Basis-Material Decomposition X-ray Imaging Using Multi-layered Detectors for Industrial Applications

2021 ◽  
Vol 45 (7) ◽  
pp. 531-541
Author(s):  
Junwoo Kim ◽  
Seungjun Yoo ◽  
Jinwoo Kim ◽  
Ho Kyung Kim
Author(s):  
Xiaolan Wang ◽  
Xin He ◽  
Katsuyuki Taguchi ◽  
Bradley E. Patt ◽  
Douglas J. Wagenaar ◽  
...  

2017 ◽  
pp. 959-968
Author(s):  
Carina Stritt ◽  
Mathieu Plamondon ◽  
Jürgen Hofmann ◽  
Alexander Flisch

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Simon Zabler ◽  
Michael Maisl ◽  
Peter Hornberger ◽  
Jochen Hiller ◽  
Christian Fella ◽  
...  

AbstractAfter an incremental development which took place over four decades, X-ray imaging has become an important tool for non-destructive testing and evaluation. Computed Tomography (CT) in particular beholds the power of determining the location of flaws and inclusions (e. g. in castings and composites) in three-dimensional object coordinates. Therefore, and thanks to a speed-up of the measurement, CT is now routinely considered for in-line inspection of electronics, castings and composites. When precision and not speed is important, Micro-CT (μCT) can be employed for Dimensional Measurements (DM, e. g. quality assurance and shape verification), as well as for in situ testing, and for characterizing micro-structures in metals and composites. Using appropriate image processing and analysis μCT can determine the local fibre orientation in composites, the granular morphology of battery cathodes or the inter-connectivity of certain phases in casting alloys.Today, the large variety of X-ray instruments and methods poses an application problem which requires experience and a lot of knowledge for deciding which technique applies best to the task at hand. Application-specific guidelines exist for X-ray radiography testing (RT) only, whereas standardization has been applied to CT, unfortunately leaving out high resolution subμ CT, and nano-CT. For the latter exist an equally high number of NDT applications, however these instruments still necessitate a profound expertise. The task is to identify key industrial applications and push CT from system standardization to application specific automation.


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