Small fluence photosensitivity of high germanium doped core optical fibers from 266nm UV irradiation

Mapping Intimacies ◽

10.31224/osf.io/8asrd ◽

2020 ◽

Author(s):

Rex Xiao Tan

Keyword(s):

Optical Fibers ◽

Short Pulse ◽

Bragg Gratings ◽

Phase Mask ◽

Refractive Index Modulation ◽

Uv Laser ◽

Center Wavelength ◽

Germanium Content ◽

Short Pulse Laser ◽

Ultra Short Pulse

The photosensitivity of high germanium content optical fiber was investigated with reference to UV laser of 266nm center wavelength. Bragg gratings were inscribed into the fiber using scanning phase mask method with a 266nm ultra short pulse laser and refractive index modulation due to irradiation was calculated from the parameters of the resulting fiber Bragg gratings. At small fluence, the high germanium content optical fibers seemingly experience competing photosensitivity mechanisms, dissimilar to the characteristics of common photosensitive optical fibers.

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Hollow Core Optical Fibers for Industrial Ultra Short Pulse Laser Beam Delivery Applications

Fibers ◽

10.3390/fib6040080 ◽

2018 ◽

Vol 6 (4) ◽

pp. 80 ◽

Cited By ~ 6

Author(s):

Sebastian Eilzer ◽

Björn Wedel

Keyword(s):

Laser Beam ◽

Optical Fibers ◽

Short Pulse ◽

Flexible Beam ◽

Hollow Core ◽

Laser Interaction ◽

Short Pulse Laser ◽

Core Fiber ◽

Beam Delivery ◽

Ultra Short Pulse

Hollow core fibers were introduced many years ago but are now starting to be used regularly in more demanding applications. While first experiments mainly focused on the characterization and analysis of the fibers themselves, they are now implemented as a tool in the laser beam delivery. Owing to their different designs and implementations, different tasks can be achieved, such as flexible beam delivery, wide spectral broadening up to supercontinuum generation or intense gas-laser interaction over long distances. To achieve a constant result in these applications under varying conditions, many parameters of these fibers have to be controlled precisely during fabrication and implementation. A wide variety of hollow core fiber designs have been analyzed and implemented into a high-power industrial beam delivery and their performance has been measured.

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Inline process analysis and control using optical measurement for the ultra-short pulse laser ablation of CAD designed microstructures

International Congress on Applications of Lasers & Electro-Optics ◽

10.2351/1.5063164 ◽

2015 ◽

Author(s):

Marco Smarra ◽

Jens Hildenhagen ◽

Klaus Dickmann

Keyword(s):

Laser Ablation ◽

Pulse Laser ◽

Pulse Laser Ablation ◽

Optical Measurement ◽

Short Pulse ◽

Process Analysis ◽

Short Pulse Laser ◽

Ultra Short Pulse ◽

And Control ◽

Ultra Short Pulse Laser

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Ultra-Short Pulse Laser Ablation of Biological Hard Tissue and Biocompatibles

Journal of Laser Micro/Nanoengineering ◽

10.2961/jlmn.2008.01.0007 ◽

2008 ◽

Vol 3 (1) ◽

pp. 30-40 ◽

Cited By ~ 16

Author(s):

Martin Strassl

Keyword(s):

Laser Ablation ◽

Pulse Laser ◽

Pulse Laser Ablation ◽

Short Pulse ◽

Hard Tissue ◽

Short Pulse Laser ◽

Ultra Short Pulse ◽

Ultra Short Pulse Laser

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Silicon Thinning using Ultra-Short Pulse Laser Ablation

ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2004p0552 ◽

2004 ◽

Author(s):

F. Beaudoin ◽

P. Perdu ◽

C. DeNardi ◽

R. Desplats ◽

J. Lopez ◽

...

Keyword(s):

Laser Ablation ◽

Sample Preparation ◽

Pulse Laser ◽

Pulse Laser Ablation ◽

Short Pulse ◽

Special Care ◽

Short Pulse Laser ◽

Ultra Short Pulse ◽

Ultra Short Pulse Laser

Abstract Ultra-short pulse laser ablation is applied to IC backside sample preparation. It is contact-less, non-thermal, precise and can ablate the various types of material present in IC packages. This study concerns the optimization of ultra-short pulse laser ablation for silicon thinning. Uncontrolled silicon roughness and poor uniformity of the laser thinned cavity needed to be tackled. Special care is taken to minimize the silicon RMS roughness to less than 1µm. Application to sample preparation of 256Mbit devices is presented.

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