Detection of Oxygen on Silicon Surfaces by Time-of-Flight Type Electron-Stimulated Desorption Spectroscopy.

Shinku ◽  
1995 ◽  
Vol 38 (3) ◽  
pp. 418-420
Author(s):  
Kazuyuki UEDA ◽  
Kohji MURANO
Keyword(s):  
Time Of Flight ◽  
Silicon Surfaces ◽  
Electron Stimulated Desorption

Time-of-Flight Mass Spectrometer for Investigating Hydrogen Isotope Interactions; H/D Exhange Rates at Stainless Steel and Silicon Surfaces

1988 ◽  
Vol 14 (2P2B) ◽  
pp. 1026-1035 ◽  
Author(s):  
J. T. Gill ◽  
D. B. Watkins ◽  
J. N. Rigano ◽  
W. A. Clift ◽  
R. A. Watkins ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Mass Spectrometer ◽  
Hydrogen Isotope ◽  
Time Of Flight ◽  
Silicon Surfaces ◽  
Flight Mass Spectrometer

scholarly journals Electron-stimulated desorption study by time-of-flight measurement of H+ from W(100) surface.

Shinku ◽  
1989 ◽  
Vol 32 (3) ◽  
pp. 184-187 ◽  
Author(s):  
Etsuro IKEDA ◽  
Kyoko TAKEUCHI ◽  
Ichiro ARAKAWA
Keyword(s):  
Time Of Flight ◽  
Flight Measurement ◽  
Desorption Study ◽  
Electron Stimulated Desorption

Two-Dimensional Hydrogen Analysis by Time-of-Flight-Type Electron-Stimulated Desorption Spectroscopy

1997 ◽  
Vol 36 (Part 2, No. 9A/B) ◽  
pp. L1254-L1256 ◽  
Author(s):  
Kazuyuki Ueda ◽  
Ken'ichi Ishikawa ◽  
Masamichi Yoshimura
Keyword(s):  
Time Of Flight ◽  
Two Dimensional ◽  
Hydrogen Analysis ◽  
Electron Stimulated Desorption
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