A Way to Improve Eddy Current Sensor Measurement Accuracy

2012 ◽  
Vol 160 ◽  
pp. 47-52
Author(s):  
En Ming Miao ◽  
Ya Yun Gong ◽  
Tian Ju Cheng ◽  
Peng Cheng Niu

Eddy current sensor is widely used in engineering applications.When it was calibrated, generally used random error analysis method,but this will expand the range of measurement errors and limit its engineering applications.In this paper, we use a new error analysis method to analyze upper and lower limit of multiple batches measurement data. At the same time, catching up with a criterion for the measurement time. This can obtain the measurement accuracy more precise and have good practical value.

2018 ◽  
Vol 38 ◽  
pp. 04005
Author(s):  
Ping He ◽  
YunKai Ma ◽  
Hui Chen

Eddy current sensor is an sensor based on eddy current effect. In practical engineering applications, the ambient temperature of eddy current sensor may be up to 135 ℃. The temperature drift of eddy current sensor magnifies the error of displacement detection. In this paper, the main factors that cause temperature drift are analyzed in detail, and the results show that the compensation based on single parameter can not meet the demand of high-precision measurement. For this reason, this paper proposes an external compensation method which applies mathematical fitting to realize compensation for temperature drift. The experimental results show that the measurement accuracy of the external compensation method reaches 0.25% in the working temperature range, which greatly improves the measurement accuracy of eddy current sensor under high temperature.


2013 ◽  
Vol 133 (5) ◽  
pp. 300-306
Author(s):  
Tsutomu Mizuno ◽  
Yuichi Asato ◽  
Sho Goto ◽  
Takashi Watanabe ◽  
Teruie Takemasu ◽  
...  

Sensors ◽  
2021 ◽  
Vol 21 (8) ◽  
pp. 2652
Author(s):  
Frank Wendler ◽  
Rohan Munjal ◽  
Muhammad Waqas ◽  
Robert Laue ◽  
Sebastian Härtel ◽  
...  

Modern production equipment is based on the results of quality control as well as process parameters. The magnetic anisotropy of materials is closely connected to internal mechanical stress by the Villari effect, and also to hardening effects due to plastic deformations, and could therefore provide an interesting basis for process control. Nevertheless, the analysis of anisotropic properties is extremely sensitive to sensor and workpiece misalignments, such as tilting. In this work, a novel eddy current sensor system is introduced, performing a non-contact measurement of the magnetic anisotropy of a workpiece and realizing a separation and correction of tilting effects. The measurement principle is demonstrated with the example of two samples with different magnetic anisotropy values induced by cold forming. Both samples are analyzed under different tilt angles between the sensor axis and the surface of the workpiece. In this work, digital signal processing is demonstrated on the acquired raw data in order to differentiate the effects of tilt and of anisotropy, with the use of preliminary results as an example of two prepared samples.


2013 ◽  
Vol 834-836 ◽  
pp. 930-934
Author(s):  
Shou Liang Yang ◽  
Bao Liang Yang

The paper proposes a new design of high-accuracy On-line Metal Thickness Measuring Instrument, which was based on EP2C20 series FPGA chip, through adding NiosII soft processor and other interfaces to FPGA, equipped with high precision data collection system and TFT LCD module and so on. The key hardware blocks schematics and components of the RC Oscillation Circuit,eddy current sensor Circuit,rectifier and filter Circuit,A/D converting circuit,FPGA Circuit are described,software flow charts and sample codes are given. According to practice, The measurement range of this system is 1~100 mm and the resolving power is 0.1 μm. degree of linearity is 1%, The system has many features including small volume of hardware, low cost, high detecting precision, convenient operating, high intelligent and so on, leading to broad and bright future. Key words: NiosII processor; eddy current sensor; metal thickness


1989 ◽  
Vol 22 (6) ◽  
pp. 351-355
Author(s):  
T. Cecchin ◽  
D. Sauter ◽  
J. Merckle ◽  
F. Arroyo ◽  
M. Aubrun

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