scholarly journals Suggesting a Reliable Method of Calculating Charge Collection Efficiency in Charge-transfer Measurement for Brush Discharges

2019 ◽  
Author(s):  
Nirmalya Basu
Keyword(s):  
Mathematical Model ◽  
Charge Transfer ◽  
Reliable Method ◽  
Collection Efficiency ◽  
Fast Response ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Transfer Measurement ◽  
Induced Charge ◽  
The Mathematical Model

Induced charge errors lead to underestimation of transferred charge in brush discharges when the measurement is done using fast-response unshielded probes. The discrepancy observed between the values of charge-collection efficiency for different charge-transfer thresholds obtained theoretically by Walmsley [2] and those obtained experimentally by Chowdhury et al [3] necessitates figuring out ways to improve the mathematical model used by Walmsley. A close perusal of the said work by Walmsley [2] has pointed out an error therein– in the use of the equation reff = KD. I propose here a way to get rid of this error, and in doing so, I propose a method of calculating the charge-collection efficiency in charge-transfer measurement for brush discharges more reliable than that used by Walmsley [2].

Substrate Engineering for Reduction of Alpha-Particle-Induced Charge Collection Efficiency

1996 ◽  
Vol 35 (Part 1, No. 2B) ◽  
pp. 869-873 ◽  
Author(s):  
Tomohiro Yamashita ◽  
Shigeki Komori ◽  
Takashi Kuroi ◽  
Masahide Inuishi ◽  
Hirokazu Miyoshi
Keyword(s):  
Alpha Particle ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Substrate Engineering ◽  
Induced Charge

Understanding charge transfer and recombination by interface engineering for improving the efficiency of PbS quantum dot solar cells

2018 ◽  
Vol 3 (4) ◽  
pp. 417-429 ◽  
Author(s):  
Chao Ding ◽  
Yaohong Zhang ◽  
Feng Liu ◽  
Yukiko Kitabatake ◽  
Shuzi Hayase ◽  
...  
Keyword(s):  
Charge Transfer ◽  
Electron Acceptor ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Interface Engineering ◽  
Charge Collection Efficiency ◽  
Quantum Dot Solar Cells ◽  
Doped Zno ◽  
Pbs Quantum Dot ◽  
Mg Doped

In Mg-doped ZnO/PbS QDHSCs, a spike structure is formed between the QDs and the “electron acceptor”, which improved charge collection efficiency.

Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy: Their Impact on the Degraded Charge Collection Efficiency

2012 ◽  
Vol 717-720 ◽  
pp. 267-270
Author(s):  
Naoya Iwamoto ◽  
Atsushi Koizumi ◽  
Shinobu Onoda ◽  
Takahiro Makino ◽  
Takeshi Ohshima ◽  
...  
Keyword(s):  
Alpha Particle ◽  
Deep Level ◽  
Collection Efficiency ◽  
High Energy ◽  
Electron Trap ◽  
Charge Collection ◽  
High Energy Electron ◽  
Charge Collection Efficiency ◽  
Induced Charge ◽  
Transient Spectroscopy

Defects in electron-irradiated 6H-SiC diodes have been studied by single alpha particle induced charge transient spectroscopy and deep level transient spectroscopy (DLTS) in order to identify critical defects responsible for the charge collection efficiency (CCE) decreased by high-energy electron irradiation. The defect X2 detected by the charge transient spectroscopy and the electron trap Ei detected by the DLTS had a similar activation energy of around 0.50 eV. In addition, the annealing at 200oC completely removed defects X2 and Ei, and restored the CCE. The defect X2 is attributed to the electron trap Ei, and responsible for the decreased CCE.

3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency

2013 ◽  
Vol 8 (03) ◽  
pp. C03023-C03023 ◽  
Author(s):  
M Jakubek ◽  
J Jakubek ◽  
J Zemlicka ◽  
M Platkevic ◽  
V Havranek ◽  
...  
Keyword(s):  
Radiation Damage ◽  
3D Imaging ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Spatial Mapping ◽  
Charge Collection Efficiency ◽  
Silicon Sensor

Comparative Studies of Ionizing Radiation Detectors Made on the Basis of Various Types of Diamond Plates

2021 ◽  
Vol 23 (2) ◽  
pp. 68-75
Author(s):  
Altukhov A.A. ◽  
Keyword(s):  
Ionizing Radiation ◽  
Single Crystal ◽  
Comparative Studies ◽  
Collection Efficiency ◽  
Radiation Detectors ◽  
Charge Collection ◽  
Alpha Radiation ◽  
Charge Collection Efficiency ◽  
Polarization Phenomena

The results of experiments on the study of polarization phenomena and the charge collection efficiency in test structures of diamond ionizing radiation detectors using diamond plates of various types, including single-crystal NRNT-type, single-crystal CVD-type, as well as polycrystalline type, when exposed to alpha-radiation with an energy of 5.5 MeV are presented. Studies have demonstrated the existence of a number of problems with the device quality of diamond plates that affect the performance of spec-trometric-type detectors.

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