obtained in hot rolled conditions from international market with only the difference of presence of Niobium in Steel-A. Solution heat treatment was performed at 1350°C with 60 minutes holding time in protherm heat treatment furnace available locally was used to dissolve the particles and then steel samples were reheat treated at 800°C with holding time of 60 minutes and water quenched and microstructure was revealed. Transmission electron microscope connected with Ehlers-Danlos Syndrome (EDS) was used to reveal the morphology of second phase particles. Both samples for a high resolution power Transmission Electron Microscopy (TEM) (Jeol JEM 3010) analysis were prepared by using carbon extraction replica method in 5% Nital solution as an etching technique. Both samples were then caught in copper grid of 3mm for using TEM analysis. TEM micrographs clearly revealed the second phase particles in the matrix of steel. The EDS peaks were studied and it was found that the peaks showed the titanium peaks in both the samples A and B and surprisingly there was no any peak found for aluminum. Stoichiometric calculations were carried out and it was found that weight percent nitrogen required for forming TiN is 0.0073, however the total nitrogen present in both the steels A and B is 0.0058 and 0.0061 respectively. That means that all the nitrogen present in the steel matrix was consumed by titanium to form the Titanium Nitride (TiN) so there was no nitrogen remain to fulfil the requirement of aluminum to form the Aluminum Nitride (AlN) particles.

scholarly journals Understanding the Effect of Aluminum Addition on the Forming of Second Phase Particles on Grain Growth of Micro-Alloyed Steel

2020 ◽  
Vol 10 (1) ◽  
pp. 5153-5156
Author(s):  
S. H. Abro ◽  
H. A. Moria ◽  
A. Chandio ◽  
A. Z. Al-Khazaal
Keyword(s):  
Weight Percent ◽  
Rolling Process ◽  
Second Phase ◽  
Steel Matrix ◽  
Tem Analysis ◽  
Transmission Electron ◽  
Second Phase Particles ◽  
The Matrix ◽  
Micro Alloyed Steel

The formation of second phase particles in the steel matrix during melting and casting plays an important role in controlling the grain size of steel. An attempt is made in the present work to find the role of nitrogen on forming nitride particles either with aluminum or titanium. Two steel samples with the same titanium and aluminum weight percent in their chemical composition were collected after the hot rolling process. Solution heat treatment at 1350°C for 60min holding time was used to dissolve the particles and then the steel samples were reheated at 800°C for 60min, water quenched and their microstructure was revealed by usual grinding and polishing process using 2% Nital. A transmission electron microscope connected with EDS was used to reveal the morphology of the second phase particles. The samples for TEM analysis were prepared by the replica extraction method in 5% Nital solution. The samples were then caught in 3mm copper grid for TEM analysis. TEM micrographs revealed the second phase particles in the matrix of steel. EDS peaks were studied and titanium peaks were found in both samples and surprisingly there was not any peak found for aluminum.

Microstructure Control and Pseudoelasticity of Ti-Nb-Ge Alloy

2008 ◽  
Vol 47-50 ◽  
pp. 1446-1449 ◽  
Author(s):  
Won Yong Kim ◽  
Han Sol Kim
Keyword(s):  
Heat Treatment ◽  
Electron Microscope ◽  
Martensitic Transformation ◽  
Transmission Electron Microscope ◽  
Martensite Transformation ◽  
Room Temperature ◽  
Temperature Deformation ◽  
Microstructure Control ◽  
Transmission Electron ◽  
Pseudoelastic Behavior

Microstructures and pseudoelastic behavior of Ti-Nb-Ge alloys were investigated in order to correlate the pseudoelasticity and microstructure together with martensite transformation. XRD results and transmission electron microscope revealed that stress-induced martensitic transformation takes place during room temperature deformation in the present alloys. Recrystallization heat treatment of the present alloy displayed pseudoelastic behavior to be prominent. It is concluded that the pseudoelastic behavior of a metastable-β Ti-Nb-Ge alloy is correlated to the stress-induced martensite transformation.

The Microstructure of Titanium Beryllide, Tibe12

1990 ◽  
Vol 213 ◽  
Author(s):  
D. Banerjee ◽  
L. Jacobson ◽  
J. Zindell ◽  
T.E. Mitchell
Keyword(s):  
Antiphase Domain ◽  
Weight Percent ◽  
Sputter Deposition ◽  
Inert Gas ◽  
Second Phase ◽  
Defect Structures ◽  
Arc Melting ◽  
Transmission Electron ◽  
Second Phase Particles ◽  
Domain Boundaries

ABSTRACTTitanium beryllide (TiBe12) has been processed by various techniques, including inert gas arc melting, sputter deposition and as second phase particles in atomized powder of alloys ranging in composition from 1 to 35 weight percent Ti. The TiBe12 that formed in the various alloys was characterized by transmission electron microscopy. Defect structures such as microtwinning, antiphase domain boundaries and dislocations have been observed within the beryllide phase. Descriptions of these defect structures will be presented in this paper, together with a discussion of their origin.

Investigation on Dissolving and Strain Induced Precipitation Behavior in Nb-Bearing Microalloyed Steel

2011 ◽  
Vol 109 ◽  
pp. 3-6
Author(s):  
Shao Qiang Yuan ◽  
Guo Li Liang ◽  
Hui Bin Wu
Keyword(s):  
Relaxation Time ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Microalloyed Steel ◽  
Thermal Simulation ◽  
Holding Time ◽  
The Other ◽  
Precipitation Behavior ◽  
Simulation Test ◽  
Transmission Electron

Thermal simulation test, TEM(Transmission Electron Microscope) and nanobeam EDS techniques were used to investigate the dissolving and precipitation behavior in Nb-bearing mciroalloyed steel. The experimental results indicate that: there are two families of precipitates in the as forged samples. The larger precipitates of Nb(C,N) disappear after being held for 2h at 1300°C,while the inclusions of MnS formed from the solidification even remain for 48h held at that temperature. After 30% of predeformtion at 850°C and 900°C, the strain-induced precipitation occurs, that is, the other tiny precipitates. Compared with the samples relaxed at 850°C, the ones that are held at 900°C show larger particles by same holding time but demonstrate the same size when the relaxation time reaches 1000s.

Crystallization Of Amorphous Silicon During Thin Film Gold Reaction

1985 ◽  
Vol 54 ◽  
Author(s):  
Lars G. Hultman ◽  
P. A. Psaras ◽  
H.T.G. Hentzell
Keyword(s):  
Thin Film ◽  
Heat Treatment ◽  
Electron Microscope ◽  
Amorphous Silicon ◽  
Transmission Electron Microscope ◽  
Back Surface ◽  
Transmission Electron

ABSTRACTThe crystallization of α-Si in α-Si(50nm) and Au(5nm) thin film bi-layers has been investigated during heat treatment in a transmission electron microscope (TEM). When crystallization of α-Si first begins at 130°C the Au-Si alloy reflections observed at lower temperatures vanish and several new reflections from metastable Au-Si compounds occur. Dendritically growing islands of poly-Si are observed after heating at 175°C. If the samples are held constant at 175°C for ten minutes, the poly-Si islands grow together. The formation of poly-Si depends on the diffusion of Au into α-Si and the formation of metastable Si-Au compounds. After crystallization Au segregates to the front and back surface of the poly-Si film.

A Reproducible Selective Stain for Cardiac Sarcoplasmic Reticulum

1974 ◽  
Vol 32 ◽  
pp. 214-215
Author(s):  
R. A. Waugh ◽  
J. R. Sommer
Keyword(s):  
Complex System ◽  
Electron Microscope ◽  
Sarcoplasmic Reticulum ◽  
Transmission Electron Microscope ◽  
Electron Microscopic ◽  
Cardiac Sarcoplasmic Reticulum ◽  
Transmission Electron

Cardiac sarcoplasmic reticulum (SR) is a complex system of intracellular tubules that, due to their small size and juxtaposition to such electron-dense structures as mitochondria and myofibrils, are often inconspicuous in conventionally prepared electron microscopic material. This study reports a method with which the SR is selectively “stained” which facilitates visualizationwith the transmission electron microscope.

Surface Structure of the Spores of Glugea Weissenbergi

1969 ◽  
Vol 27 ◽  
pp. 238-239
Author(s):  
Sanford H. Vernick ◽  
Anastasios Tousimis ◽  
Victor Sprague
Keyword(s):  
Electron Microscope ◽  
Surface Structure ◽  
Transmission Electron Microscope ◽  
Mature Spore ◽  
Spore Surface ◽  
Sectioned Material ◽  
Transmission Electron ◽  
Surface Detail

Recent electron microscope studies have greatly expanded our knowledge of the structure of the Microsporida, particularly of the developing and mature spore. Since these studies involved mainly sectioned material, they have revealed much internal detail of the spores but relatively little surface detail. This report concerns observations on the spore surface by means of the transmission electron microscope.

A New High Resolution Transmission Electron Microscope with Second-Zone Objective Lens

1969 ◽  
Vol 27 ◽  
pp. 176-177 ◽  
Author(s):  
H. Tochigi ◽  
H. Uchida ◽  
S. Shirai ◽  
K. Akashi ◽  
D. J. Evins ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Objective Lens ◽  
High Excitation ◽  
Transmission Electron ◽  
New Instrument

A New High Excitation Objective Lens (Second-Zone Objective Lens) was discussed at Twenty-Sixth Annual EMSA Meeting. A new commercially available Transmission Electron Microscope incorporating this new lens has been completed.Major advantages of the new instrument allow an extremely small beam to be produced on the specimen plane which minimizes specimen beam damages, reduces contamination and drift.

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

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