scholarly journals Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction

Materials ◽  
2020 ◽  
Vol 13 (15) ◽  
pp. 3338
Author(s):  
Thomas W. Cornelius ◽  
Cristian Mocuta ◽  
Stéphanie Escoubas ◽  
Luiz R. M. Lima ◽  
Eudes B. Araújo ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Fields ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ac Electric Fields ◽  
Zirconate Titanate

The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz.

In-situ X-ray studies of phase transformations in lead zirconate titanate thin films during annealing

1995 ◽  
Vol 268 (1-2) ◽  
pp. 102-107 ◽  
Author(s):  
P. Aungkavattana ◽  
B. Haartz ◽  
C.O. Ruud ◽  
S. Trolier-McKinstry
Keyword(s):  
Thin Films ◽  
Phase Transformations ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray ◽  
Zirconate Titanate

scholarly journals In situ X-ray diffraction of lead zirconate titanate piezoMEMS cantilever during actuation

2016 ◽  
Vol 111 ◽  
pp. 429-434 ◽  
Author(s):  
Giovanni Esteves ◽  
Chris M. Fancher ◽  
Margeaux Wallace ◽  
Raegan Johnson-Wilke ◽  
Rudeger H.T. Wilke ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate

Dielectric and Piezoelectric Properties of Praseodymium Modified Lead Zirconate Titanate Ceramics

2007 ◽  
Vol 280-283 ◽  
pp. 211-214 ◽  
Author(s):  
Hua Zhou ◽  
Qingchi Sun ◽  
Cuimin Lu
Keyword(s):  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Molar Fraction ◽  
Solid State Reaction Method ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Titanate Ceramics ◽  
Dielectric And Piezoelectric Properties

Praseodymium (Pr) modified lead zirconate titanate ceramics (Pb1-1.5xPrx (ZryTi1-y) O3 with x = 0.02, 0.04, 0.06, 0.08 and y = 0.51, 0.52, 0.54, 0.56, 0.58, 0.60) were prepared by the high temperature solid-state reaction method. X-ray diffraction (XRD) results show that the morphotropic phase boundary (MPB) of Pb0.955Pr0.03(ZryTi1-y)O3 (PPZT1) is located in the area where the molar fraction of Zr is near 55%, when the molar fraction of Zr is 54% and the sintering temperature is 1240°C with 1h curing time, the superior piezoelectric properties of compositions of PPZT1 system were optimized, a set of d33 = 420 pC/N; eT 33/e0 = 2,000; Tc = 314°C; Qm = 76; tand = 2% and kp = 0.53. On the other hand, Pb1-1.5xPrx(Zr0.54Ti0.46)O3 (PPZT2) is far from MPB and their compositions are all in tetragonal phase.

scholarly journals Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction

Materials ◽  
2021 ◽  
Vol 14 (16) ◽  
pp. 4500
Author(s):  
Kien Nguyen ◽  
Ewen Bellec ◽  
Edoardo Zatterin ◽  
Gwenael Le Rhun ◽  
Patrice Gergaud ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Ferroelectric Thin Film ◽  
Aging Effect ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Structure ◽  
Electrical Aging

Electrical aging in lead zirconate titanate (PbZrxTi1−xO3) thin films has been intensively studied from a macroscopic perspective. However, structural origins and consequences of such degradation are less documented. In this study, we have used synchrotron radiation to evaluate the behavior of ferroelectric domains by X-ray diffraction (XRD). The sample was loaded with an AC triangular bias waveform between ±10 V with a number of cycle varying from one up to 108. At each step of the aging procedure, XRD spectra had been collected in situ during the application of an electric field on a capacitor. The fine analysis of the (200) pseudo-cubic peak structure allows to separate the evolution of the volume of a/c tetragonal and rhombohedral domains along the electrical biasing. Throughout the aging, both intrinsic and extrinsic responses of tetra and rhombohedral domains are altered, the behavior depending on the observed phase. This methodology opens up new perspectives in the comprehension of the aging effect in ferroelectric thin film.

A Study on the Microstructure of Preferred Orientation of Lead Zirconate Titanate (PZT) Thin Films

1997 ◽  
Vol 12 (4) ◽  
pp. 1043-1047 ◽  
Author(s):  
Chang Jung Kim ◽  
Dae Sung Yoon ◽  
Joon Sung Lee ◽  
Chaun Gi Choi ◽  
Kwangsoo No
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Preferred Orientation ◽  
X Ray Diffraction ◽  
Pzt Thin Films ◽  
X Ray ◽  
Zirconate Titanate

The lead zirconate titanate (PZT) thin films were fabricated using sol-gel spin coating onto Pt/Ti/glass substrates. Effects of the holding time for pyrolysis and the coating cycle on the preferred orientation of the PZT thin films were studied. The films were fabricated with different coating cycles (3, 5, 7, 9, 11), dried at 330 °C for different holding times (5, 30, 60 min), and then annealed at the same temperature of 650 °C using rapid thermal annealing (RTA). The preferred orientations of the films were investigated using x-ray diffraction and glancing angle x-ray diffraction. The microstructure and the selected area diffraction pattern of the PZT thin films were also investigated using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), respectively.

Contribution from Ferroelastic Domain Switching Detected Using X-ray Diffraction toR-Curves in Lead Zirconate Titanate Ceramics

2001 ◽  
Vol 84 (12) ◽  
pp. 2921-2929 ◽  
Author(s):  
Alexandre E. Glazounov ◽  
Hans Kungl ◽  
Jan-Thorsten Reszat ◽  
Michael J. Hoffmann ◽  
Arnd Kolleck ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Domain Switching ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Titanate Ceramics

Piezoelectric properties of a near strain-free lead zirconate titanate thin films deposited on a Si substrate

2019 ◽  
Vol 239 ◽  
pp. 71-74 ◽  
Author(s):  
Tomoya Ohno ◽  
Kentaroh Fukumitsu ◽  
Takamasa Honda ◽  
Akinori Sakamoto ◽  
Sadaaki Tanaka ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
Si Substrate ◽  
Zirconate Titanate

Lead Zirconate-Titanate Thin Films Prepared by the Laser Ablation Technique

1990 ◽  
Vol 200 ◽  
Author(s):  
C. K. Chiang ◽  
L. P. Cook ◽  
P. K. Schenck ◽  
P. S. Brody ◽  
J. M. Benedetto
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray ◽  
Ablation Technique ◽  
Zirconate Titanate ◽  
Deposited Films ◽  
Plate Type ◽  
Laser Ablation Technique

ABSTRACTLead zirconate-titanate (PZT) thin films were prepared by the laser ablation technique. The PZT (Zr/Ti=53/47) target was irradiated using a focused q-switched Nd:YAG laser (15 ns, 100 mJ at 1.064 μ;m). The as-deposited films were amorphous as indicated by X-ray powder patterns, but crystallized readily with brief annealing above 650°C. The dielectric constant and the resistivity of the crystallized films were studied using a parallel-plate type capacitor structure.

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