scholarly journals X-Ray Stress Measurement by The Cos α Method Using Two-Dimensional Detector Part 2: Measurement Procedure and Applications

2017 ◽  
Vol 66 (7) ◽  
pp. 479-487 ◽  
Author(s):  
Keisuke TANAKA
Keyword(s):  
Stress Measurement ◽  
Measurement Procedure ◽  
Two Dimensional ◽  
X Ray ◽  
Detector Part

New Generation X-Ray Stress Measurement Using Debye Ring Image Data by Two-Dimensional Detection

2014 ◽  
Vol 783-786 ◽  
pp. 2103-2108 ◽  
Author(s):  
Toshihiko Sasaki
Keyword(s):  
Stress Analysis ◽  
Generation X ◽  
Stress Measurement ◽  
Image Data ◽  
Two Dimensional ◽  
Analysis Method ◽  
X Ray ◽  
Debye Ring ◽  
New Type ◽  
New Generation

Measuring theory of two types of X-ray stress analysis method was compared with each other. One is the conventional method, in which zero-or one-dimensional detector is used for obtaining diffracted beam and stress is determined using the standard sin2ψ method. Another is the new type of X-ray stress analysis method, in which two-dimensional detector is used to obtain whole Debye ring and stress is determined using the cosα method. An experiment was conducted to investigate the validity.

X-Ray Stress Measurement of Austenitic Stainless Steel with cosα Method and Two-Dimensional X-Ray Detector

2016 ◽  
Vol 879 ◽  
pp. 1679-1684 ◽  
Author(s):  
Toshihiko Sasaki ◽  
Hikaru Sato
Keyword(s):  
Stainless Steel ◽  
Austenitic Stainless Steel ◽  
Stress Measurement ◽  
Diffraction Line ◽  
Two Dimensional ◽  
Measuring Time ◽  
X Ray ◽  
Image Plate ◽  
Fundamental Experiment

This paper describes a fundamental experiment on X-ray stress measurement of austenitic stainless steel (JIS SUS316L) with a new equipment which was developed in this study. An image plate (IP) as a two-dimensional X-ray detector and the cosα method as a principle of the measurement of stress were used in it. An experiment was conducted with CrKβ characteristic X-ray and γFe-311 diffraction line, and the results were compared to those that were obtained with the conventional sin2ψ method under the similar X-ray conditions. It was found that the accuracy of stresses obtained with the equipment developed are almost as same as those of the sin2ψ method. However, the measuring time can be shorten by several times by using it.

The relation of wavelength dispersion and scan mode in X-ray diffractometry with a monochromator

1985 ◽  
Vol 18 (6) ◽  
pp. 506-508
Author(s):  
A. M. Mathieson
Keyword(s):  
Bragg Reflection ◽  
Constant Width ◽  
Full Range ◽  
Measurement Procedure ◽  
Two Dimensional ◽  
One Dimensional ◽  
X Ray ◽  
Dimensional Measurement ◽  
Monochromator Crystal

The contribution to the size of a Bragg reflection due to the interaction of the wavelength dispersion of a monochromator crystal, M, and of a specimen crystal, c, is considered from the two-dimensional Δω, Δ2θ viewpoint. Its variation with change in scan mode is demonstrated. For the ω/θ scan mode, the contribution in respect of Δ2θ [i.e. (Δλ/λ)tan θc ] is independent of the monochromator used and is the same as for the non-monochromator case. For the ω/2θ scan mode, the corresponding contribution [(Δλ/λ)tan θM ] is constant and so, for the conventional one-dimensional measurement procedure, a receiving aperture of constant width may be used to collect intensities over the full range of θc .

Two-Dimensional X-Ray Diffraction for Structure and Stress Analysis

2005 ◽  
Vol 490-491 ◽  
pp. 1-6 ◽  
Author(s):  
Bob B. He ◽  
Ke Wei Xu ◽  
Fei Wang ◽  
Ping Huang
Keyword(s):  
Stress Analysis ◽  
Stress Measurement ◽  
Unit Vector ◽  
Sample Space ◽  
Matrix Transformation ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Texture Measurement ◽  
X Ray ◽  
The Matrix

This paper introduces the recent progress in two-dimensional X-ray diffraction as well as its applications in microstructure and residual stress analysis. Based on the matrix transformation between diffraction space, detector space and sample space, the unit vector of the diffraction vector can be expressed in the sample space corresponding to all the geometric parameters and Bragg conditions. The same transformation matrix can be used for texture and stress analysis. The fundamental equations for both stress measurement and texture measurement are developed with the matrix transformation defined for the two-dimensional diffraction. Stress measurement using twodimensional detector is based on a direct relationship between the stress tensor and the diffraction cone distortion. The two-dimensional detector collects texture data and background values simultaneously for multiple poles and multiple directions.

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