Design technique for all-dielectric non-polarizing beam splitter plate

2012 ◽  
Vol 20 (1) ◽  
Author(s):  
A. Rizea
Keyword(s):  
Thin Film ◽  
Beam Splitter ◽  
Electronic Device ◽  
Polarization State ◽  
Dielectric Materials ◽  
Splitter Plate ◽  
Design Technique ◽  
Optical Components ◽  
20 Nm ◽  
Polarizing Beam Splitter

AbstractThere are many situations when, for the proper working, an opto-electronic device requiring optical components does not change the polarization state of light after a reflection, splitting or filtering. In this paper, a design for a non-polarizing beam splitter plate is proposed. Based on certain optical properties of homogeneous dielectric materials we will establish a reliable thin film package formula, excellent for the start of optimization to obtain a 20-nm bandwidth non-polarizing beam splitter.

Robust Design of a High-Performance Laser Thin-Film Polarizing Beam Splitter with Low Layer Errors Sensitivity

2013 ◽  
Vol 33 (2) ◽  
pp. 0231004
Author(s):  
吴素勇 Wu Suyong ◽  
杨开勇 Yang Kaiyong ◽  
谭中奇 Tan Zhongqi
Keyword(s):  
Thin Film ◽  
Robust Design ◽  
High Performance ◽  
Beam Splitter ◽  
Polarizing Beam Splitter

Comparative Research on Different Solutions of a High-Performance Thin-Film Polarizing Beam Splitter

2012 ◽  
Vol 580 ◽  
pp. 134-140
Author(s):  
Kai Yong Yang ◽  
Hong Chang Zhao ◽  
Yun Feng Jia ◽  
Su Yong Wu
Keyword(s):  
Thin Film ◽  
Robust Design ◽  
High Performance ◽  
Beam Splitter ◽  
Dual Frequency ◽  
Physical Requirement ◽  
Optical Films ◽  
Frequency Laser ◽  
Production Errors ◽  
Polarizing Beam Splitter

In the process of fabricating an ultra-high precision thin-film polarizing beam splitter (PBS), which is the key element in a new kind of Y-shaped cavity dual-frequency laser, low production yield is a serious problem. Based on the robust design method by controlling sensitivity of optical films to production errors, response characteristics to production errors of different kinds of PBSs are comparatively studied. By experimental study of robust design, essential determinant of sensitivity of PBSs to production errors is found to be the physical requirement that the propagation angle should be larger than the critical angle of total reflection of the interface between the substrate and outer space. By fulfilling the physical requirement, optimum incidence angle has been found by repeated robust design on different incidence angles, and a high-performance thin-film PBS with low sensitivity to production errors has been designed. The coating structure of the obtained PBS is simple and it is easy to be batch manufactured, which will make a positive impact on fabrication, engineering and application of the new Y-shaped cavity dual-frequency laser.

Design and fabrication of ultra-high precision thin-film polarizing beam splitter

2011 ◽  
Vol 284 (19) ◽  
pp. 4650-4653 ◽  
Author(s):  
Kaiyong Yang ◽  
Xingwu Long ◽  
Yun Huang ◽  
Suyong Wu
Keyword(s):  
Thin Film ◽  
High Precision ◽  
Beam Splitter ◽  
Polarizing Beam Splitter

Grating Polarizing Beam-Splitter Using Oriented Polydiacetylene Thin Film

1996 ◽  
Vol 35 (Part 1, No. 1B) ◽  
pp. 508-509 ◽  
Author(s):  
Satoru Nakao ◽  
Takaaki Suzuki ◽  
Tadashi Takeda ◽  
Yoshio Hayashi ◽  
Ken Ishikawa ◽  
...  
Keyword(s):  
Thin Film ◽  
Beam Splitter ◽  
Polarizing Beam Splitter

Quantitative Image Analysis of Fractal-like Thin Films of Organic Semiconductors

2018 ◽  
Author(s):  
Weikun Zhu ◽  
Erfan Mohammadi ◽  
Ying Diao
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Image Analysis ◽  
Fractal Dimension ◽  
Organic Semiconductors ◽  
Film Growth ◽  
Electronic Device ◽  
Significant Control ◽  
Semiconductor Thin Films ◽  
Two Parameters

Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then employ this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C<sub>8</sub>-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C<sub>8</sub>-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.

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