X-Ray Diffraction and Barkhausen Noise Diagnostics of Thick Welds Prepared by Metal Active Gas and Laser Welding

2016 ◽  
Vol 827 ◽  
pp. 113-116 ◽  
Author(s):  
Kamil Kolařík ◽  
Nikolaj Ganev ◽  
Karel Trojan ◽  
Ondřej Řídký ◽  
Lukáš Zuzánek ◽  
...  

Non-destructive methods for detection and measurement of residual stresses (RS) have been increasingly used in the last few years. The paper outlines the capability of Barkhausen noise analysis (BNA) for evaluation of real structure changes and RS on cross-section of welds due to welding of ferromagnetic plates compared with X-ray diffraction (XRD). The purpose of this study is to evaluate the RS distribution of specimens joined using by high power diode laser and metal active gas (MAG) welding that can be used for quantitative analysis of macro and micro level RS separately. The principal advantages of BNA over XRD as a tool for RS analysis and real structure characterisation are that it is mobile, faster with more facile carrying out and hence BNA is frequently used for continuous monitoring of RS in industrial processes.

2017 ◽  
Vol 9 ◽  
pp. 32
Author(s):  
Karel Trojan ◽  
Charles Hervoches ◽  
Kamil Kolařík ◽  
Nikolaj Ganev ◽  
Pavol Mikula ◽  
...  

The paper outlines the capability of X-ray diffraction (XRD) for evaluation of real structure changes and residual stresses (RS) on cross-section of advanced thick welds due to the welding of ferromagnetic plates. The results of neutron diffraction describe a three-dimensional state of RS and also verify previous assumptions of RS redistribution as a result of the surface preparation for determination 2D maps measured by XRD.


Author(s):  
A. R. Lang

AbstractX-ray topography provides a non-destructive method of mapping point-by-point variations in orientation and reflecting power within crystals. The discovery, made by several workers independently, that in nearly perfect crystals it was possible to detect individual dislocations by X-ray diffraction contrast started an epoch of rapid exploitation of X-ray topography as a new, general method for assessing crystal perfection. Another discovery, that of X-ray Pendellösung, led to important theoretical developments in X-ray diffraction theory and to a new and precise method for measuring structure factors on an absolute scale. Other highlights picked out for mention are studies of Frank-Read dislocation sources, the discovery of long dislocation helices and lines of coaxial dislocation loops in aluminium, of internal magnetic domain structures in Fe-3 wt.% Si, and of stacking faults in silicon and natural diamonds.


2020 ◽  
Vol 22 (37) ◽  
pp. 20972-20989 ◽  
Author(s):  
Amy C. Marschilok ◽  
Andrea M. Bruck ◽  
Alyson Abraham ◽  
Chavis A. Stackhouse ◽  
Kenneth J. Takeuchi ◽  
...  

This review highlights the efficacy of EDXRD as a non-destructive characterization tool in elucidating system-level phenomena for batteries.


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