Introduction of the Crystal Orientation Mapping Technology Using TEM

Materia Japan ◽  
2022 ◽  
Vol 61 (1) ◽  
pp. 27-34
Author(s):  
Seiichi Suzuki
Keyword(s):  
Crystal Orientation ◽  
Orientation Mapping ◽  
Mapping Technology ◽  
Crystal Orientation Mapping

Application of Crystal Orientation Mapping to Intra-Grain Misorientations

1997 ◽  
Vol 3 (S2) ◽  
pp. 563-564
Author(s):  
Robert Davies ◽  
Valerie Randlè
Keyword(s):  
Crystal Orientation ◽  
Orientation Imaging Microscopy ◽  
Electron Back Scatter Diffraction ◽  
Pure Aluminium ◽  
Orientation Imaging ◽  
Orientation Mapping ◽  
Black Pixel ◽  
Ebsd Pattern ◽  
Crystal Orientation Mapping ◽  
Scanning Electron

Crystal orientation mapping (COM), which is also referred to as orientation imaging microscopy (OIM), is a powerful tool which opens up enormous possibilities for investigation of materials. The principle of COM is that the microstructure is displayed or mapped according to the orientation of sampled volumes of crystal. These data are obtained in the scanning electron microscope by moving either the electron beam or the specimen stage through predetermined steps and collecting an electron back-scatter diffraction (EBSD) pattern. Typically, a null orientation is represented by a black pixel and colours are used to depict orientations, thus allowing discrete orientation changes such as grain boundaries to be plotted directly in a map format. This is exemplified in figure 1 which shows an orientation map generated from pure aluminium which has undergone 5% cold rolling. The diffiiseness of EBSD patterns further permits strain changes to be mapped.

scholarly journals Stage-Rocked Electron Channeling for Crystal Orientation Mapping

2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Karl A. Hujsak ◽  
Benjamin D. Myers ◽  
Jann Grovogui ◽  
Vinayak P. Dravid
Keyword(s):  
Crystal Orientation ◽  
Electron Channeling ◽  
Orientation Mapping ◽  
Crystal Orientation Mapping

Crystal orientation mapping of NiO grown on cube textured Ni tapes

2004 ◽  
Vol 216 (2) ◽  
pp. 123-130 ◽  
Author(s):  
T. G. WOODCOCK ◽  
J. S. ABELL ◽  
J. EICKEMEYER ◽  
B. HOLZAPFEL
Keyword(s):  
Crystal Orientation ◽  
Orientation Mapping ◽  
Crystal Orientation Mapping

scholarly journals Defect Characterization in Irradiated Nanocrystalline Materials via Automated Crystal Orientation Mapping

2017 ◽  
Vol 23 (S1) ◽  
pp. 2236-2237 ◽  
Author(s):  
Pranav K. Suri ◽  
James E. Nathaniel ◽  
Christopher M. Barr ◽  
Jon K. Baldwin ◽  
Khalid Hattar ◽  
...  
Keyword(s):  
Nanocrystalline Materials ◽  
Crystal Orientation ◽  
Defect Characterization ◽  
Orientation Mapping ◽  
Crystal Orientation Mapping

In-depth evolution of chemical states and sub-10-nm-resolution crystal orientation mapping of nanograins in Ti(5 nm)/Au(20 nm)/Cr(3 nm) tri-layer thin films

2018 ◽  
Vol 453 ◽  
pp. 365-372 ◽  
Author(s):  
Xiaoli Zhu ◽  
Matteo Todeschini ◽  
Alice Bastos da Silva Fanta ◽  
Lintao Liu ◽  
Flemming Jensen ◽  
...  
Keyword(s):  
Thin Films ◽  
Crystal Orientation ◽  
Orientation Mapping ◽  
Chemical States ◽  
Crystal Orientation Mapping
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