scholarly journals Bit Error Rate Closed-Form Expressions for LoRa Systems under Nakagami and Rice Fading Channels

Sensors ◽  
2019 ◽  
Vol 19 (20) ◽  
pp. 4412
Author(s):  
Claudio Ferreira Dias ◽  
Eduardo Rodrigues de Lima ◽  
Gustavo Fraidenraich

We derive exact closed-form expressions for Long Range (LoRa) bit error probability and diversity order for channels subject to Nakagami-m, Rayleigh and Rician fading. Analytical expressions are compared with numerical results, showing the accuracy of our proposed exact expressions. In the limiting case of the Nakagami and Rice parameters, our bit error probability expressions specialize into the non-fading case.

Author(s):  
Dennis Lara Hernandez ◽  
Efren Ona Proano ◽  
Henry Carvajal Mora ◽  
Nathaly Orozco Garzon ◽  
Celso Iwata Frison

2020 ◽  
Vol 2020 ◽  
pp. 1-8
Author(s):  
Jingke Dai

The bit-error-rate expressions of nonsystematic Raptor (NR) codes and systematic Raptor (SR) codes over Rician fading channels are first derived using a Gaussian approximation (GA) approach. These BER expressions provide a significant reduction in computational complexity for analyzing system performance when compared with simulation and discretized density evolution (DDE). As shown by the asymptotic analysis, the NR codes originally designed for binary erasure channels still have good performance on Rician fading channels but SR codes do not. Therefore, the degree distributions of SR codes are specifically optimized on Rician channels which are superior to the existing SR codes and comparable to NR codes.


2018 ◽  
Vol 2018 ◽  
pp. 1-10
Author(s):  
Youngpil Kim ◽  
Hyunchan Park ◽  
Cheol-Ho Hong ◽  
Chuck Yoo

Solid-state drive (SSD) becomes popular as the main storage device. However, over time, the reliability of SSD degrades due to bit errors, which poses a serious issue. The periodic remapping (PR) has been suggested to overcome the issue, but it still has a critical weakness as PR increases lifetime loss. Therefore, we propose the conditional remapping invocation method (CRIM) to sustain reliability without lifetime loss. CRIM uses a probability-based threshold to determine the condition of invoking remapping operation. We evaluate the effectiveness of CRIM using the real workload trace data. In our experiments, we show that CRIM can extend a lifetime of SSD more than PR by up to 12.6% to 17.9% of 5-year warranty time. In addition, we show that CRIM can reduce the bit error probability of SSD by up to 73 times in terms of typical bit error rate in comparison with PR.


ETRI Journal ◽  
2010 ◽  
Vol 32 (3) ◽  
pp. 464-467 ◽  
Author(s):  
Vladeta Vasilije Milenkovic ◽  
Nikola Milos Sekulovic ◽  
Mihajlo Caslav Stefanovic ◽  
Mile Branko Petrovic

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