scholarly journals Drug-Drug Interaction Extraction via Recurrent Hybrid Convolutional Neural Networks with an Improved Focal Loss

Entropy ◽  
2019 ◽  
Vol 21 (1) ◽  
pp. 37 ◽  
Author(s):  
Xia Sun ◽  
Ke Dong ◽  
Long Ma ◽  
Richard Sutcliffe ◽  
Feijuan He ◽  
...  

Drug-drug interactions (DDIs) may bring huge health risks and dangerous effects to a patient’s body when taking two or more drugs at the same time or within a certain period of time. Therefore, the automatic extraction of unknown DDIs has great potential for the development of pharmaceutical agents and the safety of drug use. In this article, we propose a novel recurrent hybrid convolutional neural network (RHCNN) for DDI extraction from biomedical literature. In the embedding layer, the texts mentioning two entities are represented as a sequence of semantic embeddings and position embeddings. In particular, the complete semantic embedding is obtained by the information fusion between a word embedding and its contextual information which is learnt by recurrent structure. After that, the hybrid convolutional neural network is employed to learn the sentence-level features which consist of the local context features from consecutive words and the dependency features between separated words for DDI extraction. Lastly but most significantly, in order to make up for the defects of the traditional cross-entropy loss function when dealing with class imbalanced data, we apply an improved focal loss function to mitigate against this problem when using the DDIExtraction 2013 dataset. In our experiments, we achieve DDI automatic extraction with a micro F-score of 75.48% on the DDIExtraction 2013 dataset, outperforming the state-of-the-art approach by 2.49%.

Sensors ◽  
2021 ◽  
Vol 21 (15) ◽  
pp. 5137
Author(s):  
Elham Eslami ◽  
Hae-Bum Yun

Automated pavement distress recognition is a key step in smart infrastructure assessment. Advances in deep learning and computer vision have improved the automated recognition of pavement distresses in road surface images. This task remains challenging due to the high variation of defects in shapes and sizes, demanding a better incorporation of contextual information into deep networks. In this paper, we show that an attention-based multi-scale convolutional neural network (A+MCNN) improves the automated classification of common distress and non-distress objects in pavement images by (i) encoding contextual information through multi-scale input tiles and (ii) employing a mid-fusion approach with an attention module for heterogeneous image contexts from different input scales. A+MCNN is trained and tested with four distress classes (crack, crack seal, patch, pothole), five non-distress classes (joint, marker, manhole cover, curbing, shoulder), and two pavement classes (asphalt, concrete). A+MCNN is compared with four deep classifiers that are widely used in transportation applications and a generic CNN classifier (as the control model). The results show that A+MCNN consistently outperforms the baselines by 1∼26% on average in terms of the F-score. A comprehensive discussion is also presented regarding how these classifiers perform differently on different road objects, which has been rarely addressed in the existing literature.


Electronics ◽  
2021 ◽  
Vol 10 (22) ◽  
pp. 2868
Author(s):  
Wenxuan Zhao ◽  
Yaqin Zhao ◽  
Liqi Feng ◽  
Jiaxi Tang

The purpose of image dehazing is the reduction of the image degradation caused by suspended particles for supporting high-level visual tasks. Besides the atmospheric scattering model, convolutional neural network (CNN) has been used for image dehazing. However, the existing image dehazing algorithms are limited in face of unevenly distributed haze and dense haze in real-world scenes. In this paper, we propose a novel end-to-end convolutional neural network called attention enhanced serial Unet++ dehazing network (AESUnet) for single image dehazing. We attempt to build a serial Unet++ structure that adopts a serial strategy of two pruned Unet++ blocks based on residual connection. Compared with the simple Encoder–Decoder structure, the serial Unet++ module can better use the features extracted by encoders and promote contextual information fusion in different resolutions. In addition, we take some improvement measures to the Unet++ module, such as pruning, introducing the convolutional module with ResNet structure, and a residual learning strategy. Thus, the serial Unet++ module can generate more realistic images with less color distortion. Furthermore, following the serial Unet++ blocks, an attention mechanism is introduced to pay different attention to haze regions with different concentrations by learning weights in the spatial domain and channel domain. Experiments are conducted on two representative datasets: the large-scale synthetic dataset RESIDE and the small-scale real-world datasets I-HAZY and O-HAZY. The experimental results show that the proposed dehazing network is not only comparable to state-of-the-art methods for the RESIDE synthetic datasets, but also surpasses them by a very large margin for the I-HAZY and O-HAZY real-world dataset.


2021 ◽  
Author(s):  
Muhammad Shahroz Nadeem ◽  
Sibt Hussain ◽  
Fatih Kurugollu

This paper solves the textual deblurring problem, In this paper we propose a new loss function, we provide empirical evaluation of the design choices based on which a memory friendly CNN model is proposed, that performs better then the state of the art CNN method.


Author(s):  
Uzma Batool ◽  
Mohd Ibrahim Shapiai ◽  
Nordinah Ismail ◽  
Hilman Fauzi ◽  
Syahrizal Salleh

Silicon wafer defect data collected from fabrication facilities is intrinsically imbalanced because of the variable frequencies of defect types. Frequently occurring types will have more influence on the classification predictions if a model gets trained on such skewed data. A fair classifier for such imbalanced data requires a mechanism to deal with type imbalance in order to avoid biased results. This study has proposed a convolutional neural network for wafer map defect classification, employing oversampling as an imbalance addressing technique. To have an equal participation of all classes in the classifier’s training, data augmentation has been employed, generating more samples in minor classes. The proposed deep learning method has been evaluated on a real wafer map defect dataset and its classification results on the test set returned a 97.91% accuracy. The results were compared with another deep learning based auto-encoder model demonstrating the proposed method, a potential approach for silicon wafer defect classification that needs to be investigated further for its robustness.


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