Systematic determination of the thickness of a thin oxide layer on a multilayered structure by using an X-ray reflectivity analysis

2016 ◽  
Vol 69 (5) ◽  
pp. 789-792 ◽  
Author(s):  
Jisung Lee ◽  
Sungkyun Park
Keyword(s):  
Oxide Layer ◽  
Multilayered Structure ◽  
X Ray ◽  
Thin Oxide Layer ◽  
Systematic Determination ◽  
Thin Oxide

Determination of tunnelling parameters in ultra-thin oxide layer poly-Si/SiO2/Si structures

1995 ◽  
Vol 38 (8) ◽  
pp. 1465-1471 ◽  
Author(s):  
M Depas ◽  
B Vermeire ◽  
P.W Mertens ◽  
R.L Van Meirhaeghe ◽  
M.M Heyns
Keyword(s):  
Oxide Layer ◽  
Thin Oxide Layer ◽  
Thin Oxide

Further evidence for the presence of residual flaws in a thin oxide layer covering high purity aluminium

1993 ◽  
Vol 34 (12) ◽  
pp. 2099-2104 ◽  
Author(s):  
G.M. Brown ◽  
K. Shimizu ◽  
K. Kobayashi ◽  
G.E. Thompson ◽  
G.C. Wood
Keyword(s):  
Oxide Layer ◽  
High Purity ◽  
Thin Oxide Layer ◽  
Purity Aluminium ◽  
High Purity Aluminium ◽  
Thin Oxide

Mössbauer Studies of Very Thin Oxide Layer on Fe Surface

1984 ◽  
Vol 23 (Part 1, No. 3) ◽  
pp. 283-285 ◽  
Author(s):  
Teruya Shinjo ◽  
Takashi Iwasaki ◽  
Toshihiko Shigematsu ◽  
Toshio Takada
Keyword(s):  
Oxide Layer ◽  
Mössbauer Studies ◽  
Thin Oxide Layer ◽  
Thin Oxide

scholarly journals Tuning the Limiting Thickness of a Thin Oxide Layer on Al(111) with Oxygen Gas Pressure

2011 ◽  
Vol 107 (3) ◽  
Author(s):  
Na Cai ◽  
Guangwen Zhou ◽  
Kathrin Müller ◽  
David E. Starr
Keyword(s):  
Oxide Layer ◽  
Gas Pressure ◽  
Thin Oxide Layer ◽  
Oxygen Gas ◽  
Thin Oxide

Abstract: Influence of a thin oxide layer between metal and semiconductor on Schottky diode behavior

1976 ◽  
Vol 13 (4) ◽  
pp. 873-873 ◽  
Author(s):  
E. H. Nicollian ◽  
B. Schwartz ◽  
D. J. Coleman ◽  
R. M. Ryder ◽  
J. R. Brews
Keyword(s):  
Oxide Layer ◽  
Schottky Diode ◽  
Thin Oxide Layer ◽  
Thin Oxide ◽  
Diode Behavior
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