Effectiveness of Non Destructive Physical Analysis Method Using X-ray CT Imaging

2009 ◽  
Author(s):  
Akira Mizoguchi ◽  
Koichiro Takeuchi
Keyword(s):  
Ct Images ◽  
Physical Analysis ◽  
Nondestructive Analysis ◽  
X Ray ◽  
Destructive Analysis ◽  
X Ray Computed ◽  
Analytical Result ◽  
Test Use ◽  
Non Destructive

Abstract Now we are attempting to apply non destructive analysis from evaluation tests or failure analysis to acceptance tests or production tests. Needless to say non destructive analysis has an advantage of conserving the state of samples and the reducing the time of analysis as compared to conventional methods with destructive physical analysis. Moreover, we are paying attention to the following reasons for nondestructive physical analysis. It is difficult to keep the reproducibility of the analysis because of the high skill level required for destructive physical analysis. On the other hand, high reproducibility can be easily achieved by fixing the condition or parameters of the device during nondestructive analysis when performed by tools like X-ray. Moreover, we expect that neither the analytical result nor the quality of the nondestructive analysis depends upon the worker's capability. In this paper we will discuss the following two items from the viewpoint of quality assurance. 1. The method of the screening for fake parts (1) The procedure flow for the production discontinued parts (2) The comparison and examination between the diagnostic using X-ray computed tomography (X-ray CT) images and various examinations (3) Other observation cases using X-ray CT images 2. Effectiveness and consideration in reliability evaluation test using X-ray CT image (1) Comparison of observation cases with a variety of jointing points in parts (2) Consideration of application of nondestructive observation technique in reliability test Use of X-ray CT images is effective in diagnosing the quality of the product or the process. Moreover, we find that use of X-ray CT images is effective for the improvement of the reproducibility of the evaluation examination. Then we find that use of X-ray CT images can reduce the time of evaluation examination too.

scholarly journals Ancient basketry on the inside: X-ray computed microtomography for the non-destructive assessment of small archaeological monocotyledonous fragments: examples from Southeast Europe

2021 ◽  
Vol 9 (1) ◽  
Author(s):  
Mila Andonova
Keyword(s):  
Archaeological Sites ◽  
Potential Range ◽  
Southeast Europe ◽  
Ray Method ◽  
X Ray ◽  
Non Invasive ◽  
Destructive Analysis ◽  
Computed Microtomography ◽  
X Ray Computed ◽  
Non Destructive

AbstractThis study proposes non-destructive assessment instrumentation, the X-ray MicroCT scanning, to evaluate archaeological basketry remains prior to any destructive analysis. Three case studies are originating from two archaeological sites in Southeast Europe, with three different stages of preservation (poor, sufficient and very good). In addition, there are two preservation modes—charring and desiccation—along with two conservation situations: treated and untreated with conservation agent fragments. The three different scenarios were chosen to explore the potential range of X-ray MicroCT scanning technology when applied to monocotyledonous small-sized archaeological remains. It was proved that this non-invasive X-ray method is particularly suitable for the often-disadvantaged ancient basketry remains.

Application to Non Destructive Physical Analysis Method Using X-ray CT Imaging

2010 ◽  
Author(s):  
Akira Mizoguchi ◽  
Minoru Sugawara ◽  
Masahide Nakamura ◽  
Koichiro Takeuchi
Keyword(s):  
Failure Analysis ◽  
Three Dimensional ◽  
Ct Imaging ◽  
Temperature Cycling ◽  
Physical Analysis ◽  
Printed Wiring Boards ◽  
X Ray ◽  
X Ray Imaging ◽  
X Ray Computed ◽  
Non Destructive

Abstract We have been paying attention to the development of the nondestructive physical analysis (NDPA) technology. We think that NDPA is a technology which doesn't depend on the worker's capability or experience. There are many NDPA techniques, and analysis using X-ray imaging is one of the principal techniques. Due to the progress of the image analysis using computers in recent years, X-ray imaging have been evolving from two dimensional images to three dimensional imaging. We have been applying X-ray CT imaging to actual failure analysis and reliability evaluation since 2008. At ISTFA 2009, we reported on the effectiveness of X-ray Computed Tomography (CT) images in the failure analysis. [1] We confirmed that the X-ray CT image had various applications, for example, screening for counterfeit parts, the detection of the defect of the multi-layers printed wiring boards (multi-layers PWB), the structure confirmation of caulking contacts, and the detection of cracks or voids of the solder joint. This paper discusses the effectiveness of X-ray CT imaging in failure analysis and discusses the effectiveness of applying X-ray CT imaging to the propagation of cracks occurring at solder joints during temperature cycling test.

Non-Destructive Analysis of Thin III-V Epitaxial Layers Using a Tabletop Double Crystal X-Ray Diffractometer

1990 ◽  
Vol 208 ◽  
Author(s):  
R. N. Sacks
Keyword(s):  
Epitaxial Layers ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Glancing Angle ◽  
Destructive Analysis ◽  
Excellent Method ◽  
Commercial Software Package ◽  
Non Destructive

ABSTRACTSome of today's most promising and interesting semiconductor devices use only a few thin epitaxial layers of III-V materials, where each layer may be only 100 to 1,000A thick. There is a need for fast, accurate, non-destructive analysis techniques for these structures. Double-crystal x-ray diffraction has proven to be an excellent method for measuring composition, thickness, interface sharpness, and overall crystalline quality of III-V heterostructures. Data is presented on the use of a Bede QC1 automated table-top double-crystal diffractometer for the analysis of (AI,Ga)As, (ln,Ga)As, and GaAs epitaxial layers grown by Molecular Beam Epitaxy (MBE). It is shown that this technique can directly detect and analyze single layers of (In,Ga)As as thin as 200A, and in some cases, can indirectly detect layers of GaAs or (AI,Ga)As as thin as 100A without unusual measures such as glancing angle diffraction. The rocking curve results are compared with values predicted by RHEED intensity oscillation measurements, and with computer simulations using a commercial software package.

X-ray computed tomography for non-destructive analysis of early Medieval swords

2016 ◽  
Vol 61 (2) ◽  
pp. 86-101 ◽  
Author(s):  
Jörg Stelzner ◽  
Florian Gauß ◽  
Philipp Schuetz
Keyword(s):  
Computed Tomography ◽  
Early Medieval ◽  
X Ray ◽  
Destructive Analysis ◽  
X Ray Computed ◽  
Non Destructive

Sparsity driven deterministic sampling strategy for coded aperture X-ray Computed Tomography

2021 ◽  
Author(s):  
MUNNU SONKAR ◽  
Pradip Sasmal ◽  
Prasad Theeda ◽  
C S Sastry
Keyword(s):  
Computed Tomography ◽  
Sampling Strategy ◽  
Ct Images ◽  
Coded Aperture ◽  
Signal Recovery ◽  
X Ray ◽  
Deterministic Sampling ◽  
X Ray Computed ◽  
Unit Norm

Abstract The subsampling strategies in X-ray Computed Tomography (CT) gained importance due to their practical relevance. In this direction of research, also known as coded aperture X-ray computed tomography (CAXCT), both random and deterministic strategies were proposed in the literature. Of the techniques available, the ones based on Compressive Sensing (CS) recently gained more traction as CS based ideas efficiently exploit inherent duplication present in the system. The quality of the reconstructed CT images, nevertheless, depends on the sparse signal recovery properties (SRPs) of the sub-sampled Radon matrices. In the present work, we determine CAXCT deterministically in such a way that the corresponding sub-sampled Radon matrices remain close to the incoherent unit norm tight frames (IUNTFs) for better numerical behaviour. We show that this optimization, via Khatri-Rao product, leads to non-negative sparse approximation. While comparing and contrasting our method with its existing counterparts, we show that the proposed algorithm is computationally less involved. Finally, we demonstrate efficacy of the proposed deterministic sub-sampling strategy in recovering CT images both in noiseless and noisy cases.

scholarly journals Automated evaluation of the surface point quality in dimensional X-ray computed tomography

2020 ◽  
Vol 87 (2) ◽  
pp. 111-121 ◽  
Author(s):  
Andreas Michael Müller ◽  
Lorenz Butzhammer ◽  
Florian Wohlgemuth ◽  
Tino Hausotte
Keyword(s):  
Computed Tomography ◽  
Surface Point ◽  
Random Measurement Error ◽  
X Ray ◽  
Random Measurement ◽  
Automated Evaluation ◽  
Dimensional Measurements ◽  
X Ray Computed ◽  
Model Measurement

AbstractX-ray computed tomography (CT) enables dimensional measurements of numerous measurands with a single scan, including the measurement of inner structures. However, measurement artefacts complicate the applicability of the technology in some cases. This paper presents a methodology to assess the surface point quality of computed tomography measurements without the requirement of a CAD model. Measurement artefacts lowering the surface point quality can therefore automatically be detected. The correlation of quality values with the random measurement error is demonstrated. The presented method can in principle be used to weight single fit points to reduce the measurement uncertainty of CT measurements.

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