Failure Mechanisms of Contact Vias in Organic Light Emitting Diode Displays
Keyword(s):
Ion Beam
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Abstract A new via interconnect failure mode found in organic light emitting diode (OLED) displays has been documented. Physical appearance, electrical performance, response to environmental stresses and root cause analyses have been studied using both simplistic and sophisticated failure analysis tools including focused ion beam etching and time of flight secondary ion mass spectroscopy (TOF-SIMS).
2005 ◽
Vol 6
(1)
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pp. 97-102
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2010 ◽
Vol 204
(18-19)
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pp. 3096-3099
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2007 ◽
Vol 201
(9-11)
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pp. 5358-5362
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2012 ◽
Vol 132
(2)
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pp. 77-80
Keyword(s):
Keyword(s):
2010 ◽