Tomahawk booster separation system ground test failure investigation and results

2000 ◽  
Author(s):  
Laura McGill
Author(s):  
E. A. Vakulin ◽  
A. I. Zayats ◽  
V. A. Beklemeshev ◽  
V. A. Ivashkevich ◽  
V. A. Khazhiev ◽  
...  

Investigation of failures is one of the critical activities of mining and haulage equipment operability assurance in mining. Maintaining failure investigation at the required quality level, it is possible to identify provisions, rules and procedures that should be revised or changed, operation conditions that should be improved, additional personnel training, if required, etc. Investigation of failures in mines is under responsibility of machine men and electricians of maintenance and operation services. In reality, factory management and setup for production condition weak concernment of these workers in quality investigation aimed at finding of sources of equipment failures. This article describes real-life results achieved in development and use of maintenance service operation, technology and management monitoring. The requirements are substantiated for quality improvement in failure cause finding and removal in mining and haulage equipment at Chernogorsky open pit mine, SUEK-Khakassia. Causes of the present quality of failure investigation by machine men of Chernogorsky Repair and Engineering Works and Chernogorsky open pit mine are revealed. The proposed recommended practices will improve quality of mining and haulage equipment failure investigation.


2013 ◽  
Vol 50 (12) ◽  
pp. 821-830
Author(s):  
K. Andersson ◽  
R. Pederson ◽  
B. Pettersson ◽  
U. Klement

2013 ◽  
Vol 50 (7) ◽  
pp. 501-512
Author(s):  
S. Leggemann ◽  
E. Cagliyan ◽  
S. Riesenbeck ◽  
A. Neidel

Author(s):  
Magdalena Sienkiewicz ◽  
Philippe Rousseille

Abstract This paper presents a case study on scan test reject in a mixed mode IC. It focuses on the smart use of combined mature FA techniques, such as Soft Defect Localization (SDL) and emission microscopy (EMMI), to localize a random scan test anomaly at the silicon bulk level.


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