Characterization of Light Effect on Photovoltaic Property of Poly-Si Solar Cell by Using Photoconductive Atomic Force Microscopy

Characterization of Wavelength Effect on Photovoltaic Property of Poly-Si Solar Cell Using Photoconductive Atomic Force Microscopy (PC-AFM)

Transactions on Electrical and Electronic Materials ◽

10.4313/teem.2013.14.3.160 ◽

2013 ◽

Vol 14 (3) ◽

pp. 160-163 ◽

Cited By ~ 2

Author(s):

Jinhee Heo

Keyword(s):

Atomic Force Microscopy ◽

Solar Cell ◽

Photovoltaic Property ◽

Force Microscopy ◽

Atomic Force ◽

Characterization of Photoinduced Current in Poly-Si Solar Cell by Employing Photoconductive Atomic Force Microscopy (PC-AFM)

Transactions on Electrical and Electronic Materials ◽

10.4313/teem.2012.13.1.35 ◽

2012 ◽

Vol 13 (1) ◽

pp. 35-38 ◽

Cited By ~ 1

Author(s):

Jin-Hee Heo

Keyword(s):

Atomic Force Microscopy ◽

Solar Cell ◽

Force Microscopy ◽

Atomic Force ◽

Characterization of porous silicon for solar cell application by atomic force microscopy

10.1117/12.341190 ◽

1999 ◽

Author(s):

I. Simkiene ◽

Valentinas J. Snitka ◽

Kestutis Naudzius ◽

Vaidas Pacebutas ◽

Mindaugas Rackaitis

Keyword(s):

Atomic Force Microscopy ◽

Solar Cell ◽

Porous Silicon ◽

Solar Cell Application ◽

Force Microscopy ◽

Scanning probe study on the photovoltaic characteristics of a Si solar cell by using Kelvin force microscopy and photoconductive atomic force microscopy

Thin Solid Films ◽

10.1016/j.tsf.2013.04.076 ◽

2013 ◽

Vol 546 ◽

pp. 353-357 ◽

Cited By ~ 4

Author(s):

Jinhee Heo ◽

Soonho Won

Keyword(s):

Atomic Force Microscopy ◽

Solar Cell ◽

Scanning Probe ◽

Force Microscopy ◽

Atomic Force ◽

Si Solar Cell ◽

Photovoltaic Characteristics

Study on the correlation between the photovoltaic effect and the defect density at the surface of a poly-Si solar cell by using photoconductive atomic force microscopy (PC-AFM)

Journal of the Korean Physical Society ◽

10.3938/jkps.60.1322 ◽

2012 ◽

Vol 60 (9) ◽

pp. 1322-1326 ◽

Cited By ~ 3

Author(s):

Jinhee Heo ◽

Youngmok Rhyim

Keyword(s):

Atomic Force Microscopy ◽

Solar Cell ◽

Defect Density ◽

Photovoltaic Effect ◽

Force Microscopy ◽

Atomic Force ◽

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

Microscopy Research and Technique ◽

10.1002/jemt.23699 ◽

2021 ◽

Author(s):

Willian Silva Conceição ◽

Ştefan Ţălu ◽

Robert Saraiva Matos ◽

Glenda Quaresma Ramos ◽

Fidel Guereiro Zayas ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Amazon Rainforest ◽

Force Microscopy ◽

Atomic Force ◽

Dinizia Excelsa

Characterization of two- and one-dimensional water networks on Ni(111) via atomic force microscopy

Physical Review Materials ◽

10.1103/physrevmaterials.3.093001 ◽

2019 ◽

Vol 3 (9) ◽

Cited By ~ 6

Author(s):

Akitoshi Shiotari ◽

Yoshiaki Sugimoto ◽

Hiroshi Kamio

Keyword(s):

Atomic Force Microscopy ◽

Water Networks ◽

One Dimensional ◽

Force Microscopy ◽

Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

Thin Solid Films ◽

10.1016/s0040-6090(98)00453-2 ◽

1998 ◽

Vol 321 (1-2) ◽

pp. 86-91 ◽

Cited By ~ 14

Author(s):

G Wöhl ◽

C Schöllhorn ◽

O.G Schmidt ◽

K Brunner ◽

K Eberl ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Transmission Electron ◽

Self Assembled

Mechanical characterization of cellulose single nanofiber by atomic force microscopy

10.1117/12.2259856 ◽

2017 ◽

Author(s):

Lindong Zhai ◽

Jeong Woong Kim ◽

Jiyun Lee ◽

Jaehwan Kim

Keyword(s):

Atomic Force Microscopy ◽

Mechanical Characterization ◽

Force Microscopy ◽

Characterization of Electron Emission from High Density Self-Aligned Si-Based Quantum Dots by Conducting-Probe Atomic Force Microscopy

ECS Transactions ◽

10.1149/06406.0923ecst ◽

2014 ◽

Vol 64 (6) ◽

pp. 923-928 ◽

Cited By ~ 2

Author(s):

D. Takeuchi ◽

K. Makihara ◽

A. Ohta ◽

M. Ikeda ◽

S. Miyazaki

Keyword(s):

Quantum Dots ◽

Atomic Force Microscopy ◽

Electron Emission ◽

High Density ◽

Force Microscopy ◽