Effect of Borax Content on Composition and Microstructure of Boride Layer by Electrodeposition

AbstractThe surface morphology of Ge grown on Si (001) and porous Si(001) by molecular beam epitaxy at 380 °C is examined using atomic force microscopy (AFM). For layer thicknesses of 30 nm, the surface shows islanding while still maintaining some of the underlying roughness of the surface of porous Si. For thicknesses in the 100 nm range, the surface roughness is not visible, but the islanding persists. Unlike the case of silicon where islands tend to merge and nearly disappear as the thickness of the deposited layer rises, we observe on the porous layer the persistence of the islands with no merging even for macroscopic thicknesses as large as 0.73 microns.

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Mitigation of BPD by Pre-Epigrowth High Temperature Substrate Annealing

Materials Science Forum ◽

10.4028/www.scientific.net/msf.858.233 ◽

2016 ◽

Vol 858 ◽

pp. 233-236 ◽

Cited By ~ 5

Author(s):

Nadeemullah A. Mahadik ◽

Robert E. Stahlbush ◽

Eugene A. Imhoff ◽

M.J. Tadjer ◽

G.E. Ruland ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

High Temperature ◽

Surface Morphology ◽

Substrate Surface ◽

High Temperature Annealing ◽

Force Microscopy ◽

Atomic Force ◽

Substrate Annealing ◽

Edge Dislocations

Basal Plane Dislocations (BPD) intersecting the SiC substrate surface were converted to threading edge dislocations (TED) by high temperature annealing of the substrates in the temperature range of 1750 °C – 1950 °C. Successively, epitaxial growth on annealed as well as non-annealed samples was performed, concurrently, to investigate the effect of the substrate annealing on BPD mitigation in the epilayers. For the 1950 °C/10min anneal, a 3x reduction in BPD density was observed. Additionally, surface roughness measured using atomic force microscopy revealed no degradation in surface morphology of the grown epilayers after annealing.

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A Scanning Electron and Atomic Force Microscopy Study of the Surface Morphology and Composition of CsI Films as Affected by Evaporation Rate and Humid-Air Exposure

Microscopy and Microanalysis ◽

10.1017/s143192760505018x ◽

2005 ◽

Vol 11 (2) ◽

pp. 124-132 ◽

Cited By ~ 3

Author(s):

Giorgio S. Senesi ◽

Mariangela A. Nitti ◽

Antonio Valentini

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Surface Morphology ◽

Slow Rate ◽

Evaporation Rate ◽

Humid Air ◽

Air Exposure ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

Evaporation rate and subsequent exposure to humid air affect the surface morphology and composition of cesium iodide (CsI) films and, in turn, their photoemissive efficiency when used as photocathodes. The surface morphology and elemental composition of 300-nm-thick CsI films grown at two different rates (1 nm/s and 0.04 nm/s), both freshly evaporated and after 24-h exposure to humid air were investigated by means of atomic force microscopy and scanning electron microscopy/electron diffraction spectroscopy. The CsI film freshly evaporated at a slow rate exhibited a granular surface presenting circular holes or craters where the CsI material was moved from the center to the boundaries. After 24-h exposure to humid air, this film coalesced in large grain showing a marked increase of surface roughness. Conversely, the CsI film grown at a fast rate mostly retained its original surface uniformity and homogeneity with no presence of holes and craters after 24-h exposure to humid air. Further, surface roughness and average peak height decreased, but the surface coalesced in large grains spaced by small fractures where the CsI coverage was almost lost. In conclusion, the films grown at a fast evaporation rate were affected by 24-h exposure to humid air less than those grown at a slow rate, and are thus expected to possess a greater long-term stability.

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A COMPARISON BETWEEN THE ATOMIC FORCE MICROSCOPY AND X-RAY REFLECTIVITY ON THE CHARACTERIZATION OF SURFACE ROUGHNESS

International Journal of Nanoscience ◽

10.1142/s0219581x03001371 ◽

2003 ◽

Vol 02 (04n05) ◽

pp. 343-348 ◽

Cited By ~ 3

Author(s):

CHIH-HAO LEE ◽

WEN-YEN PEN ◽

MING-ZHE LIN ◽

KUAN-LI YU ◽

JEN-CHUNG HSUEH

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Surface Morphology ◽

Power Spectra ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Roughness Exponent ◽

Buried Layer

Atomic force microscopy and X-ray reflectivity methods are used to characterize a surface morphology which includes the information of rms roughness, roughness exponent, and the height–height correlation length. Two major reasons to interpret the discrepancy of rms roughness data measured by AFM and X-ray reflectivity are (1) the bandpass of power spectra density is different and (2) the X-ray reflectivity probes the high density buried layer.

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Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

10.26434/chemrxiv.13238708.v1 ◽

2020 ◽

Author(s):

Benjamin P. A. Gabriele ◽

Craig J. Williams ◽

Douglas Stauffer ◽

Brian Derby ◽

Aurora J. Cruz-Cabeza

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Single Crystals ◽

Spalling Fracture ◽

Force Microscopy ◽

Atomic Force ◽

Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

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Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

10.26434/chemrxiv.13238708 ◽

2020 ◽

Author(s):

Benjamin P. A. Gabriele ◽

Craig J. Williams ◽

Douglas Stauffer ◽

Brian Derby ◽

Aurora J. Cruz-Cabeza

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Single Crystals ◽

Spalling Fracture ◽

Force Microscopy ◽

Atomic Force ◽

Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

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Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

BMC Ophthalmology ◽

10.1186/s12886-021-02039-6 ◽

2021 ◽

Vol 21 (1) ◽

Author(s):

Juan Gros-Otero ◽

Samira Ketabi ◽

Rafael Cañones-Zafra ◽

Montserrat Garcia-Gonzalez ◽

Cesar Villa-Collar ◽

...

Keyword(s):

Surface Roughness ◽

Atomic Force Microscopy ◽

Intraocular Lenses ◽

Posterior Chamber ◽

Anterior Surface ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Phakic Intraocular Lenses ◽

Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

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