Research on Nanoscale Material Removal Process Using Atomic Force Microscopy

2007 ◽  
pp. 269-273
Author(s):  
Fei Hu Zhang ◽  
Hua Li Zhang ◽  
Yong Da Yan ◽  
Jing He Wang
Keyword(s):  
Atomic Force Microscopy ◽  
Material Removal ◽  
Nanoscale Material ◽  
Force Microscopy ◽  
Removal Process ◽  
Atomic Force

The Nanostructure and Nanomechanics of a Novel Black Widow Spider Silk Assessed Using Atomic Force Microscopy

2010 ◽  
Author(s):  
Simon Y. Tang ◽  
Yang Hsia ◽  
Craig Vierra
Keyword(s):  
Atomic Force Microscopy ◽  
Spider Silk ◽  
Material Behavior ◽  
Black Widow ◽  
Nanoscale Material ◽  
Black Widow Spider ◽  
Force Microscopy ◽  
Atomic Force ◽  
Black Widow Spiders ◽  
Widow Spider

The black widow spider produces numerous silk types that serve unique biological and mechanical functions. Recently, a novel member of the spider silk family, Pyroform Spidroin 1 (PySp1), was identified from the attachment discs of black widow spiders. Here we investigate the nanostructure and the nanoscale material behavior of native PySp1 silks using atomic force microscopy.

Research on Nanoscale Material Removal Process Using Atomic Force Microscopy

2007 ◽  
Vol 359-360 ◽  
pp. 269-273 ◽  
Author(s):  
Fei Hu Zhang ◽  
Hua Li Zhang ◽  
Yong Da Yan ◽  
Jing He Wang
Keyword(s):  
Material Removal ◽  
Normal Load ◽  
Machining Process ◽  
Surface Material ◽  
Cutting Depth ◽  
Nanoscale Material ◽  
Force Microscopy ◽  
Atomic Force ◽  
Experimental Parameters ◽  
Blade Machining

Nanomachining tests have been conducted on single-crystal Al using atomic force microscope to simulate single-blade machining process of single gain. The influences of nanomachining experimental parameters (lateral feed and velocity) on the properties of engineering surface, material removal and chip formation were studied. Results indicated that the cutting depth of nanomachined surface increased as the lateral feed decreased. Insensitivity of cutting depth to velocity at same normal load was revealed. The different chip behaviors of nanomachined surface were investigated through scanning electron microscope (SEM). Results indicated that different lateral feeds caused different chip behaviors. Three typical chip behaviors were characterized as the lateral feed increased. In addition, the chip behavior and the volume of material removed were observed having no evident linear transformation with the evolution of the velocity by SEM graphics. Furthermore, it was concluded from the chip behaviors in nanomachining process that the material at high loads was removed by plastic deformation with no fracture or crack happened.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document