Ultra-Precision Shaping and Polishing Experiments in Nanoparticle Colloid Jet Machining

2011 ◽  
Vol 291-294 ◽  
pp. 1759-1763 ◽  
Author(s):  
Xiao Zong Song ◽  
Yong Zhang ◽  
Fei Hu Zhang
Keyword(s):  
Atomic Force Microscopy ◽  
Morphological Characteristics ◽  
Surface Profile ◽  
Surface Shape ◽  
Workpiece Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ultra Precision ◽  
Nanoparticle Colloid ◽  
Observation Results

In this paper, ultra-precision shaping and polishing experiments have been done to research the shaping and polishing characters of nanoparticle colloid jet machining. A high-purity quartz glass sample with aspheric surface profile was employed as workpiece and polished by nanoparticle colloid jet machining. We utilized surface profilometer to measure the surface profiles of workpiece before and after shaping by nanoparticle colloid jet machining. The measurement results indicate that the nanoparticle colloid jet machining has good shaping ability to satisfy the demands for surface shape correction in ultra-precision machining. Atomic force microscopy (AFM) was utilized to observe the surface microscopic morphological characteristics of the workpiece surface polished by nanoparticle colloid jet machining. The observation results show that the roughness of the workpiece surface has been reduced from 1.919 nm RMS to 0.784 nm RMS by nanoparticle colloid jet machining. Based on the atomic force microscopy observation results, power spectral density analyses have been done to evaluate the polishing performance of the nanoparticle colloid jet machining.

Ultra-Precision Shaping and Ultra-Smooth Polishing Investigation of High-Purity Quartz Glass in Nanoparticle Colloid Jet Machining

2012 ◽  
Vol 426 ◽  
pp. 396-399 ◽  
Author(s):  
Xiao Zong Song ◽  
Yong Zhang ◽  
Fei Hu Zhang
Keyword(s):  
Quartz Glass ◽  
High Purity ◽  
Glass Surface ◽  
Morphological Characteristics ◽  
Surface Profile ◽  
Processing Technique ◽  
Surface Shape ◽  
Before And After ◽  
Ultra Precision ◽  
Nanoparticle Colloid

In this paper, ultra-precision shaping and ultra-smooth polishing investigations have been done upon a high-purity quartz glass substrate with an aspheric surface in nanoparticle colloid jet machining, which is an ultra smooth surface processing technique utilizing surface chemical reaction between work surface atoms and nanoparticles to remove the uppermost surface atoms. The shaping and polishing characters of high-purity quartz glass in nanoparticle colloid jet machining has been researched. The surface profile of the high-purity quartz glass workpiece before and after shaping has been measured by surface profilometer. And the surface microscopic morphological characteristics of high-purity quartz glass surface polished by nanoparticle colloid jet machining have been observed by atomic force microscopy (AFM). The measurement results indicate that nanoparticle colloid jet machining has good shaping ability for surface shape correction in ultra-precision machining. And the AFM observation results show that the roughness of the high-purity quartz glass surface has been reduced from 1.919 nm RMS to 0.784 nm RMS by nanoparticle colloid jet machining.

Limits in measurements of contact lens surface profile using atomic force microscopy

2018 ◽  
Vol 165 ◽  
pp. 229-234 ◽  
Author(s):  
Rafał Brygoła ◽  
Sławomir Sęk ◽  
Maciej Sokołowski ◽  
Marek Kowalczyk-Hernández ◽  
Jacek Pniewski
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Lens ◽  
Surface Profile ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lens Surface

Soft Contact Lens Surface Profile by Atomic Force Microscopy

2010 ◽  
pp. 1 ◽  
Author(s):  
Maria J. Giraldez ◽  
Carmen Serra ◽  
Madalena Lira ◽  
M. Elisabete C. D. Real Oliveira ◽  
Eva Yebra-Pimentel
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Lens ◽  
Surface Profile ◽  
Soft Contact ◽  
Force Microscopy ◽  
Soft Contact Lens ◽  
Atomic Force ◽  
Lens Surface

Measurement Simulation Model and Qualitative Analysis of Tapping Mode Atomic Force Microscopy Under Vibration Environment

2010 ◽  
Author(s):  
Zone-Ching Lin ◽  
Ming-Ho Chou
Keyword(s):  
Atomic Force Microscopy ◽  
Qualitative Analysis ◽  
Standard Sample ◽  
Surface Profile ◽  
Force Microscopy ◽  
External Vibration ◽  
Nano Scale ◽  
Atomic Force ◽  
Probe Size ◽  
Mode Atomic Force Microscopy

This study constructs a novel Tapping Mode Atomic Force Microscopy (TM-AFM) model under vibration environment and analyzes the effect of probe size. The TM-AFM measurements are affected by external vibration and the size of the probe. In this study, a sinusoidal external vibration is applied, and TM-AM fixed-amplitude vibration simulated measurements made. The effect of external vibration on the surface profile acquired the simulated measurement of a nano-scale ladder standard sample. The simulated measurements under sinusoidal vibration are compared with actual experimental measurements without vibration isolation facilities, and the corrugations in the two cases were similar, indicating that the simulated measuring model under sinusoidal wave vibration proposed in this study is effective in qualitative analysis. An external vibration during the TM-AFM measurements causes an error between the measured surface profile of the sample and the actual appearance. Additionally simulated measurements are made on the edge of the nano-scale ladder standard sample, and the wave shape is affected by external vibration. The effects of the bevel angle and radius of the sharp end of the TM-AFM probe on the bevel edge effect of the probe and the measured appearance are studied. Qualitative analysis reveals that the bevel angle. Additionally, a smaller probe radius is associated with a simulated result that is closer to the perpendicular side of the ladder standard sample. The results in this study serve as a reference in the selection of probe size and in the qualitative analysis of the effect of external vibration on TM-AFM measurement.

scholarly journals Novel insights into pericarp, protein body globoids of aleurone layer, starchy granules of three cereals gained using atomic force microscopy and environmental scanning electronic microscopy

2018 ◽  
Author(s):  
Elena Antonini ◽  
Carolina Zara ◽  
Laura Valentini ◽  
Pietro Gobbi ◽  
Paolino Ninfali ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elemental Composition ◽  
Protein Body ◽  
Environmental Scanning Electron Microscopy ◽  
Surface Profile ◽  
Environmental Scanning ◽  
Aleurone Layer ◽  
Einkorn Wheat ◽  
Force Microscopy ◽  
Atomic Force

In this study, we applied Environmental Scanning Electron Microscopy-Energy Dispersive Spectroscopy (ESEM-EDS) and Atomic Force Microscopy (AFM) analysis to three different cereal caryopses: barley, oat and einkorn wheat. The morphological structures, chemical elemental composition and surface characteristics of the three cereals were described. Regarding the morphology, barley showed the thickest pericarp, providing a strong barrier digestion and absorption of nutrients. The aleurone layer of each cereal type contained protein body globoids within its cells. Large type-A and small type-B starchy granules were revealed in the endosperm of barley and einkorn wheat, whereas irregular starchy granules were found in oats. The starchy granule elemental composition, detected by ESEM-EDS, was rather homogenous in the three cereals, whereas the pericarp and protein body globoids showed heterogeneity. In the protein body globoids, oats showed higher P and K concentrations than barley and einkorn wheat. Regarding the topographic profiles, detected by AFM, einkorn wheat starchy granules showed a surface profile that differed significantly from that of oats and barley, which were quite similar to one another. The present work provides insights into the morphological and chemical makeup of the three grains shedding light on the higher bio-accessibility of einkorn wheat nutrients compared to barley and oats, providing important suggestions for human nutrition and technological standpoints. 

scholarly journals Rigid-body fitting to atomic force microscopy images for inferring probe shape and biomolecular structure

2021 ◽  
Author(s):  
Toru Niina ◽  
Yasuhiro Matsunaga ◽  
Shoji Takada
Keyword(s):  
Atomic Force Microscopy ◽  
Rigid Body ◽  
Real Time ◽  
High Speed ◽  
Surface Shape ◽  
Time Dynamics ◽  
Force Microscopy ◽  
Small Proteins ◽  
Atomic Force ◽  
Functional Dynamics

AbstractHigh-speed (HS) atomic force microscopy (AFM) can visualize real-time dynamics of functional biomolecules near the physiological condition, but the observed data are limited to the surface height of specimens. Since the HS-AFM images highly depend on the probe tip shape, for successful inference of molecular structures from the measurement, the knowledge of the probe shape is required, but is often missing. Here, we developed a method of the rigid-body fitting to HS-AFM images, which simultaneously finds the shape of the probe tip and the placement of the molecular structure via an exhaustive search. We examined four similarity scores via twin-experiments for four test proteins: Of the four scores, the cosine similarity generally worked best, whereas the pixel-RMSD was also useful especially for the placement of small proteins. We then applied the method to two experimental HS-AFM images inferring the probe shape and the molecular placement. The inferred tip shape and placement results can be further refined by other methods, such as the flexible fitting molecular dynamics simulations. The developed software is publicly available.Author SummaryObservation of functional dynamics of individual biomolecules is important to understand molecular mechanisms of cellular phenomena. High-speed (HS) atomic force microscopy (AFM) is a powerful tool that enables us to visualize the real-time dynamics of working biomolecules under near-physiological conditions. However, the information available by the HS-AFM images is limited to the two-dimensional surface shape detected via the force to the probe. While the surface information is affected by the shape of the probe tip, the probe shape itself cannot be directly measured before each HS-AFM measurement. To overcome this problem, we have developed a computational method to simultaneously infer the probe tip shape and the molecular placement from an HS-AFM image. We show that our method successfully estimates the effective HS-AFM tip shape and visualizes a structure with a more accurate placement. The estimation of a molecular placement with the correct probe tip shape enables us to obtain more insights into functional dynamics of the molecule from HS-AFM images.

scholarly journals Atomic Force Microscopy Study of the Surface of Films of Chitosan and Its Salts with Organic Acids

2020 ◽  
Vol 20 (4) ◽  
pp. 387-394
Author(s):  
Darya A. Rudenko ◽  
◽  
Daniil N. Bratashov ◽  
Anna B. Shipovskaya ◽  
◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Morphological Characteristics ◽  
Chitosan Film ◽  
Microscopy Study ◽  
Chemical Form ◽  
Root Mean Square Roughness ◽  
Total Charge ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chitosan Films

The results of the study of the morphology and surface topography of chitosan films of the salt (S-) and basic (B-) chemical form by atomic force microscopy are presented. The films were cast from polymer solutions in acetic, lactic, citric and succinic acid. NaOH and triethanolamine were used for the salt → chitosan base reaction. Surface tomograms were obtained; the main morphological characteristics and roughness parameters of the film samples were estimated. It was found that the morphology, the degree of order, root-mean-square roughness and the height of the surface roughness were determined by the polymer chemical form, the nature of the acid used and the reagent of the polymer-like conversion reaction. The surface of the S-form chitosan films is characterized by fibrillar structural ordering (also dendritic for chitosan succinate), and that of the B-form is globular. The smallest size of surface supramolecular elements was observed for the S-form chitosan films, while the greatest roughness was for the B-form ones. Changing the reagent of the chitosan S → B reaction did not affect the morphological characteristics of the films; however, it affected the microrelief roughness. A more uniform basic chitosan film is formed in an organic base environment. It was suggested that the formation of fibrillar supramolecular structures was due to the unfolding and straightening of macrochains because of the repulsion of the same charged monomer units, while the globular ones were formed due to the folding and densification of macrocoils after neutralizing the total charge of the macrochain.

Conductive Atomic Force Microscopy Application for Semiconductor Failure Analysis in Advanced Nanometer Process

2006 ◽  
Author(s):  
Kun Lin ◽  
Hang Zhang ◽  
Shey-shi Lu
Keyword(s):  
Atomic Force Microscopy ◽  
Failure Analysis ◽  
Electrical Parameter ◽  
Surface Profile ◽  
Parameter Extraction ◽  
Conductive Atomic Force Microscopy ◽  
Electrical Failure ◽  
Force Microscopy ◽  
Depth Measurement ◽  
Atomic Force

Abstract Conductive Atomic Force Microscopy (C-AFM) is a useful tool for both electrical failure analysis (EFA) and physical failure analysis (PFA). In this paper, the root cause of a physical failure in an analysis image was verified from the evidence of two-dimensional AFM profile depth measurement. The other analysis technique, which is electrical parameter extraction by contacting I-V spectroscopy measurement, was also utilized to locate the possible defects. As a result, the failure mechanism was illustrated with an AFM topography image, which showed the silicon surface profile after removal of cobalt salicide (self-alignment silicide) by dilute HF. The vertical junction leakage path was identified with a C-AFM image.

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