scholarly journals Synthesis of Boron-Doped Silicon Film Using Hot Wire Chemical Vapor Deposition Technique

Crystals ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 237
Author(s):  
M. Abul Hossion ◽  
B. M. Arora

Boron-doped polycrystalline silicon film was synthesized using hot wire chemical vapor deposition technique for possible application in photonics devices. To investigate the effect of substrate, we considered Si/SiO2, glass/ITO/TiO2, Al2O3, and nickel tungsten alloy strip for the growth of polycrystalline silicon films. Scanning electron microscopy, optical reflectance, optical transmittance, X-ray diffraction, and I-V measurements were used to characterize the silicon films. The resistivity of the film was 1.3 × 10−2 Ω-cm for the polycrystalline silicon film, which was suitable for using as a window layer in a solar cell. These films have potential uses in making photodiode and photosensing devices.

2005 ◽  
Vol 862 ◽  
Author(s):  
A. R. Middya ◽  
J-J. Liang ◽  
K. Ghosh

AbstractIn this work, we report on next-generation hot wire chemical vapor deposition technique, we call it ceramics hot-wire CVD. Using a new concept of rectangular ceramics filament holder and “confinement of thermal radiation from the filament”, a “new form” of polycrystalline silicon thin films has been developed at low temperature (˜ 250°C). The grains are found to be symmetrically distributed in array along the parallel lines, in (111) direction. On the surface of individual grains, “five-fold” and “six-fold” symmetries have been observed and we suspect that we developed “buckyball” type “giant silicon molecular solids” with different crystalline silicon lattice other than standard single-crystal silicon structure. We observed rarely found “icosaderal” symmetry in silicon thin films. This hypothesis has been supported by multiple Raman active transverse optical modes and the crystallographic structure analyzed by X-ray diffraction.


1998 ◽  
Vol 507 ◽  
Author(s):  
Qi Wang ◽  
Eugene Iwaniczko ◽  
A. H. Mahan ◽  
D. L. Williamson

ABSTRACTWe describe a series of microcrystalline (μc) silicon n-i-p solar cell devices fabricated entirely by the hot-wire chemical vapor deposition technique. These devices are deposited on flat stainless-steel at a substrate temperature below 250°C, and are evaluated using solar-cell performance and quantum-efficiency (QE) measurements. We explore the effect of crystallite size, as examined by X-ray diffraction, by varying the hydrogen-to-silane ratio from 5 to 40, while keeping the μc-n and the μc-p layers the same. We find a significant blue shift of the QE peak and an enhancement of red response compared with a standard a-Si:H solar cell. The blue shift increases with increasing hydrogen-to-silane ratio. We attribute this shift to the i-layer becoming more n-type with increasing hydrogen dilution. We also use a hydrogen gas purifier and find a large improvement in device performance.


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