A New System of High-Precision Absolute Laser Interferometer Distance Measurement

2013 ◽  
Vol 380-384 ◽  
pp. 769-772
Author(s):  
Chen Yang Zhang ◽  
Bing Li

With the improvement of precision in various fields, we present a new method for the measurement of the absolute distance of a remote target based on the laser interferometry technique. In this paper, we obtain the interference fringes change information (the distance information) with the help of laser scanning with different frequency. It does not require the target to move in the direction of measurement. We have done experiments to compare this new methods results with the results of RENISHAW interferometer. Its improved that the accuracy of distance measurement is 10-4~10-5 relatively.

2015 ◽  
Vol 35 (s2) ◽  
pp. s212001
Author(s):  
许立明 Xu Liming ◽  
宋有建 Song Youjian ◽  
梁飞 Liang Fei ◽  
师浩森 Shi Haosen ◽  
胡明列 Hu Minglie ◽  
...  

2016 ◽  
Vol 679 ◽  
pp. 129-134
Author(s):  
Wan Duo Wu ◽  
Qiang Xian Huang ◽  
Chao Qun Wang ◽  
Ting Ting Wu ◽  
Hong Xie

The technique utilizing single-frequency laser interferometry has very high measurement accuracy, but it has rigorous requirements for optical design which is affected by many factors. In order to achieve single-frequency laser interferometry with large stroke and high precision, the integral layout, the polarization phase shifting technique and the common mode rejection method are adopted to design the length interferometry system. This paper analyzes factors and design requirements which affect measurement accuracy with large stroke. Based on polarization phase shifting technique, the system employs the four-beam-signal detection technique and the common mode rejection method, to make a differential processing of four mutually orthogonal signals. Thus, the influences of zero-drift of intensity and environmental change on system are reduced. Combined with a 200 phase subdivision, the system achieves the resolution with 0.8 nm. Under the VC++ environment, the displacement measurement results are compensated and corrected according to the environmental parameters. Compared with the Renishaw XL-80 laser interferometer, the system has better stability in short term. In the measuring range of 60 mm, the effectiveness of the system is verified.


CLEO: 2014 ◽  
2014 ◽  
Author(s):  
Xuejian Wu ◽  
Haoyun Wei ◽  
Honglei Yang ◽  
Hongyuan Zhang ◽  
Yan Li

2014 ◽  
Vol 8 (4) ◽  
Author(s):  
Miriam Zámečníková ◽  
Andreas Wieser ◽  
Helmut Woschitz ◽  
Camillo Ressl

AbstractThe uncertainty of electronic distance measurement to surfaces rather than to dedicated precisionre flectors (reflectorless EDM) is afected by the entire system comprising instrument, atmosphere and surface. The impact of the latter is significant for applications like geodetic monitoring, high-precision surface modelling or laser scanner self-calibration. Nevertheless, it has not yet received sufficient attention and is not well understood. We have carried out an experimental investigation of the impact of surface reflectivity on the distance measurements of a terrestrial laser scanner. The investigation helps to clarify (i)whether variations of reflectivity cause systematic deviations of reflectorless EDM, and (ii) if so, whether it is possible and worth modelling these deviations. The results show that differences in reflectivity may actually cause systematic deviations of a few mm with diffusely re- flecting surfaces and even more with directionally reflecting ones. Using abivariate quadratic polynomial we were able to approximate these deviations as a function of measured distance and measured signal strength alone. Using this approximation to predict corrections, the deviations of the measurements could be reduced by about 70% in our experiment.We conclude that there is a systematic effect of surface reflectivity (or equivalently received signal strength) on the distance measurement and that it is possible to model and predict this effect. Integration into laser scanner calibration models may be beneficial for high precision applications. The results may apply to a broad range of instruments, not only to the specific laser scanner used herein.


2019 ◽  
Vol 27 (15) ◽  
pp. 21635
Author(s):  
Tianyuan Xie ◽  
Ju Wang ◽  
Zixiong Wang ◽  
Chuang Ma ◽  
Yang Yu ◽  
...  

2019 ◽  
Vol 90 (8) ◽  
pp. 083101
Author(s):  
Chengkai Pang ◽  
Di Wu ◽  
Haotian Shi ◽  
Xiuliang Chen ◽  
Lei Yang ◽  
...  

2014 ◽  
Vol 39 (15) ◽  
pp. 4412 ◽  
Author(s):  
Ju Wang ◽  
Jinlong Yu ◽  
Wang Miao ◽  
Bin Sun ◽  
Shi Jia ◽  
...  

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