Two-Dimensional X-Ray Diffraction for Structure and Stress Analysis

2005 ◽  
Vol 490-491 ◽  
pp. 1-6 ◽  
Author(s):  
Bob B. He ◽  
Ke Wei Xu ◽  
Fei Wang ◽  
Ping Huang

This paper introduces the recent progress in two-dimensional X-ray diffraction as well as its applications in microstructure and residual stress analysis. Based on the matrix transformation between diffraction space, detector space and sample space, the unit vector of the diffraction vector can be expressed in the sample space corresponding to all the geometric parameters and Bragg conditions. The same transformation matrix can be used for texture and stress analysis. The fundamental equations for both stress measurement and texture measurement are developed with the matrix transformation defined for the two-dimensional diffraction. Stress measurement using twodimensional detector is based on a direct relationship between the stress tensor and the diffraction cone distortion. The two-dimensional detector collects texture data and background values simultaneously for multiple poles and multiple directions.

2014 ◽  
Vol 783-786 ◽  
pp. 2103-2108 ◽  
Author(s):  
Toshihiko Sasaki

Measuring theory of two types of X-ray stress analysis method was compared with each other. One is the conventional method, in which zero-or one-dimensional detector is used for obtaining diffracted beam and stress is determined using the standard sin2ψ method. Another is the new type of X-ray stress analysis method, in which two-dimensional detector is used to obtain whole Debye ring and stress is determined using the cosα method. An experiment was conducted to investigate the validity.


2000 ◽  
Vol 33 (4) ◽  
pp. 1059-1066 ◽  
Author(s):  
J.-D. Kamminga ◽  
Th. H. de Keijser ◽  
E. J. Mittemeijer ◽  
R. Delhez

New methods of diffraction stress analysis of polycrystalline materials, consisting of cubic elastically anisotropic crystallites, are proposed and compared with existing methods. Whereas for the existing methods knowledge of the diffraction elastic constants is presupposed, three new methods are presented that require only knowledge of the (macroscopic) mechanical elastic constants. The stress values obtained with these new methods on the basis of the mechanical elastic constants are more reliable than those obtained with the methods on the basis of the diffraction elastic constants. New and existing methods are illustrated by means of measurements of X-ray diffraction from a magnetron-sputtered TiN layer.


2021 ◽  
Vol 28 (4) ◽  
Author(s):  
Pooja Gupta ◽  
P. N. Rao ◽  
M. K. Swami ◽  
A. Bhakar ◽  
Sohan Lal ◽  
...  

A hard X-ray engineering applications beamline (BL-02) was commissioned recently and started operation in March 2019 at the Indian synchrotron source, Indus-2. This bending-magnet-based beamline is capable of operating in various beam modes, viz. white, pink and monochromatic beam. The beamline utilizes the X-ray diffraction technique in energy-dispersive and angle-dispersive modes to carry out experiments mainly focused on engineering problems, viz. stress measurement, texture measurement and determination of elastic constants in a variety of bulk as well as thin-film samples. An open-cradle six-circle diffractometer with ∼12 kg load capacity allows accommodation of a wide variety of engineering samples and qualifies the beamline as a unique facility at Indus-2. The high-resolution mode of this beamline is suitably designed so as to carry out line profile analysis for characterization of micro- and nano-structures. In the present article the beamline is described starting from the beamline design, layout, optics involved, various operational modes and experimental stations. Experiments executed to validate the beamline design parameters and to demonstrate the capabilities of the beamline are also described. The future facilities to be incorporated to enhance the capabilities of the beamline are also discussed.


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