X-ray diffraction effects from liquids and liquid mixtures

1923 ◽  
Vol s5-5 (30) ◽  
pp. 455-464 ◽  
Author(s):  
R. W. G. Wyckoff
Keyword(s):  
Liquid Mixtures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Effects

Amorphous Solids, Small Particles and Thin Surface Films

1957 ◽  
Vol 1 ◽  
pp. 73-99 ◽  
Author(s):  
F. Schossberger
Keyword(s):  
Electroless Nickel ◽  
Surface Films ◽  
Fibrous Materials ◽  
X Ray Diffraction ◽  
Surface Layers ◽  
X Ray ◽  
Cold Rolled ◽  
Combination Of Methods ◽  
Diffraction Effects ◽  
The Relationship

AbstractA comprehensive chart is preserit of the X-ray diffraction effects of gas-and Uquid-like armorphous substances, small particle-size materials, mixtures of amorphous and crystalline compounds, sheetlike crystals, and fibrous materials.The relationship between the X-ray diagrams and chemical preparations as shown by typical examples from the field of the manufacture of active catalysts cadmium sulfide semiconductors, pour point-depressed lubricants, electroless nickel platings and metal-filled cellulose fibers.The investigation of thin surface layers formed by chemical reactions required the combination of electron and X-ray diffraction techniques. The usefulness of this combination of methods is demonstrated by a study of black stain formation on cold rolled annealed steel. By identifying the materials in the stain and determining the sequence in which they formed a reaction mechanism between steel surface and annealing-gas can be postulated.

A study of a long-spacing mica-like mineral

Clay Minerals ◽  
1966 ◽  
Vol 6 (4) ◽  
pp. 261-281 ◽  
Author(s):  
W. F. Cole
Keyword(s):  
Fourier Transform ◽  
Layer Structure ◽  
Compositional Variation ◽  
X Ray Diffraction ◽  
Transform Method ◽  
X Ray ◽  
Single Complex ◽  
New Interpretation ◽  
The Fourier Transform ◽  
Diffraction Effects

AbstractAn interstratified clay mineral from Surges Bay, Tasmania, described by Cole & Carthew (1953) as containing a random stacking of illite and montmorillonite in the ratio of 3:2 and a regular stacking of illite and montmorillonite in the ratio of 1 : 1 is re-examined, after purification, and a new interpretation is made of the X-ray diffraction effects in terms of a single complex stacking model. The Fourier transform method of analysis used with an appropriate layer structure factor shows that the interstratification is produced by a three component stacking of 18% single mica layers (A), 10% double mica layers (ĀĀ) and 72% allevardite-like layers (ĀB̄) in which the A and ĀĀ layers are never together. This leads to the conclusion that the near regular interstratification of the mineral is due to structural and/or compositional variation from layer to layer within the parent crystals as suggested by Sudo, Hayashi & Shimoda (1962) to explain similar mineral types occurring in Japan.

A Direct Phasing Electron Image of Oxygen Atoms in a Ga-In-Sn-O Ceramic

1997 ◽  
Vol 3 (S2) ◽  
pp. 1057-1058
Author(s):  
W. Sinkler ◽  
L. D. Marks ◽  
D. Edwards ◽  
T. O. Mason
Keyword(s):  
Rietveld Refinement ◽  
Power Spectra ◽  
X Ray Diffraction ◽  
Phase Object ◽  
X Ray ◽  
Focus Image ◽  
Electron Image ◽  
Diffraction Effects ◽  
Oxygen Atoms

In solving complex inorganic structures, often the greatest challenge is to obtain good initial atom positions for Rietveld refinement using x-ray diffraction intensities. In this work, a technique is presented which combines direct phasing with HRTEM and exploits dynamical diffraction effects to obtain an image of oxygen atoms. The technique was used in the structure determination of a monoclinic (Ga0.7In0.3)2SnO5 phase to provide accurate first-guess positions for oxygen atoms for subesquent Rietveld refinement.The solution of the cation positions of the structure relied on HRTEM images. The image in Fig. 1, taken along the crystal’s short b-axis, has a defocus of approximately -50 nm based on the locations of minima in a weak amorphous component in the power spectra of the through-focus image series. Because this is near Scherzer defocus, one expects dark areas of the image to correspond a large projected potential (making the weak phase object approximation). This was used to get successful initial cation positions for a Rietveld refinement of powder x-ray diffraction data. The final refined structure is shown in Fig. 2, including the oxygen positions.

Interface Structure of Epitaxial Nb Films on Sapphire: Grazing Incidence X-Ray Diffraction and X-Ray Reflectivity Studies

1990 ◽  
Vol 209 ◽  
Author(s):  
C. H. Lee ◽  
K. S. Liang ◽  
F. S. Shieu ◽  
S.L. Sass ◽  
C. P. Flynn
Keyword(s):  
Grazing Incidence ◽  
Interface Structure ◽  
Misfit Dislocations ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sapphire Substrates ◽  
Buried Interfaces ◽  
Diffraction Effects

ABSTRACTThe interface structure of MBE grown Nb films on sapphire substrates was studied using grazing incidence x-ray diffraction and x-ray reflectivity measurements. Specifically, the use of these x-ray techniques in probing the buried interfaces was demonstrated. Diffraction effects were observed which are consistent with the presence of misfit dislocations in the interface.

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