scholarly journals Optical and Recombination Parameters of CdS1−xTex Thin Films Obtained by the CMBD Method

Coatings ◽  
2021 ◽  
Vol 12 (1) ◽  
pp. 5
Author(s):  
Takhir M. Razykov ◽  
Aleksy Patryn ◽  
Mirosław Maliński ◽  
Leszek Bychto ◽  
Bobur Ergashev ◽  
...  

This paper presents the results of the photoacoustic, SEM, and surface photovoltage experiments performed on the series of CdS1−xTex thin films. These CdS1−xTex (0 ≤ x ≤ 1) thin films were obtained on the glass substrate by the chemical molecular beam deposition (CMBD) method. The polycrystalline character of these films was revealed by SEM pictures. From the experimental optical characteristics, the optical absorption coefficient spectra of the samples and values of their energy gaps vs. their composition were determined. From the surface photovoltage characteristics, the diffusion lengths of the carriers were also determined.

2001 ◽  
Vol 121 (1-3) ◽  
pp. 1419-1420 ◽  
Author(s):  
S. Tavazzi ◽  
G. Barbarella ◽  
A. Borghesi ◽  
F. Meinardi ◽  
A. Sassella ◽  
...  

1991 ◽  
Vol 69 (3-4) ◽  
pp. 317-323 ◽  
Author(s):  
Constantinos Christofides ◽  
Andreas Mandelis ◽  
Albert Engel ◽  
Michel Bisson ◽  
Gord Harling

A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase (quadrature) photopyroelectric signal was established as the preferred measurement method, owing to its zero-background compensation capability. An extension of a photopyroelectric theoretical model was established and successfully tested in the determination of the optical absorption coefficient and the thermal diffusivity of the sample under investigation. Instrumental sensitivity limits of βt ≈ 5 × 10−3 were demonstrated.


1995 ◽  
Vol 34 (Part 1, No. 7B) ◽  
pp. 3884-3888 ◽  
Author(s):  
Takayoshi Hayashi ◽  
Tohru Maruno ◽  
Akira Yamashita ◽  
Stefan Fölsch ◽  
Hirohisa Kanbara ◽  
...  

2000 ◽  
Vol 111-112 ◽  
pp. 99-103
Author(s):  
S Blumstengel ◽  
A Sassella ◽  
A Filippini ◽  
M Gurioli ◽  
W Porzio ◽  
...  

1990 ◽  
Vol 8 (6) ◽  
pp. 3934-3937 ◽  
Author(s):  
C. H. Hale ◽  
I. T. Muirhead ◽  
S. P. Fisher ◽  
J. S. Orr ◽  
J. G. H. Mathew ◽  
...  

1983 ◽  
Vol 2 (6) ◽  
pp. 1798-1802 ◽  
Author(s):  
K. Masumoto ◽  
N. Koguchi ◽  
S. Takahashi

Author(s):  
Chengzhi Cai ◽  
Martin Bösch ◽  
Christian Bosshard ◽  
Bert Müller ◽  
Ye Tao ◽  
...  

2019 ◽  
Vol 55 (6) ◽  
pp. 376-379
Author(s):  
T. M. Razykov ◽  
A. Kh. Shukurov ◽  
K. M. Kuchkarov ◽  
B. A. Ergashev ◽  
R. R. Khurramov ◽  
...  

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