Non-contact local conductivity measurement of metallic nanowires based on semi-near-field reflection of microwave atomic force microscopy

2021 ◽  
Author(s):  
Bo Tong ◽  
Tahakiro Hirabayashi ◽  
Yuhki Toku ◽  
Yasuyuki Morita ◽  
Yang Ju
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Conductivity Measurement ◽  
Metallic Nanowires ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Conductivity

Non-contact Local Conductivity Measurement of Metallic Nanowires Based on Semi-near-field Reflection of Microwave Atomic Force Microscopy

2021 ◽  
Author(s):  
Bo Tong ◽  
Takahiro Hirabayashi ◽  
Yuhki Toku ◽  
Yasuyuki Morita ◽  
Yang Ju
Keyword(s):  
Atomic Force Microscopy ◽  
Evaluation Method ◽  
Near Field ◽  
Conductivity Measurement ◽  
Nanometer Scale ◽  
Metallic Nanowires ◽  
Contact Mode ◽  
Cu Nanowires ◽  
Force Microscopy ◽  
Atomic Force

Abstract In this study, a non-contact and quantitative evaluation method was developed to measure the conductivity of metallic nanowires with a nanometer-scale spatial resolution. A coaxial probe was experimentally fabricated; using this probe, microwave images of the Al, Ag, and Cu nanowires and their topography images were simultaneously obtained via microwave atomic force microscopy (M-AFM) in the non-contact mode. A semi-near-field reflection model was established to describe the spatial distribution of a microwave between the tip of the probe and the sample. The local conductivities of metallic nanowires on the nanometer-scale can be quantitatively evaluated in a single scan, using a metal strip substrate to calibrate the reflection signal.

scholarly journals Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

2014 ◽  
Vol 39 (16) ◽  
pp. 4800 ◽  
Author(s):  
C. H. van Hoorn ◽  
D. C. Chavan ◽  
B. Tiribilli ◽  
G. Margheri ◽  
A. J. G. Mank ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Probe

Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

2003 ◽  
Vol 97 (1-4) ◽  
pp. 81-87 ◽  
Author(s):  
Tomoyuki Yoshino ◽  
Shigeru Sugiyama ◽  
Shoji Hagiwara ◽  
Daisuke Fukushi ◽  
Motoharu Shichiri ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Nano Scale ◽  
Atomic Force

Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

2016 ◽  
Vol 55 (8S1) ◽  
pp. 08NB04 ◽  
Author(s):  
Nobuo Satoh ◽  
Kei Kobayashi ◽  
Shunji Watanabe ◽  
Toru Fujii ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Piezoelectric Cantilever ◽  
Mechanical Detection

Atomic force microscopy imaging using a tip-on-chip: Opening the door to integrated near field nanotools

2010 ◽  
Vol 81 (9) ◽  
pp. 093707 ◽  
Author(s):  
J. Hayton ◽  
J. Polesel-Maris ◽  
R. Demadrille ◽  
M. Brun ◽  
F. Thoyer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Near Field ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
On Chip
Sign in / Sign up

Export Citation Format

Share Document