scholarly journals DETERMINATION OF IMAGE INTENSIFIER VIEW FIELD PURITY LEVEL

Author(s):  
Dmitry M. Nikulin ◽  
◽  
Valery A. Raychert ◽  

The article offers a method for determining image intensifier working view field purity. In order to solve this problem, it is suggested to automate control under view field purity by using application program package. The automatic control is supposed to get an image of working view field and carry out its further processing by computer means. It allows to determine a permissible zonal amount of points and spots, as well as sizes and locations of light and dark defects. The article presents an algo-rithm for image intensifier view field purity level control developed by the authors simplifies control by means of measuring instruments and auxiliaries provided by GOST. It shows the results of field-emission bright point defect control and the view field purity level within the working field of a pho-tocathode using a source of light.




2018 ◽  
pp. 76-84
Author(s):  
K. V. Sorokin ◽  
E. A. Sunarchina

Improvement of orbits precision is one of the most important tasks of space surveillance catalogue maintenance. The solution of this problem is directly related to an adequate consideration of the errors of the coordinate information from the measuring instruments. The article consideresd a new method for estimating the precision of measuring instruments on the catalog orbits. To carry out such analysis, in PJSC «VIMPEL» special technological program was created. Main results of a study of radar errors with orbits of space surveillance catalogue was presented. Also, the results were compared with data of measuring instrument's calibration software complex. This software complex provides determination of satellite's position with errors less than 10 m. A new dynamic model of measuring instrument errors is proposed.



1978 ◽  
Vol 21 (2) ◽  
pp. 158-163
Author(s):  
I. V. Abuladze ◽  
A. I. Belyaevskii ◽  
A. A. Dzhevdet


2000 ◽  
Vol 6 (4) ◽  
pp. 380-387 ◽  
Author(s):  
Christopher John Edgcombe ◽  
Ugo Valdrè

AbstractAn overview and new results are presented of the investigations carried out in the last 5 years on nano-sized tips by means of electron microscopy, an electron optical bench, and computation. Tungsten and, in particular, carbon nano-tips prepared by carbon contamination in a scanning electron microscope, were studied for applications as field-emission electron sources. Several features of their use are described and the results concerning the determination of some of their basic properties are reported.





Author(s):  
D. M. Sedrakian ◽  
D. A. Badalyan ◽  
L. R. Sedrakyan
Keyword(s):  


2019 ◽  
Vol 1153 ◽  
pp. 012149
Author(s):  
Reza Fauzi Iskandar ◽  
Baktiaji Bahari ◽  
Cut Vira ◽  
Faiz Auliya Ramadhan ◽  
Mochamad Roffa Firdaus ◽  
...  


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