scholarly journals Production and Detection of Light Dark Matter at Jefferson Lab: The BDX Experiment

Universe ◽  
2019 ◽  
Vol 5 (5) ◽  
pp. 120 ◽  
Author(s):  
Marzio De Napoli
Keyword(s):  
Dark Matter ◽  
Electron Beam ◽  
Beam Current ◽  
Mass Region ◽  
Thick Target ◽  
Electromagnetic Calorimeter ◽  
Beam Dump ◽  
Jefferson Lab ◽  
Target Experiment ◽  
Main Components

The Beam Dump eXperiment (BDX) is a an electron-beam thick-target experiment aimed to investigate the existence of light Dark Matter particles in the MeV-GeV mass region at Jefferson Lab. The experiment will make use of a 10.6 GeV high-intensity electron-beam impinging on the Hall-A beam-dump to produce the Dark Matter particles ( χ ) through the Dark Photon portal. The BDX detector located at ∼20 m from the dump consists of two main components: an electromagnetic calorimeter to detect the signals produced by the χ -electron scattering and a veto system to reject background. The expected signature of the DM (Dark Matter) interaction in the Ecal (Electromagnetic calorimeter) is a ∼GeV electromagnetic shower paired with a null activity in the surrounding active veto counters. Collecting 10 22 electrons on target in 285 days of parasitic run at 65 μ A of beam current, and with an expected background of O(5) counts, in the case of a null discovery, BDX will be able to lower the exclusion limits by one to two orders of magnitude in the parameter space of dark-matter coupling versus mass. This paper describes the experiment and presents a summary of the most significant results achieved thus far, which led to the recent approval of the experiment by JLab-PAC46.

scholarly journals New electron beam-dump experiments to search for MeV to few-GeV dark matter

2013 ◽  
Vol 88 (11) ◽  
Author(s):  
Eder Izaguirre ◽  
Gordan Krnjaic ◽  
Philip Schuster ◽  
Natalia Toro
Keyword(s):  
Dark Matter ◽  
Electron Beam ◽  
Beam Dump

scholarly journals Beam Purity for Light Dark Matter Search in Beam Dump Experiments

2015 ◽  
Vol 2015 ◽  
pp. 1-6 ◽  
Author(s):  
D. Banerjee ◽  
P. Crivelli ◽  
A. Rubbia
Keyword(s):  
Dark Matter ◽  
Electron Beam ◽  
Beam Line ◽  
Test Beam ◽  
Dark Matter Search ◽  
Beam Dump ◽  
Background Rejection ◽  
Unexplored Area ◽  
Simulation Results

This paper reviews the search for light dark matter in beam dump experiments with a special emphasis on the necessity of beam purity for precise background rejection at the sensitivities aimed at these experiments. As a case study we cite the P348 experiment which has test beam time in Fall 2015 at the SPS H4 beam line at CERN and aims to search for theU′(1)gauge boson,A′, which as per one model of dark matter mediates a weak interaction between ordinary matter and dark matter via mixing of these “dark photons” with ordinary photon. The experiment aims to probe the still unexplored area of mixing strength10-5≤ϵ≤10-3and massesMA′≤100 MeV by using 10–300 GeV electron beam from the CERN SPS. This paper presents the simulation results for rejection of background due to beam impurity, by tracking the incoming particles with Micromegas detectors at a level <10-10.

A controller for safe, convenient operation of LaB6 emitters on electron-beam instruments

1983 ◽  
Vol 41 ◽  
pp. 408-409
Author(s):  
W. J. Abramson ◽  
H. W. Estry ◽  
L. F. Allard
Keyword(s):  
Electron Beam ◽  
Control System ◽  
Thermal Shock ◽  
Appropriate Care ◽  
Electron Guns ◽  
Tungsten Filaments ◽  
Order Of Magnitude ◽  
Main Components

LaB6 emitters are becoming increasingly popular as direct replacements for tungsten filaments in the electron guns of modern electron-beam instruments. These emitters offer order of magnitude increases in beam brightness, and, with appropriate care in operation, a corresponding increase in source lifetime. They are, however, an order of magnitude more expensive, and may be easily damaged (by improper vacuum conditions and thermal shock) during saturation/desaturation operations. These operations typically require several minutes of an operator's attention, which becomes tedious and subject to error, particularly since the emitter must be cooled during sample exchanges to minimize damage from random vacuum excursions. We have designed a control system for LaBg emitters which relieves the operator of the necessity for manually controlling the emitter power, minimizes the danger of accidental improper operation, and makes the use of these emitters routine on multi-user instruments.Figure 1 is a block schematic of the main components of the control system, and Figure 2 shows the control box.

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