Non-contact Local Conductivity Measurement of Metallic Nanowires Based on Semi-near-field Reflection of Microwave Atomic Force Microscopy

2021 ◽  
Author(s):  
Bo Tong ◽  
Takahiro Hirabayashi ◽  
Yuhki Toku ◽  
Yasuyuki Morita ◽  
Yang Ju
Keyword(s):  
Atomic Force Microscopy ◽  
Evaluation Method ◽  
Near Field ◽  
Conductivity Measurement ◽  
Nanometer Scale ◽  
Metallic Nanowires ◽  
Contact Mode ◽  
Cu Nanowires ◽  
Force Microscopy ◽  
Atomic Force

Abstract In this study, a non-contact and quantitative evaluation method was developed to measure the conductivity of metallic nanowires with a nanometer-scale spatial resolution. A coaxial probe was experimentally fabricated; using this probe, microwave images of the Al, Ag, and Cu nanowires and their topography images were simultaneously obtained via microwave atomic force microscopy (M-AFM) in the non-contact mode. A semi-near-field reflection model was established to describe the spatial distribution of a microwave between the tip of the probe and the sample. The local conductivities of metallic nanowires on the nanometer-scale can be quantitatively evaluated in a single scan, using a metal strip substrate to calibrate the reflection signal.

Atomic Force Microscopy and Related Techniques: Introduction, Instrumentation and Application to Polymeric Materials

1998 ◽  
Vol 4 (S2) ◽  
pp. 822-823
Author(s):  
Inga Holl Musselman
Keyword(s):  
Atomic Force Microscopy ◽  
Polymeric Materials ◽  
Polymer Surfaces ◽  
Nanometer Scale ◽  
Important Class ◽  
Semiconducting Materials ◽  
Contact Mode ◽  
Cantilever Deflection ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy (AFM) was introduced in 1986 by Binnig, Quate and Gerber. In this method, a sample is scanned beneath a small, sharp silicon or silicon nitride probe attached to the apex of a flexible cantilever. Cantilever deflection is measured to give height information corresponding to the sample topography. Since AFM relies on tip-sample force interaction, the technique can be applied to insulators as well as to conducting and semiconducting materials. AFM therefore extends local probe studies to an important class of materials which can be difficult to investigate by electron microscopy and spectroscopy techniques owing to problems with sample charging. Among other materials, AFM has been used extensively to characterize the morphology, roughness, nanostructure, chain packing and conformation of polymer surfaces at the nanometer scale.Early AFM studies of polymers were conducted in the contact mode and included the investigation of polymerized monolayers of n-(2-aminoethyl)-10,12-tricosadiynamide (AE-TDA) and poly(octadecylacrylate) (PODA) at submonolayer coverage.

scholarly journals Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy

Friction ◽  
2021 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Contact Friction ◽  
Measuring Instruments ◽  
Dynamic Friction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Energy ◽  
New Applications

AbstractDynamic friction occurs not only between two contact objects sliding against each other, but also between two relative sliding surfaces several nanometres apart. Many emerging micro- and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction. Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy (AFM) method driving the second order flexural and the first order torsional vibration simultaneously. The pull-in problem caused by the attractive force is avoided, and the friction dissipation can be imaged near the surface. The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves. Image contrast is enhanced in the intermediate setpoint region. The work offers an effective method for directly detecting the friction dissipation and high resolution images, which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments.

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

scholarly journals Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

2014 ◽  
Vol 39 (16) ◽  
pp. 4800 ◽  
Author(s):  
C. H. van Hoorn ◽  
D. C. Chavan ◽  
B. Tiribilli ◽  
G. Margheri ◽  
A. J. G. Mank ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Probe

Contact and non-contact mode imaging by atomic force microscopy

1996 ◽  
Vol 273 (1-2) ◽  
pp. 138-142 ◽  
Author(s):  
Seizo Morita ◽  
Satoru Fujisawa ◽  
Eigo Kishi ◽  
Masahiro Ohta ◽  
Hitoshi Ueyama ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force

Conducting Polymer nanoComposites (CPC): Nanocharacterisation of layer by layer sprayed PMMA-CNT vapour sensors by Atomic force Microscopy in current Sensing Mode (CS-AFM)

2008 ◽  
Vol 1143 ◽  
Author(s):  
Bijandra Kumar ◽  
Mickaël Castro ◽  
Jianbo Lu ◽  
Jean-François Feller
Keyword(s):  
Atomic Force Microscopy ◽  
Spray Deposition ◽  
Dynamic Mode ◽  
Layer By Layer ◽  
Initial State ◽  
Contact Mode ◽  
Current Sensing ◽  
Multi Wall Carbon Nanotubes ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTOrganic vapour sensors based on poly (methylmethacrylate)-multi-wall carbon nanotubes (PMMA-CNT) conductive polymer nanocomposite (CPC) were developed via layer by layer technique by spray deposition. CPC Sensors were exposed to three different classes of solvents (chloroform, methanol and water) and their chemo-electrical properties were followed as a function of CNTcontent in dynamic mode. Detection time was found to be shorter than that necessary for full recovery of initial state. CNT real three dimensional network has been visualized by Atomic force microscopy in a field assisted intermittent contact mode. More interestingly real conductive network system and electrical ability of CPC have been explored by current-sensing atomic force microscopy (CS-AFM). Realistic effect of voltage on electrical conductivity has been found linear.

Sign in / Sign up

Export Citation Format

Share Document