scholarly journals Characterization of Wavelength Effect on Photovoltaic Property of Poly-Si Solar Cell Using Photoconductive Atomic Force Microscopy (PC-AFM)

2013 ◽  
Vol 14 (3) ◽  
pp. 160-163 ◽  
Author(s):  
Jinhee Heo
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cell ◽  
Photovoltaic Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Si Solar Cell

Characterization of porous silicon for solar cell application by atomic force microscopy

1999 ◽  
Author(s):  
I. Simkiene ◽  
Valentinas J. Snitka ◽  
Kestutis Naudzius ◽  
Vaidas Pacebutas ◽  
Mindaugas Rackaitis
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cell ◽  
Porous Silicon ◽  
Solar Cell Application ◽  
Force Microscopy ◽  
Atomic Force

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa

Mechanical characterization of cellulose single nanofiber by atomic force microscopy

2017 ◽  
Author(s):  
Lindong Zhai ◽  
Jeong Woong Kim ◽  
Jiyun Lee ◽  
Jaehwan Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Mechanical Characterization ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Electron Emission from High Density Self-Aligned Si-Based Quantum Dots by Conducting-Probe Atomic Force Microscopy

2014 ◽  
Vol 64 (6) ◽  
pp. 923-928 ◽  
Author(s):  
D. Takeuchi ◽  
K. Makihara ◽  
A. Ohta ◽  
M. Ikeda ◽  
S. Miyazaki
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Electron Emission ◽  
High Density ◽  
Force Microscopy ◽  
Atomic Force
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